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http://dx.doi.org/10.6109/jkiice.2017.21.12.2341

Exophthalmometric values using White-light Scanning Interferometer  

Chang, Jung-soo (Department of Bio Medical Engineering, Ajou University)
Kim, Young-kil (Department of Electronic Engineering, Ajou University)
Publication Information
Journal of the Korea Institute of Information and Communication Engineering / v.21, no.12, 2017 , pp. 2341-2346 More about this Journal
Abstract
The relative position of the eyeballs in the orbit can be a criterion for estimating multiple pathological conditions. Especially, it is useful to diagnose orbital fracture, thyroid eye disease, orbital tumor, and to evaluate the result of drug and surgical treatment. The Hertel and Naugle exophthalmometer, which are the most commonly used measuring instruments for measuring the prominence of the eye, are different from each other. Even if the same examiner repeatedly measures, it is inevitable. Also, even if the same exophthalmometer is different from the manufacturing company, the design of the fixed part of the orbit is different, and a measurement error is caused by the inspectors. In this paper, we propose a method of automatic measurement that can increase the accuracy and repeatability of measurement of exophthalmos using white light scanning interferometer, which is a 3D image measurement technique.
Keywords
Exophthalmometric values; White light Scanning Interferometer; Image processing; Inspection System;
Citations & Related Records
Times Cited By KSCI : 5  (Citation Analysis)
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