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Design of Step-Stress Accelerated Degradation Test based on the Wiener Process and D-Optimality Condition  

Kim, Heongil (Defense Agency for Technology and Quality)
Park, Jaehun (Daegu Haany University)
Sung, Si-Il (Department of Industrial and Management Engineering, Inje University)
Publication Information
Journal of Applied Reliability / v.17, no.2, 2017 , pp. 129-135 More about this Journal
Abstract
Purpose: This article provides step-stress accelerated degradation test (ADT) plans based on the Wiener process. Method: Step-stress levels and the stress change times are determined based on the D-optimality criteria to develop test plans. Further, a simple grid search method is provided for obtaining the optimal test plan. Results: Based on the solution procedure, ADT plans which include the stress levels and change times are developed for conducting the reliability test. Conclusion: Optimal step-stress ADT plans are provided for the case where the number of measurements is small.
Keywords
Accelerated Degradation Test; D-optimality Criteria; Accelerated Model;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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