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Linear System Analysis Using Wavelets Transform: Application to Ultrasonic Signal Analysis  

Joo, Young Bok (Department of Computer Science & Engineering, Korea University of Technology & Education)
Publication Information
Journal of the Semiconductor & Display Technology / v.19, no.4, 2020 , pp. 77-83 More about this Journal
Abstract
The Linear system analysis for physical system is very powerful tool for system diagnostic utilizing relationship between the input signal and output signal. This method utilized generally to investigate physical properties of system and the nondestructive test by ultrasonic signals. This method can be explained by linear system theory. In this paper the Continuous Wavelets Transform is utilized to search the relation between the linear system and continuous wavelets transform.
Keywords
Wavelet Transform; Linear; System; Ultrasonic; Signal; Analysis;
Citations & Related Records
Times Cited By KSCI : 6  (Citation Analysis)
연도 인용수 순위
1 Paradis, L. "Development of methods and a device of signal processing adapted to NDT by ultrasonic waves", Thesis of Doctor Engineer, INP Grenoble, 1983
2 E. Carnevale, L. Lynnworth and G. Larson, Ultrasonic Measurements of elastic moduli at elevated temperatures using momentary contacts, J. Acous. Soc. Am., Vol. 36, No. 9, pp 1678-1684, 1964   DOI
3 G.J Lord, E Pardo-lguzquiza, I.M Smith," A practical guide to wavelets for Metrology", NPL Report CMSC 02, June,2000
4 Candes, E.J. and Donoho, D.J. Curvelets, Multi-resolution Representation, and Scaling Laws, Wavelet Applications in Signal and Image Processing VIII, SPIE, 4119 .2000.
5 Kim, Sung Joo, Kim, Gyung Bum. "A Study on the Defect Classification of Low-contrast·Uneven· Featureless Surface Using Wavelet Transform and Support Vector Machine", Journal of the Semiconductor & Display Technology, Volume 19, Issue 3, Pages 1-6, 2020.
6 Lee, Yong-Hwan, Kim, Youngseop, "Benchmarking of Single Image Reflection Removal Algorithms", Journal of the Semiconductor & Display Technology, Volume 18, Issue 4, Pages 154-159, 2019.
7 Mahmood, Muhammad Tariq, Choi, Young Kyu, "An Improved Multiple Interval Pixel Sampling based Background Subtraction Algorithm", Journal of the Semiconductor & Display Technology, Volume 18, Issue 3, Pages 1-1-6, 2019.
8 Lee, Jun Ha, "Analysis of Surface Characteristics for Clad Thin Film Materials", Journal of the Semiconductor & Display Technology, Volume 17, Issue 1, Pages 1-62-65, 2019