• Journal of Radiation Protection and Research
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• v.27 no.1
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• pp.51-57
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• 2002

An electronic personal dosimeter(EPD) with hybrid type preamplifier adopting a semiconductor detector as a radiation detector has been developed, manufactured and test-evaluated. The radiation detection characteristics of this EPD has been performance-tested by using a reference photon radiation field. After several test-irradiations to a $^{137}Cs$ gamma radiation source the radiation detection sensitivity of this EPD appeared to be $3.8\;cps/Gy{\cdot}h^{-1}$. The linearity of radiation response was kept within 8% of the dose equivalent ranges of $10{\mu}Sv{\sim}4Sv$ and the angular dependence was under less than 4% in angles of ${\pm}60^{\circ}$. It was confirmed that the energy response range was in $60{\sim}1,250keV$ given in the ISO standard. This EPD satisfied the international criteria for the EPD in the mechanical and the environmental performance test for 9 test categories according to IEC 61526.

• Journal of the Semiconductor & Display Technology
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• v.11 no.2
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• pp.59-62
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• 2012

This test method covers a procedure for measuring particle removal characteristic of equipment fan filter unit(EFFU) installed inside of semiconductor process equipments, FPD manufacturing equipments and so on. Since EFFU is a combination of air filter and the assembly of fan, motor and frame, the integrity of these parts is very important for the performance of EFFU. So a conventional particle removal test method for air filters is not suitable for EFFU particle removal performance. This test method defines an evaluation method for EFFU which is installed inside an enclosed space to remove particles that are generated inside process equipment. The particle removal performance of EFFUs is usually depending on the performance of filter media and air flow rate. To understand a performance of an EFFU, the filter media characteristic, air flow rate and the integrity of EFFU parts should be considered simultaneously. This test method is intended to demonstrate the system performance of an EFFU and successfully evaluated EFFU performance characteristics.

• Journal of the Semiconductor & Display Technology
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• v.16 no.3
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• pp.71-77
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• 2017

As the automobile industry has shifted to software, the Automotive SPICE standard has been established to ensure efficient product development process and quality. In the assessment model, the HIS Scope is the minimum standard for small and medium automotive electric companies to meet OEM requirements. However, in order to achieve the HIS Scope, the output of each process stage that meets the verification criteria of Automotive SPICE must be created. In particular, the test phase takes a lot of resources, which is a big burden for small and medium-sized companies. In this paper, we propose a methodology for creating test cases of software integration test phase based on UML sequence diagram, which is a software design phase of Automotive SPICE HIS Scope, by applying behavior model based testing method. We also propose a tool chain for automating the creation process. This will reduce the resources required to create a test case.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.1
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• pp.14-19
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• 2008

Semiconductor testing area challenges many testing issues due to the minimization and ultra high performance of current semiconductors. Among these issues, signal integrity test on interconnections must be solved for highly integrated circuits like SoC. In this paper, we propose an effective pattern application method for signal integrity test on interconnects. Proposed method can be applied by using boundary scan architecture and very efficient test can be preceded with pretty short test time.

• Journal of the Semiconductor & Display Technology
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• v.23 no.2
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• pp.107-113
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• 2024

Scheduling of semiconductor test facilities has been crucial since effective scheduling contributes to the profits of semiconductor enterprises and enhances the quality of semiconductor products. This study aims to solve the scheduling problems for the wafer burn-in test facilities of the semiconductor back-end process by utilizing simulation and deep reinforcement learning-based methods. To solve the scheduling problem considered in this study. we propose novel state, action, and reward designs based on the Markov decision process. Furthermore, a neural network is trained by employing the recent RL-based method, named proximal policy optimization. Experimental results showed that the proposed method outperformed traditional heuristic-based scheduling techniques, achieving a higher due date compliance rate of jobs in terms of total job completion time.

• Proceedings of the KAIS Fall Conference
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• 2002.05a
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• pp.93-95
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• 2002

반도체 제조장비는 매우 높은 정밀도와 신뢰성이 요구되는 초정밀 시스템으로서 개발이 완료되어 실제 생산라인에 투입되기까지는 오랜 시간 동안 엄격한 시험평가를 통하여 신뢰성이 입증되어야 한다. 그러나 국내 중소 업계의 경우 고가 시험평가 설비를 보유하고 있지 않아 연구개발에 많은 어려움을 겪고 있다. 본 과제는 반도체 제조장비와 부품의 신뢰성 평가를 위한 시스템 구축방안에 대한 사항이다.

• Journal of the Semiconductor & Display Technology
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• v.6 no.2 s.19
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• pp.45-48
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• 2007

The proposed method offers an improved DC/DC converter scheme to increase power density. It is based on half-bridge topology with newly introduced pulse-grouping control method, which helps to reduce the transformer size and the volume of semiconductor devices maintaining high efficiency. Test results with 85W(18.5V/4.6A) design shows that the measured efficiency is 93.5% with power density of $36W/in^3$.

• Journal of the Semiconductor & Display Technology
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• v.19 no.4
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• pp.77-83
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• 2020

The Linear system analysis for physical system is very powerful tool for system diagnostic utilizing relationship between the input signal and output signal. This method utilized generally to investigate physical properties of system and the nondestructive test by ultrasonic signals. This method can be explained by linear system theory. In this paper the Continuous Wavelets Transform is utilized to search the relation between the linear system and continuous wavelets transform.

• KIISE Transactions on Computing Practices
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• v.21 no.10
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• pp.645-650
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• 2015

Tester Interface Software (TIS) provides all software functions that are necessary for a testing device to perform the test process on a memory semiconductor package from the time the device is put into the test equipment until the device is discharged from the equipment. TIS should perform the same work over all types of equipment regardless of their tester models. However, TIS has been developed and managed independently of the tester models because there are various equipment and computer models that are used in the test process. Therefore, more maintenance, time and cost are required for development, which adversely affects the quality of the software, and the problem becomes more serious when the new tester model is introduced. In this paper, we propose the Cross-platform Tester Interface Software (CTIS) framework, which can be integrated and operated on heterogeneous equipment and OSs.

• Proceedings of the KIEE Conference
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• 2006.10d
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• pp.203-205
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• 2006

대용량 인버터의 기본 구성요소인 밸브를 시험하는 방식에 대해 제안하였다. 대용량 인버터를 구성하기 위해서는 전력용 반도체 소자를 직렬로 연결하여 고전압을 스위칭할 수 있는 밸브가 필요하다. 이 밸브의 Snubber 회로의 적정성, 정격전압, 정격전류에서 정상적으로 스위칭이 이루어지는지 등의 검증이 필요하다. 본 본문에서는 전력용 반도체 소자에 이러한 시험조건을 제공하는 시험방식을 제안하였다.