A comparison of opimum constant stress and step stress accelerated life tests

일정형 가속수명시험과 계단형 가속수명시험의 비교 : 최적설계를 중심으로

  • 배도선 ((305-701) 대전시 유성구 구성동 373-1, 한국과학기술원 산업공학과) ;
  • 김명수 ((445-743) 경기도 화성군 봉담면 와우리 산2-2, 수원대학교 공과대학 산업공학과) ;
  • 전영록 ((631-701) 마산시 합포구 월영동 449, 경남대학교 산업공학과)
  • Published : 1996.03.01

Abstract

This paper compares two accelerated life for Weibull distribution. One is the optimum constant stress accelerated life test which minimizes the asymptotic variance of maximum likelihood estimator of a specified quantile at design stress, and the other is corresponding simple step stress test. The models and optimum designs of constant stress and step stress tests are reviewed. Behaviors of asymptotic variances, effects of design parameters to optimum tests, and expected numbers of failures and expected test times of the two tests are investigated. The efficiency of step stress test relative to constant stress test is studied in terms of variance ratio, and robustness to preestimates of design parameters are investigated.

일정형 및 계단형 가속수명시험의 시험설계에 대한 일반적인 모형과 최적설계에 대한 최근의 연구결과를 소개하고, 수명분포가 와이블인 경우에 대하여 두가지 시험방법에 대한 최적설계를 점근분산의 행태, 설계변수의 효과, 최적시험조건에서 시험종결 시점까지의 기대고장개수 및 기대시험종결시간, 점근분산의 상대적효율과 설계변수의 사전추정치에 대한 둔감성의 측면에서 비교, 분석하였다.

Keywords

References

  1. 응용통계연구 v.5 no.2 두 개의 부품으로 구성된 시스템의 단계적 충격생명검사에 관한 연구 이석훈;박래현;박희창
  2. IEEE Transactions on Reliability v.41 Optimum Simple Ramp-Tests for the Weibull Distribution and Type-I Censoring Bai, D.S.;Cha, M.S.;Chung, S.W.
  3. IEEE Transactions on Reliability v.R-40 Optimum Simple Step-Stress Accelerated Life Tests with Competing Causes of Failure Bai, D.S.;Chun, Y.R.
  4. Reliability Engineering & System Safety v.41 Nonparemetric Inferences on Ramp Stress Tests under Random Censoring Bai, D.S.;Chun, Y.R.
  5. Reliability Engineering & System Safety v.31 An Optimal Design of Accelerated Life Test for Exponential Distribution Bai, D.S.;Chung, S.W.
  6. IEEE Transactions in Reliability v.41 Optimal Design of Partially Accelerated Life Test for the Exponential Distribution under Type-I Censoring Bai, D.S.;Chung, S.W.
  7. Reliability Engineering & System Safety v.40 Optimal Design of Partially Accelerated Life Test for the Lognormal Distribution under Type-I Censoring Bai, D.S.;Chung, S.W.;Chun, Y.R.
  8. Naval Research Logistics v.40 Optimum Simple Step-Stress Accelerated Life Tests for Weibull Distribution and Type I Censoring Bai, D.S.;Kim, M.S.
  9. IEEE Transactions on Reliability v.R-38 Optimum Simple Step-Stress Accelerated Life Tests with Censoring Bai, D.S.;Kim, M.S.;Lee, S.H.
  10. Journal Korean Statistical Society v.18 Optimum Simple Step-Stress Accelerated Life Tests under Periodic Observation Bai, D.S.;Kim, M.S.;Lee, S.H.
  11. IEEE Transactions on Reliability v.40 Optimal Accelerated Life-Time Plans That Minimize the Maximum Test-Stress Barton, R.R.
  12. Naval Research Logistics Quarterly v.26 Bayesian Estimation and Optimal Designs in Partially Accelerated Life Testing DeGroot, M.H.;Goel, P.K.
  13. IEEE Transactions on Reliability v.40 A Nonparametric Approach to Progressive Stress Accelerated Life Testing Lin, Z.;Fei, H.
  14. International Statistical Review v.61 A Review of Recent Research and Current Issues in Accelerated Testing Meeker, W.Q.;Escobar, L.A.
  15. Technometrics v.36 Optimum Accelerated Life Tests with a Nonconstant Scale Parameter Meeter, C.A.;Meeker, W.Q.
  16. How to Planan Accelerated Life Test - Some Practical Guidelines Volume 10 of the ASQC Basic References in Quality Control: Statistical Techniques Meeker, W.Q.;Hahn, G.J.
  17. IEEE Transactions on Reliability v.R-24 Optimum Accelerated Life-Tests for the Weibull and Extreme Value Distributions Meeker, W.Q.;Nelson, W.
  18. IEEE Transactions on Reliability v.R-32 Optimum Simple Step-Stress Plans for Accelerated Life Testing Miller, R.;Nelson, W.
  19. IEEE Transactions on Reliability v.R-29 Accelerated Life Testing - Step-Stress Models and Data Analysis Nelson, W.
  20. Accelerated Testing - Statistical Models, Test Plans, and Data Analyses Nelson, W.
  21. Technometrics v.20 Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Life Distributions Nelson, W.;Meeker, W. Q.
  22. Computer Journal v.7 An Efficient Method for Finding the Minimum of a Function of Several Variables without Calculating Derivatives Powell, M.J.D.
  23. Journal Statistical Planning and Inference v.7 Inference for Step Stress Accelerated Life Tets Shaked, M.;Singpurwalla, N.D.
  24. Naval Research Logistics v.38 Accelerated Life Test Plans under Intermittent Inspection and Type-I Censoring: The Case of Weibull Failure Distribution Seo, S.K.;Yum, B.J.
  25. IEEE Transactions on Reliability v.R-36 Some Aspects of Accelerated Life Testing by Progressive Stress Yin, X.K.;Sheng, B.Z.
  26. Naval Research Logistics Quarterly v.36 Optimal Design of Accelerated Life Tests under Periodic Inspection Yum, B.S.;Choi, S.C.