ETRI Journal

Electronics and Telecommunications Research Institute (한국전자통신연구원)
권호 표지

A New Approach for Built-in Self-Test of 4.5 to 5.5 GHz Low-Noise Amplifiers

  • Ryu, Jee-Youl (Department of Electronic Engineering, Arizona State University) ;
  • Noh, Seok-Ho (Department of Electronic & Information Engineering, Andong National University)
  • Received : 2004.08.31
  • Published : 2006.06.30
Download PDF
⟨ Previous Next ⟩

Abstract

This paper presents a low-cost RF parameter estimation technique using a new RF built-in self-test (BIST) circuit and efficient DC measurement for 4.5 to 5.5 GHz low noise amplifiers (LNAs). The BIST circuit measures gain, noise figure, input impedance, and input return loss for an LNA. The BIST circuit is designed using $0.18\;{\mu}m$ SiGe technology. The test technique utilizes input impedance matching and output DC voltage measurements. The technique is simple and inexpensive.

Keywords