• 제목/요약/키워드: test cost

검색결과 3,952건 처리시간 0.031초

An Economic Life Test Sampling Plan for Repairable Products with Exponential Interfailure Time Distribution

  • Kwon, Young Il
    • 품질경영학회지
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    • 제21권1호
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    • pp.108-120
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    • 1993
  • In this article an economic life test sampling plan is considered for repairable products when the products in each lot have the same interfailure time distribution, but the mean time between failure (MTBF) of a lot varies from lot to lot according to a known prior distribution. A cost model is constructed which consists of test cost, accept cost, and reject cost. Determination of the optimal plan which minimizes the expected average cost per lot is discussed. Numerical examples are presented to illustrate the use of the proposed sampling plans and sensitivity analyses for parameters of the prior distribution are performed.

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소비자 보호를 위한 선별형 샘플링 검사와 신뢰성 샘플링 검사의 최적설계에 관한 연구 (A Study on the Rectifying Inspection Plan & Life Test Sampling Plan Considering Cost)

  • 강보철;조재립
    • 품질경영학회지
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    • 제30권1호
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    • pp.74-96
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    • 2002
  • The objectives of this study is to suggest the rectifying sampling inspection plan considering quality cost. Limiting quality level(LQL) plans(also called LTPD plans) and outgoing quality(OQ) plans are considered. The Hald's linear cost model is discussed with and without a beta prior for the distribution of the fraction of nonconforming items in a lot. It is assumed that the sampling inspection is error free. We consider the design of reliability acceptance sampling plan (RASP) for failure rate level qualification at selected confidence level. The lifetime distribution of products is assumed to be exponential. MIL-STD-690C and K C 6032 standards provide this procedures. But these procedures have some questions to apply in the field. The cost of test and confidence level(1-$\beta$ risk) are the problem between supplier and user. So, we suggest that the optimal life test sampling inspection plans using simple linear cost model considering product cost, capability of environment chamber, environmental test cost, and etc. Especially, we consider a reliability of lots that contain some nonconforming items. In this case we assumed that a nonconforming item fail after environmental life test. Finally, we develope the algorithm of the optimal sampling inspection plan based on minimum costs for rectifying inspection and RASP. And computer application programs are developed So, it is shown how the desired sampling plan can be easily found.

sudden death 시험에 대한 고찰 (A Note on Sudden Death Tests)

  • 서순근
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제12권3호
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    • pp.139-152
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    • 2012
  • Successive and simultaneous sudden death tests are compared with the complete and Type II censored samples in terms of expected test duration and Total Time on Test(TTT) subject to the same number of failures in order to maintain the equal statistical precision under Weibull lifetime distribution with known shape parameter. Also, two sudden death tests under a proposed cost model are discussed and a numerical example is provided to illustrate the use of the proposed cost model.

Cost-effectiveness Analysis of Cervical Cancer Screening Strategies Based on the Papanicolaou Smear Test in Korea

  • Ko, Min Jung;Kim, Jimin;Kim, Younhee;Lee, Yoon Jae;Hong, Sung Ran;Lee, Jae Kwan
    • Asian Pacific Journal of Cancer Prevention
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    • 제16권6호
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    • pp.2317-2322
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    • 2015
  • Background: Despite the increasing number of screening examinations performed for cervical cancer utilizing the Papanicolaou smear test (Pap test), few studies have examined whether this strategy is cost-effective in Korea. Objective: This study was conducted to evaluate the cost-effectiveness of cervical cancer screening strategies incorporating the Pap test based on age at the start and end of screening as well as screening interval. Materials and Methods: We designed four alternative screening strategies based on patient age when screening was started (20 or 30 years) and discontinued (lifetime, 79 years). Each strategy was assessed at screening intervals of 1, 2, 3, or 5 years. A Markov model was developed to determine the cost-effectiveness of the 16 possible cervical cancer screening strategies, and this was evaluated from a societal perspective. The main outcome measures were average lifetime cost, incremental quality-adjusted life-years (QALYs), and incremental cost-effectiveness ratio (ICER). Results: Compared with various strategies comprising younger starting age, discontinuation age, and longer screening intervals, strategies employing annual screening for cervical cancer starting at a target age of 30 years and above were the most cost-effective, with an ICER of 21,012.98 dollars per QALY gained (with a Korean threshold of 30,000,000 KRW or US$27,272). Conclusions: We found that annual screening for cervical cancer beginning at a target age of 30 years and above is most cost-effective screening strategy. Considering the potential economic advantages, more intense screening policies for cervical cancer might be favorable among countries with high rates of cervical cancer and relatively low screening costs.

방패연을 이용한 저비용 비행시험장치 개발 (Development of Low Cost Flight Test Equipment by Using Bang-pai Kite)

  • 박종서;김봉균;이상철
    • 한국항공운항학회지
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    • 제25권3호
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    • pp.68-73
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    • 2017
  • In this study, we design a low-cost test equipment for real-time image observation and transmission/reception distance test using 1m by 1.5m bang-pai kite. The image observation is made by using two servo motors to enable the camera to control the two axis attitude. The image observation equipment is hung on the string of a kite and the test is performed to observe the real time image. The transmission and reception distance test of the wireless RF transceiver module is conducted on the ground and in the air.

열화가 Wiener process를 따르는 경우의 비용을 고려한 가속열화시험 계획 (Optimal Design of Accelerated Degradation Tests under the Constraint of Total Experimental Cost in the Case that the Degradation Characteristic Follows a Wiener Process)

  • 임헌상
    • 품질경영학회지
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    • 제40권2호
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    • pp.117-125
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    • 2012
  • For the highly reliable products, an accelerated degradation test (ADT) is a useful tool which has been employed in industry to obtain reliability-related information within an affordable amount of time and cost. In an ADT, as all other reliability tests, it is important to carefully design the ADT beforehand to obtain estimates of the quantities of interest as precisely as possible. In this paper, optimal ADTs are developed assuming that the constant-stress loading method is employed and the degradation characteristic follows a Wiener process. Under the constraint that the total cost does not exceed a pre-specified budget, the stress levels, the number of test units allocated to each stress level and the number of measurement (termination time) are determined such that the asymptotic variance of the maximum likelihood estimator of the q-th quantile of the lifetime distribution at the use condition is minimized.

양방향 고유압 말뚝재하시험을 이용한 대형건축물 기초의 공사비 절감에 관한 사례 연구 (A Case Study on Construction Cost Reduction of Large-size Building Foundation using Bi-directional High Pressure Pile Load Test(BDHPLT))

  • 김남일;김상일;최용규
    • 한국지반공학회:학술대회논문집
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    • 한국지반공학회 2009년도 춘계 학술발표회
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    • pp.518-525
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    • 2009
  • The bi-directional high pressure pile load test(BDH PLT) which is a kind of pile load tests was conducted to find out a reasonable design procedure of large-diameter drilled shafts of large-size building structures. The behaviors of bearing capacity and settlement of the large-diameter drilled shafts were analyzed and the results obtained from BDH PLT were also compared with those obtained from the equations suggested in the specification. In case of the reasonable design procedure adopted, the construction cost could be saved at least 15 ~ 28%. It could be concluded that BDH PLT should be needed for the foundation construction cost reduction of the high-rise building structures.

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Test Sequence Generation Using Multiple Unique State Signature(MUSS)

  • Jung, Yoon-Hee;Hong, Beom-Kee
    • Journal of Electrical Engineering and information Science
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    • 제2권6호
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    • pp.43-47
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    • 1997
  • A procedure presented in this paper generates test sequences to check the conformity of an implementation with a protocol specification, which is modeled as a deterministic finite state machine (FSM). Given a FSM, a common procedure of test sequence generation, first, constructs a directed graph which edges include the state check after each transition, and produces a symmetric graph G* from and, finally, finds a Euler tour of G*. We propose a technique to determine a minimum-cost tour of the transition graph of the FSM. The proposed technique using Multiple Unique State Signature (MUSS) solves an open issue that one MUIO sequence assignment may lead to two more edges of unit cost being replicated to from G* while an optimal assignment may lead to the replication of a single edge of high cost. In this paper, randomly generated FSMs have been studied as test cases. The result shows that the proposed technique saves the cost 4∼28% and 2∼21% over the previous approach using MUIO and MUSP, respectively.

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코스닥 IT기업의 개발비의 가치관련성 (Value Relevance of Development Cost in IT Firms of KOSDAQ)

  • 김문현
    • 한국IT서비스학회지
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    • 제8권3호
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    • pp.67-81
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    • 2009
  • This study aims to test the valur relevance of development cost particularly focusing on IT firms of KOSDAQ. Test period is from 2005 to 2007 and the samples are 2,271 year-firms including 1,692 firms that reported development cost in financial statements. The basic test model is a modified Ohlson(1995)'s linear model. The empirical results show that there is the negative relation between stock price and development cost reported as asset. It means that development costs reported as asset is considered as expense in the market. It implies that development activities of KOSDAQ IT firms is not related to market-leading technologies or goods. Otherwise it might reflect the conservative valuation of market on the unstability of KOSDAQ market itself.

A New Multi-site Test for System-on-Chip Using Multi-site Star Test Architecture

  • Han, Dongkwan;Lee, Yong;Kang, Sungho
    • ETRI Journal
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    • 제36권2호
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    • pp.293-300
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    • 2014
  • As the system-on-chip (SoC) design becomes more complex, the test costs are increasing. One of the main obstacles of a test cost reduction is the limited number of test channels of the ATE while the number of pins in the design increases. To overcome this problem, a new test architecture using a channel sharing compliant with IEEE Standard 1149.1 and 1500 is proposed. It can significantly reduce the pin count for testing a SoC design. The test input data is transmitted using a test access mechanism composed of only input pins. A single test data output pin is used to measure the sink values. The experimental results show that the proposed architecture not only increases the number of sites to be tested simultaneously, but also reduces the test time. In addition, the yield loss owing to the proven contact problems can be reduced. Using the new architecture, it is possible to achieve a large test time and cost reduction for complex SoC designs with negligible design and test overheads.