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A Note on Sudden Death Tests  

Seo, Sun-Keun (Dept. of Industrial & Management Systems Engineering, Dong-A University)
Publication Information
Journal of Applied Reliability / v.12, no.3, 2012 , pp. 139-152 More about this Journal
Abstract
Successive and simultaneous sudden death tests are compared with the complete and Type II censored samples in terms of expected test duration and Total Time on Test(TTT) subject to the same number of failures in order to maintain the equal statistical precision under Weibull lifetime distribution with known shape parameter. Also, two sudden death tests under a proposed cost model are discussed and a numerical example is provided to illustrate the use of the proposed cost model.
Keywords
cost model; expected test duration; sudden death tests; Total Time on Test(TTT); Weibull distribution;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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1 Arizono, I. Kawamura, Y., and Takemoto, Y.(2008), "Reliability Tests for Weibull Distribution with Variational Shape Parameter Based on Sudden Death Lifetime Data," European Journal of Operational Research, Vol. 189, 570-574.   DOI   ScienceOn
2 권영일(2011), "경제적인 무고장 신뢰성 인증시험 설계," 품질경영학회지, 39권, 71-77.
3 Abernethy, R. B.(2006), The New Weibull Handbook, 5th ed., Gulf Publishing Co., Houston(USA).
4 Bertsche, B.(2008), Reliability in Automotive and Mechanical Engineering, Springer-Verlag, Berlin(Germany).
5 Johnson, L. G.(1964), The Statistical Treatment of Fatigue Experiments, Elsevier Publishing Co., Amsterdam(Netherlands).
6 Jun C. H., Balamurali, S. and Lee, S. H.(2006), "Variables Sampling Plans for Weibull Distributed Lifetimes Under Sudden Death Testing," IEEE Transactions on Reliability, Vol. 55, 53-58.   DOI   ScienceOn
7 Kay, E.(1975), "On 'Sudden Death' Testing," International Journal of Production Research, Vol. 13, 359-266.   DOI   ScienceOn
8 Kececioglu, D.(2002), Reliability and Life Testing Handbook, Vol. 2, DEStech Publications Inc., Lancaster(USA).
9 Maplesoft(2011), MapleTM 15, Maplesoft, Waterloo(Canada).
10 McCool, J. I., (2009), "Design of Sudden Death Tests for Estimation of a Weibull Percentile," Journal of Testing and Evaluation, Vol. 37, 311-315.
11 Motyka, R.(2007), "Sudden Death Testing versus Traditional Censored Life Testing: A Monte-Carlo Study," Control and Cybernetics, Vol. 36, 241-250,
12 Murray, L. P., Rathbun, L. C. and Wolf, E. D.(1988), "New Technique and Analysis of Accelerated Electromigration Life Testing in Multilevel Metallizations," Applied Physics Letters, Vol. 53, 1414-1416.   DOI
13 Pascual G. and Meeker, W. Q.(1998), "The Modified Sudden Death Test: Planning Life Tests with a Limited Number of Test Positions," Journal of Testing and Evaluation, Vol. 26, 187-190.   DOI   ScienceOn
14 Suzuki, K., Ohtsuka, K., and Ashutate, M.(1992), "On a Comparison Between Sudden Death Life Testing and Type II Number Fixed Life Testing-The Precision and the Testing Times Using the Maximum Likelihood Estimators(Japanese)," Journal of the Japnese Society for Quality Control, Vol. 22, 5-12.
15 Wu, J. W., Tsai, T. R. and Ouyang, L. Y.(2001), "Limited Failure-Censored Life Test for the Weibull Distribution," IEEE Transactions on Reliability, Vol. 50, 107-111.   DOI