• 한국정보디스플레이학회:학술대회논문집
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• 2003.07a
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• pp.726-729
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• 2003

A new driving method is proposed to reduce the address period. The scan time of new driving method overlaps with the next scan time during the discharge lag time. Thus, without reducing the address pulse width and the scan pulse width, the new addressing method can reduce the address period. The results show that the scan time of about 100ns ${\sim}$ 300ns can be overlapped without the misfiring,.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.46 no.5
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• pp.1-8
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• 2009

Since scan based testing is very efficient and widely used for testing large sequential circuits. However, since test patterns are serially injected through long scan chains, scan based testing requires very long test application time. Also, compared to the normal operations, scan shifting operations drastically increase power consumption. In order to solve these problems, this paper presents a new scan architecture for both test application time and test power reduction. The proposed scan architecture partitions scan chains into several segments and bypasses some segments which do not include any specified bit. Since bypassed segments are excluded from the scan shifting operation, the test application time and test power can be significantly reduced.

• Proceedings of the Korean Information Science Society Conference
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• 2004.10b
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• pp.34-36
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• 2004

실시간 스케줄링에서 시간당 처리량을 놓이기 위해서 EDF에 SCAN기법을 추가하는 많은 방법이 연구되었다. 하지만 기존 기법들은 SCAN그룹을 생성할 때, 연속된 태스크들만 SCAN그룹의 포함 대상으로 고려하기 때문에 많은 제한이 따른다. 또한 SCAN기법은 처리방향이 고정되었기 때문에 시간적 손실이 많은 단점을 가진다. 본 연구에서는 연속되지 않은 태스크들을 SCAN그룹의 포함 대상으로 고려할 수 있는 태스크 삽입기법과, 기존의 SCAN그룹에서 합병하지 못하는 SCAN그룹들을 합병할 수 있는 SCAN합병기법, 마지막으로 SCAN그룹을 처리하는데 시간적 이점을 얻을 수 있는 양 방향 SCAN기법을 제시한다.

• JSTS:Journal of Semiconductor Technology and Science
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• v.14 no.3
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• pp.345-355
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• 2014

Today's System-on-a-Chip (SoC) is designed with reusable IP cores to meet short time-to-market requirements. However, the increasing cost of testing becomes a big burden in manufacturing a highly integrated SoC. In this paper, an efficient parallel scan test technique is introduced to minimize the test application time. Multiple scan enable signals are adopted to implement scan architecture to achieve optimal test application time for the test patterns scheduled for concurrent scan test. Experimental results show that testing times are considerably reduced with little area overhead.

• The Journal of Advanced Prosthodontics
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• v.14 no.5
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• pp.294-304
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• 2022

PURPOSE. The purpose of this study was to evaluate the influence of different palatal vault configurations on the accuracy and scan speed of intraoral scans (IO) of completely edentulous arches. MATERIALS AND METHODS. Three different virtual models of a completely edentulous maxillary arch with different palatal vault heights- Cl I moderate (U-shaped), Cl II deep (steep) and Cl III shallow (flat)-were digitally designed using CAD software (Meshmixer; Autodesk, USA) and 3D-printed using SLA-based 3D-printer (XFAB; DWS, Italy) (n = 30; 10 specimens per group). Each model was scanned using intraoral scanner (Trios 3; 3Shape^TM, Denmark). Scanning time was recorded for all samples. Scanning accuracy (trueness and precision) were evaluated using digital subtraction technique using Geomagic Control X v2020 (Geomagic; 3DSystems, USA). One-way analysis of variance (ANOVA) test was used to detect differences in scanning time, trueness and precision among the test groups. Statistical significance was set at α = .05. RESULTS. The scan process could not be completed for Class II group and manufacturer's recommended technique had to be modified. ANOVA revealed no statistically significant difference in trueness and precision values among the test groups (P=.959 and P=.658, respectively). Deep palatal vault (Cl II) showed significantly longer scan time compared to Cl I and III. CONCLUSION. The selection of scan protocol in complex cases such as deep palatal vault is of utmost importance. The modified, adopted longer path scan protocol of deep vault cases resulted in increased scan time when compared to the other two groups.

• Radiation Oncology Journal
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• v.22 no.1
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• pp.55-63
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• 2004

Purpose : To evaluate the reflection of tumor motion according to the planning CT scan time. Material and Methods : A model of N-shape, which moved aiong the longitudinal axis during the ventilation caused by a mechanical ventilator, was produced. The model was scanned by planning CT, while setting the relative CT scan time (T: CT scan time/ventilatory period) to 0.33, 0.50, 0.67, 0.75, 1.00, 1.337, and 1.537. In addition, three patients with non-small cell lung cancer who received stereotactic radiosurgery In the Department of Radiation Oncology, Asan Medical Center from 03/19/2002 to 05/21/2002 were scanned. Slow (10 Premier, Picker, scan time 2.0 seconds per slice) and fast CT scans (Lightspeed, GE Medical Systems, with a scan time of 0.8 second per slice) were peformed for each patient. The magnitude of reflected movement of the N-shaped model was evaluated by measuring the transverse length, which reflected the movement of the declined bar of the model at each slice. For patients' scans, all CT data sets were registered using a stereotactic body frame scale with the gross tumor volumes delineated in one CT image set. The volume and three-dimensional diameter of the gross tumor volume were measured and analyzed between the slow and fast CT scans. Results : The reflection degree of longitudinal movement of the model increased in proportion to the relative CT scan times below 1.00 7, but remained constant above 1.00 T Assuming the mean value of scanned transverse lengths with CT scan time 1.00 T to be $100\%$, CT scans with scan times of 0.33, 0.50, 0.57, and 0.75 T missed the tumor motion by 30, 27, 20, and $7.0\%$ respectively, Slow (scan time 2.0 sec) and Fast (scan time 0.8 sec) CT scans of three patients with longitudinal movement of 3, 5, and 10 mm measured by fluoroscopy revealed the increases in the diameter along the longitudinal axis Increased by 6.3, 17, and $23\%$ in the slow CT scans. Conculsion : As the relative CT scan time increased, the reflection of the respiratory tumor movement on planning CT also Increased, but remained constant with relative CT scan times above 1.00 T When setting the planning CT scan time above one respiration period (>1.00 T), only the set-up margin is needed to delineate the planning target volume. Therefore, therapeutic ratio can be increased by reducing the radiation dose delivered to normal lung tissue.

• Journal of the Korean Society for Precision Engineering
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• v.19 no.10
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• pp.147-155
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• 2002

In the stereolithography process, the accuracy of product depends on laser power, scan speed, scan width, scan pattern, layer thickness, resin characteristics and so on. Therefore, appropriate process parameters are required for an accurate prototype. This paper presents a method to determine the key process parameters, i.e., laser scan speed, hatching space, and layer thickness based on scan length, scan area, and layer slope. In order to determine these parameters, three neural networks are employed to represent operator’s experience and knowledge. Optimum values on scan speed, hatching space and layer thickness are recommended to improve the surface roughness and build time on the developed SLA machine.

• The Korean Journal of Nuclear Medicine Technology
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• v.12 no.3
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• pp.192-198
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• 2008

Purpose: The scan time reduction helps to yield more accurate results and induce the minimization of patient's motion. Also we can expect that satisfaction of examination will increase. Nowdays medical equipment companies have developed various programs to reduce scan time. We used Onco. Flash (Pixon method, SIEMENS) that is an image processing technique gated cardiac blood pool scan and going to evaluate its clinical usefullness. Materials and Method: We analyzed the 50 patients who were examined by gated blood pool scan in nuclear medicine department of Asan Mediacal Center from June $20^{th}$ 2008 to August $14^{th}$ 2008. We acquired the Full-time (6000 Kcounts) and Half-time (3000 Kcounts) LAO image in same position. And we acquired LVEF values ten times from Full-time, Half-time images acquired by the image processing technique and analyzed its mean and standard deviation values. To estimate LVEF in same conditions, we set automatic location of the LV ROI and background ROI based on same X and Y-axis. Also we performed blinding tests to physician. Results: After making a quantitative analysis of the 50 patients EF values, each mean${\pm}$standard deviation is shown at Full-time image $68.12{\pm}7.84%$, Half- time (acquired by imaging processing technique) $68.49{\pm}8.73%$. In the 95% confidence limit, there was no statistically significant difference (p>0.05). After blinding test with a physician for making a qualitative analysis, there was no difference between Full-time image and Half-time image acquired by the image processing technique for observing LV myocardial wall motion. Conclusion: Gated cardiac blood pool scan has been reported its relatively exact EF measured results than ultrasound or CT. But gated cardiac blood pool scan takes relatively longer time than other exams and now it needs to improve time competitive power. If we adapt Half-time technique to gated cardiac blood pool scintigraphy based on this study, we expect to reduce possible artifacts and improve accessibility as well as flexibility to exam. Also we expect patient's satisfaction.

• Journal of KIISE:Computer Systems and Theory
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• v.26 no.9
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• pp.1177-1184
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• 1999

본 논문에서는 스캔플립프롭 선택 시간이 짧고 높은 고장 검출률(fault coverage)을 얻을 수 있는 새로운 부분스캔 설계 기술을 제안한다. 순차회로에서 테스트패턴 생성을 용이하게 하기 위하여 완전스캔 및 부분스캔 설계 기술이 널리 이용되고 있다. 스캔 설계로 인한 추가영역을 최소화 하고 최대의 고장 검출률을 목표로 하는 부분스캔 기술은 크게 구조분석과 테스트 가능도(testability)에 의한 설계 기술로 나누어 볼 수 있다. 구조분석에 의한 부분스캔은 짧은 시간에 스캔플립프롭을 선택할 수 있지만 고장 검출률은 낮다. 반면 테스트 가능도에 의한 부분스캔은 구조분석에 의한 부분스캔보다 스캔플립프롭의 선택 시간이 많이 걸리는 단점이 있지만 높은 고장 검출률을 나타낸다. 본 논문에서는 구조분석에 의한 부분스캔과 테스트 가능도에 의한 부분스캔 설계 기술의 장단점을 비교.분석하여 통합함으로써 스캔플립프롭 선택 시간을 단축하고 고장 검출률을 높일 수 있는 새로운 부분스캔 설계 기술을 제안한다. 실험결과 대부분의 ISCAS89 벤치마크 회로에서 스캔플립프롭 선택 시간은 현격히 감소하였고 비교적 높은 고장 검출률을 나타내었다.Abstract This paper provides a new partial scan design technique which not only reduces the time for selecting scan flip-flops but also improves fault coverage. To simplify the problem of the test pattern generation in the sequential circuits, full scan and partial scan design techniques have been widely adopted. The partial scan techniques which aim at minimizing the area overhead while maximizing the fault coverage, can be classified into the techniques based on structural analysis and testabilities. In case of the partial scan by structural analysis, it does not take much time to select scan flip-flops, but fault coverage is low. On the other hand, although the partial scan by testabilities generally results in high fault coverage, it requires more time to select scan flip-flops than the former method. In this paper, we analyzed and unified the strengths of the techniques by structural analysis and by testabilities. The new partial scan design technique not only reduces the time for selecting scan flip-flops but also improves fault coverage. Test results demonstrate the remarkable reduction of the time to select the scan flip-flops and high fault coverage in most ISCAS89 benchmark circuits.

• Journal of the Korea Society of Computer and Information
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• v.3 no.2
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• pp.105-112
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• 1998

In this paper, we propose a ESP(Extended Scan Path) architecture for multi-board testing. The conventional architectures for board testing are single scan path and multi-scan path. In the single scan path architecture, the scan path for test data is just one chain. If the scan path is faulty due to short or open, the test data is not valid. In the multi-scan path architecture, there are additional signals in multi-board testing. So conventional architectures are not adopted to multi-board testing. In the case of the ESP architecture, even though scan path is either short or open, it doesn't affect remaining other scan paths. As a result of executing parallel BIST and IEEE 1149.1 boundary scan test by using the proposed ESP architecture, we observed that the test time is short compared with the single scan path architecture. By comparing the ESP architecture with single scan path responding to independency of scan path, test time and with multi-scan path responding to signal, synchronization, we showed that the architecture has improved results.