• Applied Microscopy
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• v.45 no.4
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• pp.199-202
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• 2015

A simple and novel transmission electron microscopy (TEM) sample preparation method for phase change nanowire is investigated. A $Ge_2Sb_2Te_5$ (GST) nanowire TEM sample was meticulously prepared using nanomanipulator and gas injection system in a field emission scanning electron microscopy for efficient and accurate TEM analysis. The process can minimize the damage during the TEM sample preparation of the nanowires, thus enabling the crystallographic analysis of as-grown GST nanowires without unexpected phase transition caused by e-beam heating.

• Applied Microscopy
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• v.42 no.3
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• pp.147-150
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• 2012

A recently introduced helium ion microscopy (HIM) was employed to observe uncoated pine leaf specimens. Adult leaves were collected from the seedlings of Pinus densiflora and P. rigida, air-dried at room temperature, and observed by HIM without metal coating. Ovoid or round stomata and distinct Florin rings could be discerned. The epicuticular waxes were present in the epistomatal chambers and Florin rings of stomata on the leaf surface. The epicuticular waxes were mostly straight, cylindrical, and ca. 1 ${\mu}m$ in length. The epistomatal chambers of P. rigida were filled with the epicuticular waxes, whereas those of P. densiflora were not filled with the epicuticular waxes. Based on their micromorphology, the epicuticular wax structures of the pine species were identified as tubules. These results suggest that the HIM could be used for the investigation of the plant stomata and epicuticular waxes of uncoated plant leaves. Due to the smaller ion probe and interaction volume, the HIM has advantages over conventional field emission scanning electron microscopy in terms of image resolution and charge neutralization.

• Applied Microscopy
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• v.44 no.2
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• pp.61-67
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• 2014

Layered structures of fiber cell wall of Korean red pine (Pinus densiflora) were investigated by confocal reflection microscopy (CRM). CRM micrographs revealed detailed structures of the fiber cell wall such as S1, S2, and S3 layers as well as transition layers (S12 and S23 layers), which are present between the S1, S2, and S3 layers. Microfibril angle (MFA) measurement was possible for the S2 and S3 layer in the cell wall. The experimental results suggest that CRM is a versatile microscopic method for investigation of layered structures and MFA measurement in individual sub layer of the tracheid cell wall.

• Applied Microscopy
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• v.45 no.2
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• pp.89-94
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• 2015

This article briefly reviews the results of recently reported research on high-temperature Pb-free solder alloys and the research trend for characterization of the interfacial reaction layer. To improve the product reliability of high-temperature Pb-free solder alloys, thorough research is necessary not only to enhance the alloy properties but also to characterize and understand the interfacial reaction occurring during and after the bonding process. Transmission electron microscopy analysis is expected to play an important role in the development of high-temperature solders by providing accurate and reliable data with a high spatial resolution and facilitating understanding of the interfacial reaction at the solder joint.

• Transactions on Electrical and Electronic Materials
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• v.7 no.3
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• pp.118-122
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• 2006

Diamond-like carbon (DLC) films were prepared on silicon substrates by the RF PECVD (Plasma Enhanced Chemical Vapor Deposition) method using methane $(CH_4)$ and hydrogen $(H_2)$ gas. We examined the effects of the post annealing temperature on the tribological properties of the DLC films using friction force microscopy (FFM). The films were annealed at various temperatures ranging from 300 to $900^{\circ}C$ in steps of $200^{\circ}C$ using RTA equipment in nitrogen ambient. The thickness of the film was observed by scanning electron microscopy (SEM) and surface profile analysis. The surface morphology and surface energy of the films were examined using atomic force microscopy and contact angle measurement, respectively. The hardness of the DLC film was measured as a function of the post annealing temperature using a nano-indenter. The tribological characteristics were investigated by atomic force microscopy in FFM mode.

• Applied Microscopy
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• v.50
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• pp.24.1-24.11
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• 2020

The development of the femtosecond laser (fs laser) with its ability to provide extremely rapid athermal ablation of materials has initiated a renaissance in materials science. Sample milling rates for the fs laser are orders of magnitude greater than that of traditional focused ion beam (FIB) sources currently used. In combination with minimal surface post-processing requirements, this technology is proving to be a game changer for materials research. The development of a femtosecond laser attached to a focused ion beam scanning electron microscope (LaserFIB) enables numerous new capabilities, including access to deeply buried structures as well as the production of extremely large trenches, cross sections, pillars and TEM H-bars, all while preserving microstructure and avoiding or reducing FIB polishing. Several high impact applications are now possible due to this technology in the fields of crystallography, electronics, mechanical engineering, battery research and materials sample preparation. This review article summarizes the current opportunities for this new technology focusing on the materials science megatrends of engineering materials, energy materials and electronics.

• Applied Microscopy
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• v.25 no.4
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• pp.71-82
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• 1995

The ultrastructure and storage reserves of the Capsicum annuum seeds were studied in order to identify structure and to localize storage components in the endosperm using light microscopy, scanning and transmission electron microscopy. The seed coat was composed of one cell layer which contained a large number of lipid bodies, while most of the endosperm cells did not showed many lipid bodies. During seed maturation, the endosperm cells were continuously degenerated by the autophagy. Various types of plastids were also distinguished in the endosperm cells. They contained starch grains surrounded by electron-dense tiny particles, plastoglobuli, and vasicular bodies.

• Applied Microscopy
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• v.50
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• pp.28.1-28.6
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• 2020

Contamination on two-dimensional (2D) crystal surfaces poses serious limitations on fundamental studies and applications of 2D crystals. Surface residues induce uncontrolled doping and charge carrier scattering in 2D crystals, and trapped residues in mechanically assembled 2D vertical heterostructures often hinder coupling between stacked layers. Developing a process that can reduce the surface residues on 2D crystals is important. In this study, we explored the use of atomic force microscopy (AFM) to remove surface residues from 2D crystals. Using various transmission electron microscopy (TEM) investigations, we confirmed that surface residues on graphene samples can be effectively removed via contact-mode AFM scanning. The mechanical cleaning process dramatically increases the residue-free areas, where high-resolution imaging of graphene layers can be obtained. We believe that our mechanical cleaning process can be utilized to prepare high-quality 2D crystal samples with minimum surface residues.

• Journal of the Microelectronics and Packaging Society
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• v.31 no.2
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• pp.54-62
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• 2024

SICM (Scanning Ion Conductivity Microscopy) is a technique for measuring surface topography in an environment where electrochemical reactions occur, by detecting changes in ion conductivity as a nanopipette tip approaches the sample. This study includes an investigation of the current response curve, known as the approach curve, according to the distance between the tip and the sample. First, a simulation analysis was conducted on the approach curves. Based on the simulation results, then, several measuring experiments were conducted concurrently to analyze the difference between the simulated and measured approach curves. The simulation analysis confirms that the current squeezing effect occurs as the distance between the tip and the sample approaches half the inner radius of the tip. However, through the calculations, the decrease in current density due to the simple reduction in ion channels was found to be much smaller compared to the current squeezing effect measured through actual experiments. This suggests that ion conductivity in nano-scale narrow channels does not simply follow the Nernst-Einstein relationship based on the diffusion coefficients, but also takes into account the fluidic hydrodynamic resistance at the interface created by the tip and the sample. It is expected that SICM can be combined with SECM (Scanning Electrochemical Microscopy) to overcome the limitations of SECM through consecutive measurement of the two techniques, thereby to strengthen the analysis of electrochemical surface reactivity. This could potentially provide groundbreaking help in understanding the local catalytic reactions in electroless plating and the behaviors of organic additives in electroplating for various kinds of patterns used in semiconductor damascene processes and packaging processes.

• The Transactions of the Korean Institute of Electrical Engineers C
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• v.48 no.7
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• pp.508-513
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• 1999

The response properties of quartz crystal coated with stearic acid LB films to organic gases were investigated by measuring the shift of resonant frequency. Stearic acid was used as a sensing material and deposited on the surface of quartz crystal using the Langmuir-Blodgett(LB) method. The effect of temperature on the quartz crystal coated with stearic acid LB films was also investigated by Scanning Maxwell-stress Microscopy(SMM). As a result, the sensitivity of the quartz crystal coated with LB films to organic gases is dependent on temperature, thickness of LB film and molecular weight of organic gas.