• 대한기계학회논문집A
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• 제32권2호
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• pp.186-193
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• 2008

[ $Moir{\acute{e}}$ ] interferometry is an optical method, providing whole field contour maps of in-plane displacements with high resolution. The demand for enhanced sensitivity in displacement measurements leads to the technique of microscopic $moir{\acute{e}}$ interferometry. The method is an extension of the $moir{\acute{e}}$ interferometry, and employs an optical microscope for the required spatial resolution. In this paper, the sensitivity of $moir{\acute{e}}$ interferometry is enhanced by an order of magnitude using an immersion interferometry and the optical/digital fringe multiplication(O/DFM) method. In fringe patterns, the contour interval represents the displacement of 52 nm per fringe order. In order to estimate the reliability and the applicability of the optical system implemented, the measurements of rigid body displacements of grating mold and the coefficient of thermal expansion(CTE) for an aluminium block are performed. The system developed is applied to the measurement of thermal deformation in a flip chip plastic ball grid array package.

• 대한기계학회:학술대회논문집
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• 대한기계학회 2001년도 춘계학술대회논문집A
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• pp.90-95
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• 2001

Thermo-mechanical and flexural behavior of a wire-bond plastic ball grid array (WB-PBGA) are characterized by high sensitive $moir{\acute{e}}$ interferometry. $Moir{\acute{e}}$ fringe patterns are recorded and analyzed at several various bending loads and temperature steps. At the temperature higher that $100^{\circ}C$, the inelastic deformation in solder balls became more dominant. As a result the bending of the molding compound decreased while temperature increased. The strain results show that the solder ball located at the edge of the chip has largest shear strain by the thermal load while the maximum average shear strain by the bending moment occurs in the end solder. The results also show that $moir{\acute{e}}$ interferometry is a powerful and effective tool in experimental studies of electronic packaging.

• 대한기계학회:학술대회논문집
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• 대한기계학회 2003년도 추계학술대회
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• pp.1027-1032
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• 2003

Thermo-mechanical behavior of flip-chip plastic ball grid array (FC-PBGA) packages are characterized by high sensitive $Moir{\acute{e}}$ interferometry. $Moir{\acute{e}}$ fringe patterns are recorded and analyzed for several temperatures. Deformation analysis of bending displacements of the packages and average strains in the solder balls for a single-sided package assembly and a double-sided package assembly are presented. The bending displacement of the double-sided package assembly is smaller than that of the single-sided one. The largest of effective strain occurred in the solder ball located at the edge of the chip and its magnitude of the double-sided package assembly is greater than that of single-sided one.

• 대한기계학회:학술대회논문집
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• 대한기계학회 2003년도 추계학술대회
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• pp.1407-1412
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• 2003

In MEMS devices, packaging induced stress or stress induced structure deformation become increasing concerns since it directly affects the performance of the device. In this paper, deformation behavior of MEMS gyroscope package subjected to temparature change is investigated using high-sensitivity $Moir{\acute{e}}$ interferometry. Using the real-time $Moir{\acute{e}}$ setup, fringe patterns are recorded and analyzed at several temperatures. Temperature dependent analyses of warpages and extensions/contractions of the package are presented. Linear elastic behavior is documented in the temperature region of room temperature to $125^{\circ}C$. Analysis of the package reveals that global bending occurs due to the mismatch of thermal expansion coefficient between the chip, the molding compond and the PCB.

• 대한기계학회논문집A
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• 제23권7호
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• pp.1129-1138
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• 1999

[$Moir\acute{e}$] technique is now being extensively investigated as a fast non-contact means of three-dimensional profile measurement especially for reverse engineering. One problem with $moir\acute{e}$ technique is so called $2\pi$-ambiguity problem that limits the maximum step height difference between two neighboring sampling points to be less than half the equivalent wavelength of $moir\acute{e}$ fringes. In this investigation, a new two-wavelength scheme of projection $moir\acute{e}$ topography is proposed and tested to cope with the $2\pi$-ambiguity problem. Experimental results are discussed to assess the new method in measuring large objects with high step discontinuities.

• 한국전산구조공학회논문집
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• 제24권1호
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• pp.97-106
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• 2011

본 연구에서는 전자패키지에 사용되는 솔더 재료의 점소성 물성치를 규명하였다. 이를 위해 전자패키지와 비슷한 변형을 보이는 시편을 제작하였고 모아레 간섭계를 이용하여 열사이클 하에서의 변형을 측정한 뒤 시편의 굽힘 변위와 솔더의 전단 변형률을 구하였다. 시편에 대해 점소성 유한요소해석을 실시하였고 해석 결과가 실험 결과에 일치하도록 물성치를 역으로 추정하였다. 실험에서 발생한 측정오차와 실험횟수 부족 등의 불확실성을 고려하기 위해 컴퓨터 모델 교정법을 이용하였고, 그 결과 추정된 물성치는 평균 및 신뢰구간으로 표현되었으며, 이로 인한 유한요소해석 결과도 마찬가지로 평균 및 신뢰구간으로 표현되었다.

• 마이크로전자및패키징학회지
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• 제17권2호
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• pp.21-28
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• 2010

본 논문에서는 온도 사이클이 진행되는 동안 비선형 거동과 크립 거동을 보이는 FC-PBGA 패키지 솔더볼의 변형거동을 알아보기 위하여 시간에 종속하는 거동을 적용 시킬 수 있는 점소성 모델과 크립 모델에 대하여 유한요소해석을 수행하였다. 유한요소해석 결과의 신뢰성을 평가하기 위하여 무아레 간섭계를 이용하여 온도변화에 따른 열변형 실험을 수행하였다. 전체적인 굽힘변위는 Anand 모델과 변형률 분리 모델 모두 실험결과와 잘 일치하였으나 솔더볼의 변형률은 Anand 모델의 경우 큰 차이를 보이고 변형률 분리 모델의 경우 상당히 일치하는 계산결과를 얻었다. 따라서 본 논문에서는 변형률 분리 모델을 이용하여 시간에 종속하는 FC-PBGA 패키지 솔더볼의 크립 거동을 검토하였다. 솔더를 포함한 패키지에 온도변화가 생길 때 고온에서는 시간이 지남에 따라 크립 거동에 의해 솔더의 응력이 점차 완화되는 현상을 나타내고 있음을 알 수 있었다.

• 대한기계학회논문집A
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• 제33권4호
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• pp.380-387
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• 2009

The reliability concerns of solder interconnections in flip chip PBGA packages are produced mainly by the mismatch of coefficient of thermal expansion(CTE) between the module and PCB. Finite element analysis has been employed extensively to simulate thermal loading for solder joint reliability and deformation of packages in electronic packages. The objective of this paper is to study the thermo-mechanical behavior of FC-PBGA package assemblies subjected to temperature change, with an emphasis on the effect of the finite element model, material models and temperature conditions. Numerical results are compared with the experimental results by using $moir{\acute{e}}$ interferometry. Result shows that the bending displacements of the chip calculated by the finite element analysis with viscoplastic material model is in good agreement with those by $moir{\acute{e}}$ inteferometry.

• 대한기계학회논문집A
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• 제31권11호
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• pp.1100-1107
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• 2007

In this study, a method to characterize material properties of adhesive that is used in a layered plates bonding process is developed by combined evaluation of experiment, simulation and optimization technique. A small bonded specimens of rectangular plate are prepared to this end, and put into a thermal loading conditions. $Moir{\acute{e}}$ interferomety is used to measure submicron displacements occurred during the process. The elevated temperature is chosen as control factors. FE analysis with constant values for the adhesive materials is also carried out to simulate the experiment. Significant differences are observed from the two results, in which the simulation predicts the monotonic increase of the bending displacement whereas the measurement shows decrease of the displacement at above $75^{\circ}C$. In order to minimize the difference of the two, material parameters of the adhesive at a number of different temperatures are posed as unknowns to be determined, and optimization is conducted. As a result, optimum material parameters are found that excellently matches the simulation and experiment, which are decreased with respect to the temperature.

• Journal of the Optical Society of Korea
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• 제19권2호
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• pp.165-168
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• 2015

A simple method to determine the focal length of a lens using the Talbot image is presented. This method uses only one grating, requiring neither Moir$\acute{e}$ fringe analysis nor the angle between the gratings. The original Fourier transform was used to access the spectrum beyond the limitation set of the usual fast Fourier transform to determine the (de)magnification accurately enough to be used for the focal length. A set of Talbot images simulated numerically with the Fresnel diffraction integral was used to demonstrate the method. For focal lengths between 5550 mm and 5650 mm, the mean difference between the focal lengths determined from the Talbot images and the true values was 3.3 mm with the standard deviation of the difference being 3.8 mm. The true focal lengths can be recovered with an accuracy of 0.06%.