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An Efficient Technique to Improve Compression for Low-Power Scan Test Data  

Song, Jae-Hoon (Department of Computer Science & Engineering, Hanyang University)
Kim, Doo-Young (Department of Computer Science & Engineering, Hanyang University)
Kim, Ki-Tae (Department of Computer Science & Engineering, Hanyang University)
Park, Sung-Ju (Department of Electrical Engineering Computer Science, Hanyang University)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.43, no.10, 2006 , pp. 104-110 More about this Journal
Abstract
The huge test data volume, test time and power consumption are major problems in system-on-a-chip testing. To tackle those problems, we propose a new test data compression technique. Initially, don't-cares in a pre-computed test cube set are assigned to reduce the test power consumption, and then, the fully specified low-power test data is transformed to improve compression efficiency by neighboring bit-wise exclusive-or (NB-XOR) scheme. Finally, the transformed test set is compressed to reduce both the test equipment storage requirements and test application time.
Keywords
test data compression; low power; scan test; soc test;
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