The LaserFIB: new application opportunities combining a high-performance FIB-SEM with femtosecond laser processing in an integrated second chamber |
Ben Tordoff
(ZEISS Research Microscopy Solutions)
Cheryl Hartfield (ZEISS Process Control Solutions) Andrew J. Holwell (ZEISS Research Microscopy Solutions) Stephan Hiller (ZEISS Research Microscopy Solutions) Marcus Kaestner (ZEISS Process Control Solutions) Stephen Kelly (Carl Zeiss X-ray Microscopy) Jaehan Lee (ZEISS Research Microscopy Solutions) Sascha Muller (ZEISS Process Control Solutions) Fabian Perez-Willard (ZEISS Research Microscopy Solutions) Tobias Volkenandt (ZEISS Research Microscopy Solutions) Robin White (Carl Zeiss X-ray Microscopy) Thomas Rodgers (ZEISS Research Microscopy Solutions) |
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