• The Transactions of the Korea Information Processing Society
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• v.1 no.2
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• pp.272-278
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• 1994

The paper proposes a test pattern generator and a signature analyzer for pseudoexhaustive testing of the combinational circuit part within a sequential circuit when performing built-in self test of the circuit. The test pattern generator can scan in the seed test pattern and generate exhaustive test patterns. The signature analyzer can perform the analysis of the circuit response and scan out the result. Such test pattern generator and signature analyzer have been developed using SRL(shift register latch) and LFSR(linear feedback shift register).

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2006.06a
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• pp.501-502
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• 2006

In this paper, new and aging sample of MCCB and ELCB are investigated the main performance test such as short circuit test, mechanical and electrical endurance test, dielectric test and surge current test. The surface conditions of new and aging sample are analyzed by SEM, TGA and DSC. The ELCB occurred badness mainly in short circuit test and surge current test. The badness cause of short circuit test was confirmed due to imperfect contact of contact part.

• 한국정보디스플레이학회:학술대회논문집
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• 2008.10a
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• pp.914-917
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• 2008

A quad-functional built-in test circuit has been developed for DRAM-frame-memory embedded SOG-LCDs. The quad function consists of memory test, display test, serial transfer test, and parallel transfer test which is the normal operation mode for our SOG-LCD. Results of memory and display tests are shown.

• Proceedings of the KIEE Conference
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• 2005.07a
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• pp.569-571
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• 2005

In case of dead-tank circuit breaker with the earthed enclosure, the dielectric performance for phase to ground should be verified under the hot-gas condition produced by the current interruption. This test condition is required in breaking test duties with the rated short-circuit current and rated voltage. And, KERI has completed the reinforcement of the synthetic testing facilities and these facilities have the testing capacity which enables the full-pole testing for 800kV circuit breaker by adopting the series voltage injection method. So, this paper introduced the test circuit and procedures about the full-pole and the multi-part testing method which was devised to estimate the full -insulation of phase-to-ground for the multi-pole and dead-tank circuit breaker.

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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• v.25 no.7
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• pp.105-113
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• 2011

The study about three-phase synthetic making test using DC power has been performed in order to increase the making test capacity on Vacuum Circuit Breaker. And, it made possible to solve the limitations that short-circuit testing facilities can not fulfill the testing requirements of VCB exceeding three-phase 36[kV] 31.5[kA]. By using DC power and high speed spark-gap switch, this method made the equivalence with the pre-arc that occurred during the making process under the fault condition of power system. As results, KERI(Korea Electrotechnology Research Institute) could have capacity to carry out type test for VCB under three-phase 52[kV] 40[kV], which satisfies the IEC Standard.

• Proceedings of the KSR Conference
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• 2007.05a
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• pp.1701-1706
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• 2007

Jointless AF(Audio Frequency) Track Circuit is more comfortable than exist joint track circuit. This electrical circuit's function is detection train on rail, and transmit information between wayside and vehicle. 'Korea Railroad Corporation' proposed for revision of the Korean railway standards(KRS SG 0038-06 R, 2006.5.16) "Non-insulated AF Track Circuit". This proposal equipment developed to extend use for station of National Railway exist line. According to test standards Korean railway safety law and its ordinances, which were committed to Korea Railroad Research Institute, the professional committee 'Railway facility sector II' have helded on January in 2007. In this investigation, the changed test norm will be review the difference of important function test standards of new version to conform effectivity and safety test procedure according to the KS A 1025.

• Journal of Electrical Engineering and Technology
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• v.9 no.4
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• pp.1332-1342
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• 2014

This paper proposes a novel test circuit for SiC transistors. On-state resistance under practical application conditions is an important characteristic for the device reliability and conduction efficiency of SiC transistors. In order to measure the on-state resistance in practical applications, high voltage is needed, and high current is also necessary to ignite performance for the devices. A soft-switching circuit based on synchronous buck topology is developed in this paper. To provide high-voltage and high-current stresses for the devices without additional spikes and oscillations, a resonant circuit has been introduced. Using the novel circuit technology, soft-switching can be successfully realized for all the switches. Furthermore, in order to achieve accurate measurement of on-state resistance under switching operations, an active clamp circuit is employed. Operation principle and design analysis of the circuit are discussed. The dynamic measurement method is illustrated in detail. Simulation and experiments were carried out to verify the feasibility of the circuit. A special test circuit has been developed and built. Experimental results confirm that the proposed circuit gives a good insight of the devices performance in real applications.

• Proceedings of the KIEE Conference
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• 2008.07a
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• pp.866-867
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• 2008

Among many tests to verify the characteristics of power system apparatus, the short circuit test is performed to verify the performance characteristics of the apparatus under the short-circuited power system. The verification of the short-circuit performance is inevitable for the reliability of power system and the safety of the operator around. The short circuit performance test requires the suitable power source and Korea Electrotechnology Research Institute has 4000 MVA, 500 MVA short circuit generators for the short circuit performance test. This paper will study on the parameters of short-circuit generator and the estimation of them.

• Proceedings of the KIEE Conference
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• 2000.07c
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• pp.1856-1858
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• 2000

This paper describes the principles of reignition system which has newly been developed and used as KERI's high power testing facilities. Synthetic short-circuit testing method is generally adopted to perform the short-circuit test of the ultra high-voltage circuit breakers, which consists of two separated sources such as the current source from short-circuit generator and the voltage source from charged energy in capacitor. And, in case of synthetic short-circuit test, it will be necessary to use the reignition system in order to extending the arcing time of the circuit breaker and provide the arc energy equivalent to the direct testing method.

• ETRI Journal
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• v.28 no.3
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• pp.355-363
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• 2006

This paper presents a low-cost RF parameter estimation technique using a new RF built-in self-test (BIST) circuit and efficient DC measurement for 4.5 to 5.5 GHz low noise amplifiers (LNAs). The BIST circuit measures gain, noise figure, input impedance, and input return loss for an LNA. The BIST circuit is designed using $0.18\;{\mu}m$ SiGe technology. The test technique utilizes input impedance matching and output DC voltage measurements. The technique is simple and inexpensive.