JSTS:Journal of Semiconductor Technology and Science

The Institute of Electronics and Information Engineers (대한전자공학회)
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Efficient Parallel Scan Test Technique for Cores on AMBA-based SoC

  • Song, Jaehoon (Dept. of Computer Science & Engineering, Hanyang University ERICA Campus) ;
  • Jung, Jihun (Dept. of Computer Science & Engineering, Hanyang University ERICA Campus) ;
  • Kim, Dooyoung (Dept. of Computer Science & Engineering, Hanyang University ERICA Campus) ;
  • Park, Sungju (Dept. of Computer Science & Engineering, Hanyang University ERICA Campus)
  • Received : 2014.02.13
  • Accepted : 2014.04.17
  • Published : 2014.06.30
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Abstract

Today's System-on-a-Chip (SoC) is designed with reusable IP cores to meet short time-to-market requirements. However, the increasing cost of testing becomes a big burden in manufacturing a highly integrated SoC. In this paper, an efficient parallel scan test technique is introduced to minimize the test application time. Multiple scan enable signals are adopted to implement scan architecture to achieve optimal test application time for the test patterns scheduled for concurrent scan test. Experimental results show that testing times are considerably reduced with little area overhead.

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References

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