Dispersive White-light Interferometry for in-situ Volumetric Thickness Profile of Thin-film Layers and a refractive index

분산형 백색광 간섭계를 이용한 미세 박막 구조물의 삼차원 두께 형상 및 굴절률의 실시간 측정

We present a dispersive scheme of white-light interferometry that enables not only to perform tomographical measurements of thin-film layers but also to measure a refractive index without mechanical depth scanning. The interferometry is found useful particularly for in-situ 3-D inspection of micro-engineered surfaces such as liquid crystal displays, semi-conductor and MEMS structure, which requires for high-speed implementation of 3-D surface metrology.