• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.07b
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• pp.1222-1225
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• 2004

This paper presents multibit Sigma-Delta ADC using noise-shaped dynamic element matching(DEM). 5-bit flash ADC for multibit quantization in Sigma Delta modulator offers the following advantages such as lower quantization noise, more accurate white-noise level and more stability over single quantization. For the feedback paths consisting of DAC, the DAC element should have a high matching requirement in order to maintain the linearity performance which can be obtained by the modulator with a multibit quantizer. The DEM algorithm is implemented in such a way as to minimize additional delay within the feedback loop of the modulator Using this algorithm, distortion spectra from DAC linearity errors are shaped. Sigma Delta ADC achieves 82dB signal to noise ratio over 615H7z bandwidth, and 62mW power dissipation at a sampling frequency of 19.6MHz. This Sigma Delta ADC is designed to use 0.25um CMOS technology with 2.5V supply voltage and verified by HSPICE simulation.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.16 no.9
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• pp.1847-1855
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• 2012

A 1V 1.6-GS/s 6-bit flash analog-to-digital converter (ADC) with a clock calibration circuit is proposed. A single track/hold circuit with a bootstrapped analog switch is used as an input stage with a supply voltage of 1V for the high speed operation. Two preamplifier-arrays and each comparator composed of two-stage are implemented for the reduction of analog noises and high speed operation. The clock calibration circuit in the proposed flash ADC improves the dynamic performance of the entire flash ADC by optimizing the duty cycle and phase of the clock. It adjusts the reset and evaluation time of the clock for the comparator by controlling the duty cycle of the clock. The proposed 1.6-GS/s 6-bit flash ADC is fabricated in a 1V 90nm 1-poly 9-metal CMOS process. The measured SNDR is 32.8 dB for a 800 MHz analog input signal. The measured DNL and INL are +0.38/-0.37 LSB, +0.64/-0.64 LSB, respectively. The power consumption and chip area are $800{\times}500{\mu}m2$ and 193.02mW.

• JSTS:Journal of Semiconductor Technology and Science
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• v.16 no.1
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• pp.70-79
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• 2016

This paper proposes a low-power range-scaled 14b 30 MS/s pipeline-SAR composite ADC for high-performance CIS applications. The SAR ADC is employed in the first stage to alleviate a sampling-time mismatch as observed in the conventional SHA-free architecture. A range-scaling technique processes a wide input range of 3.0VP-P without thick-gate-oxide transistors under a 1.8 V supply voltage. The first- and second-stage MDACs share a single amplifier to reduce power consumption and chip area. Moreover, two separate reference voltage drivers for the first-stage SAR ADC and the remaining pipeline stages reduce a reference voltage disturbance caused by the high-speed switching noise from the SAR ADC. The measured DNL and INL of the prototype ADC in a $0.18{\mu}m$ CMOS are within 0.88 LSB and 3.28 LSB, respectively. The ADC shows a maximum SNDR of 65.4 dB and SFDR of 78.9 dB at 30 MS/s, respectively. The ADC with an active die area of $1.43mm^2$ consumes 20.5 mW at a 1.8 V supply voltage and 30 MS/s, which corresponds to a figure-of-merit (FOM) of 0.45 pJ/conversion-step.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.8 no.4
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• pp.826-832
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• 2004

A CMOS 8 bit folding and interpolating ADC for an embedded system inside VLSI is presented in this paper. This folding ADC uses the 2 stage architecture for improving of nonlinearity. repeating the folding and interpolating twice. At a proposed structure, a transistor differential pair operates on the second folder. A ADC with 2 stage architecture reduces the number of comparators and resisters. So it is possible to provide small chip size, low power consumption and high operating speed. The design technology is based on fully standard 0.25m double-Poly 2 metal n-well CMOS Process. The simulated Power consumption is 45mW with an applied voltage of 2.5V and sampling frequency of 250MHz. The INL and DNL are within <ㅆㄸㅌ>$\pm$0.2LSB, respectively. The SNDR is approximately 45dB for input frequency of 10MHz.

• Journal of Radiation Protection and Research
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• v.12 no.1
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• pp.12-25
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• 1987

A basic multichannel analyser (MCA) system have been designed and constructed with the successive approximation type ADC (Analog to Digital Converter). Linear Gate, window, and palse stretcher consist of mainly linear and logic IC's, and are properly combined together to achieve short dead time and good linearity of the system. ADC 1211 (analysing time: $120{\mu}sec$) and S-RAM (static random acess memory) 6264 are used in ADC module. Two 6264 memories are connected in parallel in order to-provide enough counting capacity ($2^{16}-1$). Interfaced microcomputer Apple II controls this system and analizes the counted data. The system is tested by input pulses between 0V to 10V from oscillator.

• Journal of the Institute of Electronics and Information Engineers
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• v.53 no.3
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• pp.46-55
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• 2016

This work proposes a 13b 100MS/s 45nm CMOS ADC with a high dynamic performance for IF-domain high-speed signal processing systems based on a four-step pipeline architecture to optimize operating specifications. The SHA employs a wideband high-speed sampling network properly to process high-frequency input signals exceeding a sampling frequency. The SHA and MDACs adopt a two-stage amplifier with a gain-boosting technique to obtain the required high DC gain and the wide signal-swing range, while the amplifier and bias circuits use the same unit-size devices repeatedly to minimize device mismatch. Furthermore, a separate analog power supply voltage for on-chip current and voltage references minimizes performance degradation caused by the undesired noise and interference from adjacent functional blocks during high-speed operation. The proposed ADC occupies an active die area of $0.70mm^2$, based on various process-insensitive layout techniques to minimize the physical process imperfection effects. The prototype ADC in a 45nm CMOS demonstrates a measured DNL and INL within 0.77LSB and 1.57LSB, with a maximum SNDR and SFDR of 64.2dB and 78.4dB at 100MS/s, respectively. The ADC is implemented with long-channel devices rather than minimum channel-length devices available in this CMOS technology to process a wide input range of $2.0V_{PP}$ for the required system and to obtain a high dynamic performance at IF-domain input signal bands. The ADC consumes 425.0mW with a single analog voltage of 2.5V and two digital voltages of 2.5V and 1.1V.

• Journal of the Institute of Electronics and Information Engineers
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• v.50 no.1
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• pp.137-147
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• 2013

In this paper, an 1.2V 8b 1GS/s A/D Converter(ADC) based on a folding architecture with a resistive interpolation technique is described. In order to overcome the asymmetrical boundary-condition error of conventional folding ADCs, a novel scheme with an odd number of folding blocks and a fractional folding rate are proposed. Further, a new digital encoding technique with an arithmetic adder is described to implement the proposed fractional folding technique. The proposed ADC employs an iterating offset self-calibration technique and a digital error correction circuit to minimize device mismatch and external noise The chip has been fabricated with a 1.2V 0.13um 1-poly 6-metal CMOS technology. The effective chip area is $2.1mm^2$ (ADC core : $1.4mm^2$, calibration engine : $0.7mm^2$) and the power dissipation is about 350mW including calibration engine at 1.2V power supply. The measured result of SNDR is 46.22dB, when Fin = 10MHz at Fs = 1GHz. Both the INL and DNL are within 1LSB with the self-calibration circuit.

• Journal of IKEEE
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• v.9 no.1 s.16
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• pp.65-71
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• 2005

Physical signals generated in the real world are transformed into electrical signals through sensors and fed into electronic circuits. The electrical signals input to electronic circuits are in analog form, thus they must be converted to digital signals using an ADC(Analog-Digital Converter) for digital processing. Signal processing circuits and ADCs that are to be integrated on a single chip together with silicon micro sensors should be designed to have less silicon area and less power consumption. This paper proposed a charge redistribution ADC which reduces silicon area considerably. The proposed method achieves 8 bit conversion by performing 4-bit conversion twice. It reduced the area of capacitor array, which takes most of the ADC area, by 1/16 when compared to a conventional method. Though it uses twice the number of clocks as a conventional method, it would be appropriate to be integrated with a silicon pressure sensor on a single chip since it does not demand high conversion rate.

• Journal of IKEEE
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• v.17 no.3
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• pp.275-283
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• 2013

In this paper, a 8bit 10Ms/s CMOS Folding and Interpolation analog-to-digital convertor is proposed. The architecture of the proposed ADC is based on a Folding & Interpolation using FR(Folding Rate)=8, NFB(Number of Folding Block)=4, IR(Interpolation Rate)=8. The proposed ADC adopts a preamplifier sharing method to decrease the number of preamplifier by half comparing to the conventional ones. This chip has been fabricated with a 0.35[um] CMOS technology. The effective chip area is $1.8[mm]{\times}2.11[mm]$ and it consumes 20[mA] at 3.3 power supply with 10[MHz] clock. The INL is -0.57, +0.61 [LSB] and DNL is -0.4, +0.51 [LSB]. The SFDR is 48.9[dB] and SNDR is 47.9[dB](ENOB 7.6b) when the input frequency is 100[kHz] at 10[MHz] conversion rate.

• JSTS:Journal of Semiconductor Technology and Science
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• v.16 no.6
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• pp.760-770
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• 2016

A 12-bit 750 kS/s Dual-Sampling Successive Approximation Register Analog-to-Digital Converter (SAR ADC) technique with reduced Capacitive DAC (CDAC) is presented in this paper. By adopting the Adaptive Power Control (APC) technique for the two-stage latched type comparator and using bootstrap switch, power consumption can be reduced and overall system efficiency can be optimized. Bootstrapped switches also are used to enhance the sampling linearity at a high input frequency. The proposed SAR ADC reduces the average switching energy compared with conventional SAR ADC by adopting reduced the Most Significant Bit (MSB) cycling step with Dual-Sampling of the analog signal. This technique holds the signal at both comparator input asymmetrically in sample mode. Therefore, the MSB can be calculated without consuming any switching energy. The prototype SAR ADC was implemented in $0.18-{\mu}m$ CMOS technology and occupies $0.728mm^2$. The measurement results show the proposed ADC achieves an Effective Number-of-Bits (ENOB) of 10.73 at a sampling frequency of 750 kS/s and clock frequency of 25 MHz. It consumes only 0.13 mW from a 5.0-V supply and achieves the INL and DNL of +2.78/-2.45 LSB and +0.36/-0.73 LSB respectively, SINAD of 66.35 dB, and a Figures-of-Merit (FoM) of a 102 fJ/conversion-step.