대한전자공학회논문지SD (Journal of the Institute of Electronics Engineers of Korea SD)

대한전자공학회 (The Institute of Electronics and Information Engineers)
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저전력 테스트 데이터 압축 개선을 위한 효과적인 기법

An Efficient Technique to Improve Compression for Low-Power Scan Test Data

  • 송재훈 (한양대학교 컴퓨터공학과) ;
  • 김두영 (한양대학교 컴퓨터공학과) ;
  • 김기태 (한양대학교 컴퓨터공학과) ;
  • 박성주 (한양대학교 전자 컴퓨터 공학과)
  • Song, Jae-Hoon (Department of Computer Science & Engineering, Hanyang University) ;
  • Kim, Doo-Young (Department of Computer Science & Engineering, Hanyang University) ;
  • Kim, Ki-Tae (Department of Computer Science & Engineering, Hanyang University) ;
  • Park, Sung-Ju (Department of Electrical Engineering Computer Science, Hanyang University)
  • 발행 : 2006.10.25
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⟨ 이전 논문 다음 논문 ⟩

초록

오늘날 시스템 온 칩 테스트에 있어서 많은 양의 테스트 데이터, 시간 및 전력 소모는 매우 중요한 문제이다. 이러한 문제들을 해결하기 위해서 본 논문은 새로운 테스트 데이터 압축 기술을 제안한다. 우선, 테스트 큐브 집합에 있는 돈 캐어 비트에 저전력 테스트를 위한 비트할당을 한다. 그리고, 비트할당이 된 저전력 테스트 데이터의 압축효율을 높이기 위해 이웃 비트 배타적 논리합 변환을 사용하여 변환한다. 최종적으로, 변환된 테스트 데이터는 효과적으로 압축됨으로써 테스트 장비의 저장공간과 테스트 데이터 인가시간을 줄일 수 있게 된다.

The huge test data volume, test time and power consumption are major problems in system-on-a-chip testing. To tackle those problems, we propose a new test data compression technique. Initially, don't-cares in a pre-computed test cube set are assigned to reduce the test power consumption, and then, the fully specified low-power test data is transformed to improve compression efficiency by neighboring bit-wise exclusive-or (NB-XOR) scheme. Finally, the transformed test set is compressed to reduce both the test equipment storage requirements and test application time.

키워드

참고문헌

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