• JSTS:Journal of Semiconductor Technology and Science
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• v.14 no.2
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• pp.189-197
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• 2014

This work proposes a 12b 100 MS/s $0.11{\mu}m$ CMOS three-step hybrid pipeline ADC for high-speed communication and mobile display systems requiring high resolution, low power, and small size. The first stage based on time-interleaved dual-channel SAR ADCs properly handles the Nyquist-rate input without a dedicated SHA. An input sampling clock for each SAR ADC is synchronized to a reference clock to minimize a sampling-time mismatch between the channels. Only one residue amplifier is employed and shared in the proposed ADC for the first-stage SAR ADCs as well as the MDAC of back-end pipeline stages. The shared amplifier, in particular, reduces performance degradation caused by offset and gain mismatches between two channels of the SAR ADCs. Two separate reference voltages relieve a reference disturbance due to the different operating frequencies of the front-end SAR ADCs and the back-end pipeline stages. The prototype ADC in a $0.11{\mu}m$ CMOS shows the measured DNL and INL within 0.38 LSB and 1.21 LSB, respectively. The ADC occupies an active die area of $1.34mm^2$ and consumes 25.3 mW with a maximum SNDR and SFDR of 60.2 dB and 69.5 dB, respectively, at 1.1 V and 100 MS/s.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.37 no.6
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• pp.35-41
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• 2000

This paper describes a merged-capacitor switching (MCS) technique to improve the signal Processing speed and resolution of CMOS analog-to-digital converters (ADCs). The proposed MCS technique improves a sampling rate by reducing the number of capacitors used in conventional pipelined ADCs. The ADC capacitor mismatch can be minimized without additional power consumption, die area, and the loss of sampling rate, when the size of each unit capacitor is increased as much as the number of capacitors reduced by the MCS technique. It is verified that the ADC resolution based on the proposed MCS technique is extended further by employing a conventional commutated feedback-capacitor switching (CFCS) technique.

• The Transactions of the Korean Institute of Power Electronics
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• v.23 no.6
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• pp.381-388
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• 2018

A novel and simple algorithm for accurate calculation of RMS voltage is proposed in a digitally controlled grid-tie inverter system. Given that the actual frequency of grid voltage is continuously changing, the constant sampling frequency cannot be a multiple number of the fundamental frequency. Therefore, the RMS of grid voltage contains periodic oscillations due to the differences in the phase angle of sampled data during calculation. The proposed algorithm precisely calculates and updates the initial phase angle of the first sampled voltage in a half-cycle period using phase-locked loop, which is commonly utilized for phase angle detection in grid-tie inverter systems. The accuracy and dynamic performance of the proposed algorithm are compared with those of other algorithms through various simulations and experiments.

• Journal of the Institute of Electronics Engineers of Korea TC
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• v.44 no.10
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• pp.185-190
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• 2007

In this paper, minimum sampling rates and method of nonlinear characterization were suggested for low power, quasi-memoryless PAs. So far, the Nyquist rate of the input signal has been used for nonlinear PA modeling, and it is burdening Analog-to-digital converters for wideband signals. This paper shows that the input Nyquist rate sampling is not a necessary condition for successful modeling of quasi-memoryless PAs. Since this sampling requirement relives the bandwidth requirements for Analog-to-digital converters (ADCs) for feedback paths in digital pre-distortion systems, relatively low-cost ADcs can be used to identify nonlinear PAs for wideband signal transmission, even at severe aliasing conditions. Simulation results show that a generic memoryless nonlinear RF power amplifier with AMAM and AMPM distortion can be successfully identified at any sampling rates. Measurement results show the modeling error variation is less than 0.8dB over any sampling rates.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.39 no.4
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• pp.25-35
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• 2002

This work describes an 8b 200MHz time-interleaved subranging analog-to-digital converter (ADC) based on a single-poly digital CMOS process. Two fine ADCs for lower digital bits of the proposed ADC employ a time-sharing double-channel architecture to increase system speed and a new reference voltage switching scheme to reduce settling time of the reference voltages and chip area. The proposed intermeshed resistor string, which generates reference voltages for fine ADCs, improves linearity and settling time of the reference voltages simultaneously. The proposed sample- and-hold amplifier(SHA) is based on a highly linear common-drain amplifier and passive differential circuits to minimize power consumption and chip area with 8b accuracy and employs input dynamic common mode feedback circuits for high dynamic performance at a 200MHz sampling rate. A new encoding circuit in a coarse ADC simplifies the signal processing between the coarse ADC and two successive fine ADCs.

• JSTS:Journal of Semiconductor Technology and Science
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• v.17 no.1
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• pp.110-119
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• 2017

This paper describes a CMOS image sensor (CIS) with dual correlated double sampling (CDS) and column-parallel analog-to-digital converter (ADC) and its measurement method using a field-programmable gate array (FPGA) integrated module. The CIS is composed of a $320{\times}240$ pixel array with $3.2{\mu}m{\times}3.2{\mu}m$ pixels and column-parallel 10-bit single-slope ADCs. It is fabricated in a $0.11-{\mu}m$ CIS process, and consumes 49.2 mW from 1.5 V and 3.3 V power supplies while operating at 6.25 MHz. The measured dynamic range is 53.72 dB, and the total and column fixed pattern noise in a dark condition are 0.10% and 0.029%. The maximum integral nonlinearity and the differential nonlinearity of the ADC are +1.15 / -1.74 LSB and +0.63 / -0.56 LSB, respectively.

• Journal of IKEEE
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• v.2 no.2 s.3
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• pp.309-315
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• 1998

This paper describes an 8b 52 MHz CMOS subranging analog-to-digital converter (ADC) for Integrated Services Digital Network (ISDN) applications. The proposed ADC based on the improved time-interleaved architecture removes the holding time which is typically observed in the conventional double-channel subranging ADCs to increase throughput rate. Moreover, the ADC employs the interpolation technique in the back-end subranging ADCs far residue signal processing to minimize die area and power consumption. The fabricated and measured prototype ADC in a 0.8 um n-well double-poly double-metal CMOS process typically shows a 52 MHz sampling rate at a 5 V supply voltage with 230 mW, and a 40 MHz sampling rate at a 3 V power supply with 60 mW power consumption.

• Journal of the Semiconductor & Display Technology
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• v.20 no.3
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• pp.71-76
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• 2021

Digital decimation filters are used in various digital signal processing systems using ADCs, including digital communication systems and sensor network systems. When the sampling rate of digital data is reduced, aliasing occurs. So, an anti-aliasing filter is necessary to suppress aliasing before down-sampling the data. Since the anti-aliasing filter has to have a sharp transition band between the passband and the stopband, the order of the filter is very high. However, as the order of the filter increases, the complexity and area of the filter increase, and more power is consumed. Therefore, in this paper, we propose two types of decimation filters, focusing on reducing the area of the hardware. In both cases, the complexity of the circuit is reduced by applying the required down-sampling rate in two times instead of at once. In addition, CIC decimation filters without a multiplier are used as the decimation filter of the first stage. The second stage is implemented using a CIC filter and a down sampler with an anti-aliasing filter, respectively. It is designed with Verilog-HDL and its function and implementation are validated using ModelSim and Quartus, respectively.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.3
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• pp.69-76
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• 2008

This work proposes a 12b 1kS/s 65uA 0.35um CMOS algorithmic ADC for sensor interface applications such as accelerometers and gyro sensors requiring high resolution, ultra-low power, and small size simultaneously. The proposed ADC is based on an algorithmic architecture with recycling techniques to optimize sampling rate, resolution, chip area, and power consumption. Two versions of ADCs are fabricated with a conventional open-loop sampling scheme and a closed-loop sampling scheme to investigate the effects of offset and 1/f noise during dynamic operation. Switched bias power-reduction techniques and bias circuit sharing reduce the power consumption of amplifiers in the SHA and MDAC. The current and voltage references are implemented on chip with optional of-chip voltage references for low-power SoC applications. The prototype ADC in a 0.35um 2P4M CMOS technology demonstrates a measured DNL and INL within 0.78LSB and 2.24LSB, and shows a maximum SNDR and SFDR of 60dB and 70dB in versionl, and 63dB and 75dB in version2 at 1kS/s. The versionl and version2 ADCs with an active die area of $0.78mm^2$ and $0.81mm^2$ consume 0.163mW and 0.176mW at 1kS/s and 2.5V, respectively.

• JSTS:Journal of Semiconductor Technology and Science
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• v.15 no.1
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• pp.22-28
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• 2015

This paper proposes column-parallel three step Single Slope Analog-to-Digital Converter (SS-ADC) for high frame rate VGA CMOS Image Sensors (CISs). The proposed three step SS-ADC improves the sampling rate while maintaining the architecture of the conventional SS-ADC for high frame rate CIS. The sampling rate of the three-step ADC is increased by a factor of 39 compared with the conventional SS-ADC. The proposed three-step SS-ADC has a 12-bit resolution and 200 kS/s at 25 MHz clock frequency. The VGA CIS using three step SS-ADC has the maximum frame rate of 200 frames/s. The total power consumption is 76 mW with 3.3 V supply voltage without ramp generator buffer. A prototype chip was fabricated in a $0.13{\mu}m$ CMOS process.