• Title/Summary/Keyword: 백색광간섭계

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Roughness Measurement of Hole Processing Surface for Mold Steel Using White Light Interferometer (백색광간섭계를 이용한 금형용 강재 구멍가공면의 조도 측정)

  • Lee, Seung-Chul;Kim, Kyeong-Suk
    • Journal of the Korean Society for Nondestructive Testing
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    • v.33 no.1
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    • pp.73-79
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    • 2013
  • In this study, NIMAX material has been processed using the three-dimensional measuring instrument and white light interferometer. they were tested to roundness and surface roughness and results are as follows: As for a cutting characteristic, it indicated that F4 showed a lower result than 2F showed due to the high hardness of the material and showed a good result when spindle rotation speed and tool feed were low. As for the measurement of roundness through 3-Dimensional measuring machine, it indicated that 4F showed a good result like the condition of cutting component and that roundness showed a good result when spindle rotation speed of 1,700 rpm and tool feed speed of 85 mm/min were applied. As for the surface roughness of processing surface, Surface roughness showed better 4F than 2F and conditions of spindle rotation speed 1,700 rpm, tool feed rate 55 mm/min showed good results in the Ra $0.4025{\mu}m$.

A comparative study on peak finding algorithms in white light interferometry (백색광 간섭계의 봉우리 찾기 셈법 비교)

  • 민경일;남기봉
    • Korean Journal of Optics and Photonics
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    • v.11 no.6
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    • pp.395-399
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    • 2000
  • In white light interferometry, fast and accurate localization of the fringe visibility is the most essential part in application of the principle. So much attention has been concentrated on speeding up the process, we in this study decided to investigate the results of the various peak-finding algorithms. Of the many approaches, two most simplistic algorithms were selected for their straightforwardness and robustness. Both were equally accurate in measuring the step height of a sample, but the method based on the weighted average technique proved to be truer to the surface topography. A model explaining the shortcomings of the correlation technique is presented. ented.

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Optical Probe of white Light Interferometry for Precision Coordinate Metrology (정밀 삼차원 측정을 위한 백색광 간섭 광학 프로브 개발)

  • 김승우;진종한;강민구
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2002.05a
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    • pp.195-198
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    • 2002
  • Demand for high precision measurement of large area is increasing in many industrial fields. White-light Scanning Interferometer(WSI) is a well-known method for 3D profile measurement. However WSI has some limitations in a measurement range because of the sensing mechanism. Therefore, in this paper we use a heterodyne laser interferometer to get over the limitations of a short measurement range in WSI, We suggest a new WSI system combined with heterodyne laser interferometer. This system is aimed at eliminating Abbe error with measuring the focus point directly. With the use of triggering functionality of WSI, we can use this system as a probe of a precision stage such as a probe of CMM. The suggested system gives a repeatability of 87 nm in the absolute distance measurement test under the laboratory environment.

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Design and manufacture of eyeball protrusion measuring device using white light scanning interferometer (백색광 간섭계를 이용한 안구 돌출 측정 장치 설계 및 제작)

  • Chang, Jung-soo;Kim, Young-kil
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.23 no.1
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    • pp.63-69
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    • 2019
  • The relative position of the orbital eye can be a criterion for evaluating several pathological conditions. It is especially useful to diagnose orbital fractures, thyroid eye disease, orbital tumors and to evaluate the outcome of medication and surgical treatment. Hertel and Naugle are representative measurement tools used to measure eyeball protrusion values, and have different measurement results, such as fixed orbits, every time they are inspected, even if the same inspector repeatedly measures them. Even with the same calibrator, it is inevitable that different manufacturers will change the design of the stationary part of the orbit, causing the surveyor to make a measurement error. In this paper, we designed and fabricated a protrusion measuring device using a white light interferometer and measured the protrusion of the human eye and found that the precision and repeatability were significantly higher than the manual measurement method.

Exophthalmometric values using White-light Scanning Interferometer (백색광 간섭계를 이용한 안구 돌출 값 측정)

  • Chang, Jung-soo;Kim, Young-kil
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.21 no.12
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    • pp.2341-2346
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    • 2017
  • The relative position of the eyeballs in the orbit can be a criterion for estimating multiple pathological conditions. Especially, it is useful to diagnose orbital fracture, thyroid eye disease, orbital tumor, and to evaluate the result of drug and surgical treatment. The Hertel and Naugle exophthalmometer, which are the most commonly used measuring instruments for measuring the prominence of the eye, are different from each other. Even if the same examiner repeatedly measures, it is inevitable. Also, even if the same exophthalmometer is different from the manufacturing company, the design of the fixed part of the orbit is different, and a measurement error is caused by the inspectors. In this paper, we propose a method of automatic measurement that can increase the accuracy and repeatability of measurement of exophthalmos using white light scanning interferometer, which is a 3D image measurement technique.

Sub-sampling Technique to Improve the Measurement Speed of White Light Scanning Interferometry (백색광 주사 간섭계의 측정 속도 개선을 위한 서브 샘플링 기법 연구)

  • Chyun, In-Bum;Joo, Ki-Nam
    • Journal of the Korean Society for Precision Engineering
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    • v.31 no.11
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    • pp.999-1006
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    • 2014
  • In this investigation, we explain the sub-sampling technique of white light scanning interferometry (WLSI) to improve the measurement speed. In addition to the previous work using Fourier domain analysis, several methods to extract the height from the correlogram of WLSI are described with the sub-sampling technique. Especially, Fourier-inverse Fourier transformation method adopting sub-sampling technique is proposed and the phase compensation technique is verified with simulation and experiments. The main advantage of sub-sampling is to speed up the measurements of WLSI but the precision such as repeatability is slightly poor. In case of measuring the sample which has high height step or difference, the proposed technique can be widely used to reduce the measurement time.

Dispersive white-light interferometry using polarization of light for thin-film thickness profile measurement (편광분리 분산 분산형 백색광 간섭계를 이용한 박막두께형상측정법)

  • Ghim Y.S.;Kim S.W.
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2005.06a
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    • pp.565-568
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    • 2005
  • We describe a new scheme of dispersive white-light interferometer that is capable of measuring the thickness profile of thin-film layers, for which not only the top surface height profile but also the film thickness of the target surface should be measured at the same time. The interferometer is found useful particularly for in-situ inspection of micro-engineered surfaces such as liquid crystal displays, which requires for high-speed implementation of 3-D surface metrology.

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Investigation of the Polarization Cross-Coupling in Fiber Coils Using White Light Michelson Interferometer (백색광 마이켈슨 간섭계를 이용한 광섬유 고리의 편광 교차결합 측정)

  • Jo, Min-Sik;Do, Jae-Chul
    • Journal of the Korea Institute of Military Science and Technology
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    • v.9 no.3
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    • pp.109-115
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    • 2006
  • The investigation of the polarization cross-coupling in fiber coils was made using white light Michelson interferometer. The white light interferometer has a light source of about 13nm spectral bandwidth and measurement resolution of less than -80dB. The measurement found that the 200m fiber coil has a polarization cross-coupling of about -64dB in average and -46dB in maximum.

Dispersive White-light Interferometry for in-situ Volumetric Thickness Profile of Thin-film Layers and a refractive index (분산형 백색광 간섭계를 이용한 미세 박막 구조물의 삼차원 두께 형상 및 굴절률의 실시간 측정)

  • Ghim Y.S.;Kim S.W.
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2006.05a
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    • pp.23-24
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    • 2006
  • We present a dispersive scheme of white-light interferometry that enables not only to perform tomographical measurements of thin-film layers but also to measure a refractive index without mechanical depth scanning. The interferometry is found useful particularly for in-situ 3-D inspection of micro-engineered surfaces such as liquid crystal displays, semi-conductor and MEMS structure, which requires for high-speed implementation of 3-D surface metrology.

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Phase Peak Ambiguity According to Illumination in White-Light Phase-Shifting Interferometry (백색광 간섭계의 위상 정점 알고리즘에서 조명에 따른 위상 정점 모호성에 관한 연구)

  • Kim, Gee-Hong;Lee, Hyung-Seok
    • Journal of the Korean Society for Precision Engineering
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    • v.25 no.1
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    • pp.85-91
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    • 2008
  • White light scanning interferometry has gotten a firm position in 3D surface profile measuring field. Recently, the LCD industry gave a chance for this technology to enter into real industry fields. It is known that white-light phase-shifting algorithm give a best resolution compare to other algorithms, but there are some problems to be resolved. One of them is 300nm jump in height profile, called bat-wing effect. The main reason of this problem is an ambiguity of phase-peak detection algorithm, and some solution has been proposed, but it didn't work perfectly. In this paper, I will show the cases when these effects are occurred, and these height discrepancies will be almost disappeared when broad-band illuminators are used.