1 |
Arizono, I. Kawamura, Y., and Takemoto, Y.(2008), "Reliability Tests for Weibull Distribution with Variational Shape Parameter Based on Sudden Death Lifetime Data," European Journal of Operational Research, Vol. 189, 570-574.
DOI
ScienceOn
|
2 |
권영일(2011), "경제적인 무고장 신뢰성 인증시험 설계," 품질경영학회지, 39권, 71-77.
|
3 |
Abernethy, R. B.(2006), The New Weibull Handbook, 5th ed., Gulf Publishing Co., Houston(USA).
|
4 |
Bertsche, B.(2008), Reliability in Automotive and Mechanical Engineering, Springer-Verlag, Berlin(Germany).
|
5 |
Johnson, L. G.(1964), The Statistical Treatment of Fatigue Experiments, Elsevier Publishing Co., Amsterdam(Netherlands).
|
6 |
Jun C. H., Balamurali, S. and Lee, S. H.(2006), "Variables Sampling Plans for Weibull Distributed Lifetimes Under Sudden Death Testing," IEEE Transactions on Reliability, Vol. 55, 53-58.
DOI
ScienceOn
|
7 |
Kay, E.(1975), "On 'Sudden Death' Testing," International Journal of Production Research, Vol. 13, 359-266.
DOI
ScienceOn
|
8 |
Kececioglu, D.(2002), Reliability and Life Testing Handbook, Vol. 2, DEStech Publications Inc., Lancaster(USA).
|
9 |
Maplesoft(2011), MapleTM 15, Maplesoft, Waterloo(Canada).
|
10 |
McCool, J. I., (2009), "Design of Sudden Death Tests for Estimation of a Weibull Percentile," Journal of Testing and Evaluation, Vol. 37, 311-315.
|
11 |
Motyka, R.(2007), "Sudden Death Testing versus Traditional Censored Life Testing: A Monte-Carlo Study," Control and Cybernetics, Vol. 36, 241-250,
|
12 |
Murray, L. P., Rathbun, L. C. and Wolf, E. D.(1988), "New Technique and Analysis of Accelerated Electromigration Life Testing in Multilevel Metallizations," Applied Physics Letters, Vol. 53, 1414-1416.
DOI
|
13 |
Pascual G. and Meeker, W. Q.(1998), "The Modified Sudden Death Test: Planning Life Tests with a Limited Number of Test Positions," Journal of Testing and Evaluation, Vol. 26, 187-190.
DOI
ScienceOn
|
14 |
Suzuki, K., Ohtsuka, K., and Ashutate, M.(1992), "On a Comparison Between Sudden Death Life Testing and Type II Number Fixed Life Testing-The Precision and the Testing Times Using the Maximum Likelihood Estimators(Japanese)," Journal of the Japnese Society for Quality Control, Vol. 22, 5-12.
|
15 |
Wu, J. W., Tsai, T. R. and Ouyang, L. Y.(2001), "Limited Failure-Censored Life Test for the Weibull Distribution," IEEE Transactions on Reliability, Vol. 50, 107-111.
DOI
|