• Title/Summary/Keyword: test data

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Design of Data Retention Test Circuit for Large Capacity DRAMs (대용량 Dynamic RAM의 Data Retention 테스트 회로 설계)

  • 설병수;김대환;유영갑
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.30A no.9
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    • pp.59-70
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    • 1993
  • An efficient test method based on march test is presented to cover line leakage failures associated with bit and word lines or mega bit DRAM chips. A modified column march (Y-march) pattern is derived to improve fault coverage against the data retention failure. Time delay concept is introduced to develop a new column march test algorithm detecting various data retention failures. A built-in test circuit based on the column march pattern is designed and verified using logic simulation, confirming correct test operations.

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Effect of complex sample design on Pearson test statistic for homogeneity (복합표본자료에서 동질성검정을 위한 피어슨 검정통계량의 효과)

  • Heo, Sun-Yeong;Chung, Young-Ae
    • Journal of the Korean Data and Information Science Society
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    • v.23 no.4
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    • pp.757-764
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    • 2012
  • This research is for comparison of test statistics for homogeneity when the data is collected based on complex sample design. The survey data based on complex sample design does not satisfy the condition of independency which is required for the standard Pearson multinomial-based chi-squared test. Today, lots of data sets ara collected by complex sample designs, but the tests for categorical data are conducted using the standard Pearson chi-squared test. In this study, we compared the performance of three test statistics for homogeneity between two populations using data from the 2009 customer satisfaction evaluation survey to the service from Gyeongsangnam-do regional offices of education: the standard Pearson test, the unbiasedWald test, and the Pearsontype test with survey-based point estimates. Through empirical analyses, we fist showed that the standard Pearson test inflates the values of test statistics very much and the results are not reliable. Second, in the comparison of Wald test and Pearson-type test, we find that the test results are affected by the number of categories, the mean and standard deviation of the eigenvalues of design matrix.

An Alloy Specification Based Automated Test Data Generation Technique (Alloy 명세 기반 자동 테스트 데이터 생성 기법)

  • Chung, In-Sang
    • The KIPS Transactions:PartD
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    • v.14D no.2
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    • pp.191-202
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    • 2007
  • In general, test data generation techniques require the specification of an entire program path for automated test data generation. This paper presents a new way for generating test data automatically een without specifying a program path completely. For the ends, this paper presents a technique for transforming a program under test into Alloy which is the first order relational logic and then producing test data via Alloy analyzer. The proposed method reduces the burden of selecting a program path and also makes it easy to generate test data according to various test adequacy criteria. This paper illustrates the proposed method through simple, but illustrative examples.

An Empirical Evaluation of Test Data Generation Techniques

  • Han, Seung-Hee;Kwon, Yong-Rae
    • Journal of Computing Science and Engineering
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    • v.2 no.3
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    • pp.274-300
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    • 2008
  • Software testing cost can be reduced if the process of testing is automated. However, the test data generation task is still performed mostly by hand although numerous theoretical works have been proposed to automate the process of generating test data and even commercial test data generators appeared on the market. Despite prolific research reports, few attempts have been made to evaluate and characterize those techniques. Therefore, a lot of works have been proposed to automate the process of generating test data. However, there is no overall evaluation and comparison of these techniques. Evaluation and comparison of existing techniques are useful for choosing appropriate approaches for particular applications, and also provide insights into the strengths and weaknesses of current methods. This paper conducts experiments on four representative test data generation techniques and discusses the experimental results. The results of the experiments show that the genetic algorithm (GA)-based test data generation performs the best. However, there are still some weaknesses in the GA-based method. Therefore, we modify the standard GA-based method to cope with these weaknesses. The experiments are carried out to compare the standard GA-based method and two modified versions of the GA-based method.

The Identification Of Multiple Outliers

  • Park, Jin-Pyo
    • Journal of the Korean Data and Information Science Society
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    • v.11 no.2
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    • pp.201-215
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    • 2000
  • The classical method for regression analysis is the least squares method. However, if the data contain significant outliers, the least squares estimator can be broken down by outliers. To remedy this problem, the robust methods are important complement to the least squares method. Robust methods down weighs or completely ignore the outliers. This is not always best because the outliers can contain some very important information about the population. If they can be detected, the outliers can be further inspected and appropriate action can be taken based on the results. In this paper, I propose a sequential outlier test to identify outliers. It is based on the nonrobust estimate and the robust estimate of scatter of a robust regression residuals and is applied in forward procedure, removing the most extreme data at each step, until the test fails to detect outliers. Unlike other forward procedures, the present one is unaffected by swamping or masking effects because the statistics is based on the robust regression residuals. I show the asymptotic distribution of the test statistics and apply the test to several real data and simulated data for the test to be shown to perform fairly well.

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Nonpararmetric estimation for interval censored competing risk data

  • Kim, Yang-Jin;Kwon, Do young
    • Journal of the Korean Data and Information Science Society
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    • v.28 no.4
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    • pp.947-955
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    • 2017
  • A competing risk analysis has been applied when subjects experience more than one type of end points. Geskus (2011) showed three types of estimators of CIF are equivalent under left truncated and right censored data. We extend his approach to an interval censored competing risk data by using a modified risk set and evaluate their performance under several sample sizes. These estimators show very similar results. We also suggest a test statistic combining Sun's test for interval censored data and Gray's test for right censored data. The test sizes and powers are compared under several cases. As a real data application, the suggested method is applied a data where the feasibility of the vaccine to HIV was assessed in the injecting drug uses.

An Improved Technique of Fitness Evaluation for Automated Test Data Generation (테스트 데이터 자동 생성을 위한 적합도 평가 방법의 효율성 향상 기법)

  • Lee, Sun-Yul;Choi, Hyun-Jae;Jeong, Yeon-Ji;Bae, Jung-Ho;Kim, Tae-Ho;Chae, Heung-Suk
    • Journal of KIISE:Software and Applications
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    • v.37 no.12
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    • pp.882-891
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    • 2010
  • Many automated dynamic test data generation technique have been proposed. The techniques evaluate fitness of test data through executing instrumented Software Under Test (SUT) and then generate new test data based on evaluated fitness values and optimization algorithms. Previous researches and experiments have been showed that these techniques generate effective test data. However, optimization algorithms in these techniques incur much time to generate test data, which results in huge test case generation cost. In this paper, we propose a technique for reducing the time of evaluating a fitness of test data among steps of dynamic test data generation methods. We introduce the concept of Fitness Evaluation Program (FEP), derived from a path constraint of SUT. We suggest a test data generation method based on FEP and implement a test generation tool, named ConGA. We also apply ConGA to generate test cases for C programs, and evaluate efficiency of the FEP-based test case generation technique. The experiments show that the proposed technique reduces 20% of test data generation time on average.

A Test for Autocorrelation in Dynamic Panel Data Models

  • Jung, Ho-Sung
    • Proceedings of the Korean Statistical Society Conference
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    • 2005.11a
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    • pp.167-173
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    • 2005
  • This paper presents an autocorrelation test that is applicable to dynamic panel data models with serially correlated errors. The residual-based GMM t-test is a significance test that is applied after estimating a dynamic model by using the instrumental variable(IV) method and is directly applicable to any other consistently estimated residuals. Monte Carlo simulations show that the t-test has considerably more power than the $m_2$ test or the Sargan test under both forms of serial correlation (i.e., AR(1) and MA(1)).

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A TEST FOR AUTOCORRELATION IN DYNAMIC PANEL DATA MODELS

  • Jung, Ho-Sung
    • Journal of the Korean Statistical Society
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    • v.34 no.4
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    • pp.367-375
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    • 2005
  • This paper presents an autocorrelation test that is applicable to dynamic panel data models with serially correlated errors. The residual-based GMM t-test is a significance test that is applied after estimating a dynamic model by using the instrumental variable (IV) method and is directly applicable to any other consistently estimated residuals. Monte Carlo simulations show that the t-test has considerably more power than the $m_2$ test or the Sargan test under both forms of serial correlation (i.e., AR(1) and MA(1)).

An Efficient Technique to Improve Compression for Low-Power Scan Test Data (저전력 테스트 데이터 압축 개선을 위한 효과적인 기법)

  • Song, Jae-Hoon;Kim, Doo-Young;Kim, Ki-Tae;Park, Sung-Ju
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.43 no.10 s.352
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    • pp.104-110
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    • 2006
  • The huge test data volume, test time and power consumption are major problems in system-on-a-chip testing. To tackle those problems, we propose a new test data compression technique. Initially, don't-cares in a pre-computed test cube set are assigned to reduce the test power consumption, and then, the fully specified low-power test data is transformed to improve compression efficiency by neighboring bit-wise exclusive-or (NB-XOR) scheme. Finally, the transformed test set is compressed to reduce both the test equipment storage requirements and test application time.