• JSTS:Journal of Semiconductor Technology and Science
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• v.9 no.1
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• pp.37-50
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• 2009

Evaluation results about area scaling capabilities of various SRAM margin-assist techniques for random $V_T$ variability issues are described. Various efforts to address these issues by not only the cell topology changes from 6T to 8T and 10T but also incorporating multiple voltage-supply for the cell terminal biasing and timing sequence controls of read and write are comprehensively compared in light of an impact on the required area overhead for each design solution given by ever increasing $V_T$ variation (${\sigma}_{VT}$). Two different scenarios which hinge upon the EOT (Effective Oxide Thickness) scaling trend of being pessimistic and optimistic, are assumed to compare the area scaling trends among various SRAM solutions for 32 nm process node and beyond. As a result, it has been shown that 6T SRAM will be allowed long reign even in 15 nm node if ${\sigma}_{VT}$ can be suppressed to < 70 mV thanks to EOT scaling for LSTP (Low Standby Power) process.

• Earthquakes and Structures
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• v.5 no.2
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• pp.129-142
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• 2013

Linear and nonlinear time history analyses have been becoming more common in seismic analysis and design of structures with advances in computer technology and earthquake engineering. One of the most important issues for such analyses is the selection of appropriate acceleration time histories and matching these histories to a code design acceleration spectrum. In literature, there are three sources of acceleration time histories: artificial records, synthetic records obtained from seismological models and accelerograms recorded in real earthquakes. Because of the increase of the number of strong ground motion database, using and scaling real earthquake records for seismic analysis has been becoming one of the most popular research issues in earthquake engineering. In general, two methods are used for scaling actual earthquake records: scaling in time domain and frequency domain. The objective of this study is twofold: the first is to discuss and summarize basic methodologies and criteria for selecting and scaling ground motion time histories. The second is to analyze scaling results of time domain method according to ASCE 7-05 and Eurocode 8 (1998-1:2004) criteria. Differences between time domain method and frequency domain method are mentioned briefly. The time domain scaling procedure is utilized to scale the available real records obtained from near fault motions and far fault motions to match the proposed elastic design acceleration spectrum given in the Eurocode 8. Why the time domain method is preferred in this study is stated. The best fitted ground motion time histories are selected and these histories are analyzed according to Eurocode 8 (1998-1:2004) and ASCE 7-05 criteria. Also, characteristics of both near fault ground motions and far fault ground motions are presented by the help of figures. Hence, we can compare the effects of near fault ground motions on structures with far fault ground motions' effects.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2002.05a
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• pp.275-278
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• 2002

As the gate lengths of MOSFETs are scaled down to sub-50nm regime, there are key issues to be considered in the device design. In this paper, we have investigated the characteristics of threshold voltage for MOSFET device. We have simulated the MOSFETs with gate lengths from 100nm to 30nm using generalized scaling. Then, we have known the device scaling limits for nano structure MOSFET. We have determined the threshold voltages using LE(Linear Extraction) method.

• KSII Transactions on Internet and Information Systems (TIIS)
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• v.13 no.2
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• pp.790-809
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• 2019

The design of an efficient scaler to enhance the edge data is one of the most important issues in video signal applications, because the perceptual quality of the processed image is sensitively affected by the degradation of edge data. Various conventional scaling schemes have been proposed to enhance the edge data. In this paper, we propose an efficient scaling algorithm for this purpose. The proposed method is based on the discrete cosine transform-based interpolation filter (DCT-IF) because it outperforms other scaling algorithms in various configurations. The proposed DCT-IF incorporates weighting parameters that are optimized for training data. Simulation results show that the quality of the resized image produced by the proposed DCT-IF is much higher than that of those produced by the conventional schemes, although the proposed DCT-IF is more complex than other conventional scaling algorithms.

• JSTS:Journal of Semiconductor Technology and Science
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• v.4 no.1
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• pp.1-11
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• 2004

A FinFET, a novel double-gate device structure is capable of scaling well into the nanoelectronics regime. High-performance CMOS FinFETs , fully depleted silicon-on-insulator (FDSOI) devices have been demonstrated down to 15 nm gate length and are relatively simple to fabricate, which can be scaled to gate length below 10 nm. In this paper, some of the key elements of these technologies are described including sub-lithographic pattering technology, raised source/drain for low series resistance, gate work-function engineering for threshold voltage adjustment as well as metal gate technology, channel roughness on carrier mobility, crystal orientation effect, reliability issues, process variation effects, and device scaling limit.

• JSTS:Journal of Semiconductor Technology and Science
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• v.1 no.2
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• pp.103-110
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• 2001

Gate oxide scaling for sub-l00nm CMOS devices has been studied. Issues on the gate oxide scaling are reviewed, which are boron penetration, reliability, and direct tunneling leakage currents. Reliability of Sub-2.0nm oxides and the device performance degradation due to boron penetration are investigated. Especially, the effect of gate leakage currents on the transistor characteristics is studied. As a result, it is proposed that thinner oxides than previous expectations may be usable as scaling proceeds. Based on the gate oxide thickness optimization process we have established, high performance CMOS transistors of $L_{gate}=70nm$ and $T_{ox}=1.4nm$ were fabricated, which showed excellent current drives of $860\mu\textrm{A}/\mu\textrm{m}$ (NMOS) and $350\mu\textrm{A}/\mu\textrm{m}$ (PMOS) at $I_{off}=10\mu\textrm{A}/\mu\textrm{m}$ and $V_dd=1.2V$, and CV/I of 1.60ps (NMOS) and 3.32ps(PMOS).

• Journal of Nuclear Fuel Cycle and Waste Technology(JNFCWT)
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• v.18 no.4
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• pp.517-536
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• 2020

The radionuclide inventory in radioactive waste from nuclear power plants should be determined to secure the safety of final repositories. As an alternative to time-consuming, labor-intensive, and destructive radiochemical analysis, the indirect scaling factor (SF) method has been used to determine the concentrations of difficult-to-measure radionuclides. Despite its long history, the original SF methodology remains almost unchanged and now needs to be improved for advanced SF implementation. Intense public attention and interest have been strongly directed to the reliability of the procedures and data regarding repository safety since the first operation of the low- and intermediate-level radioactive waste disposal facility in Gyeongju, Korea. In this review, statistical methodologies for SF implementation are described and evaluated to achieve reasonable and advanced decision-making. The first part of this review begins with an overview of the current status of the scaling factor method and global experiences, including some specific statistical issues associated with SF implementation. In addition, this review aims to extend the applicability of SF to the characterization of large quantities of waste from the decommissioning of nuclear facilities.

• Journal of the Korea Convergence Society
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• v.5 no.3
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• pp.45-51
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• 2014

Computer science and computing technologies are applied into mathematical, science, medical, engineering and educational applications. The models are used to solve the issues in all the domains. Educational systems are used top down, bottom up, Gap Analysis model in the educational learning system. Educational learning process integrated with Lerner, content and the methodology. The Learners and content are same in the educational system or similar courses but the teaching methodologies are differing one with another. The determinations of teaching methodologies are based on the factors related to that particular model or subject. The learning model influencing determinations are made by the surveys, analysis and observation of data to maximize the learning outcome. This paper attempted to evaluate the SNE learners cognitive using NASA Scaling.

• Korean Journal of Agricultural and Forest Meteorology
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• v.7 no.1
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• pp.4-14
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• 2005

CarboKorea and HydroKorea are the domestic projects aiming to improve our understanding of carbon and water cycles in a typical Korean forest located in a complex terrain with a watershed connected to large rivers. The ultimate goal is to provide a nowcasting of these cycles for the whole Peninsula. The basic strategy to achieve such goal is through the inter- and multi-disciplinary studies that synthesize the in-situ field observation, modeling and remote sensing technology. The challenge is the fact that natural ecosystems are nonlinear and heterogeneous with a wide range of spatio-temporal scales causing the variations of mass and energy exchanges from a leaf to landscape scales. Our paradigm now shifts from temporal variation at a point to spatial patterns and from spatial homogeneity to complexity of water and carbon at multiple scales. Yet, a large portion of our knowledge about land-atmosphere interactions has been established based on tower observations, indicating that the development of scaling logics holds the key to the success of CarboKorea and HydroKorea. Here, we review the pioneering work of FIFE (First ISLSCP Field Experiment) on scaling issues in a temperate grassland and discuss the lessons from it for the application to Gwangneung forest site.

• Journal of Mushroom
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• v.18 no.1
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• pp.95-99
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• 2020

The trade deficit in mushrooms has continued to increase in recent years. This study explored major issues and challenges faced by the mushroom industry to increase export, and to prioritize the current issues and challenges based on their relative importance. 11 major issues and challenges in the mushroom industry were highlighted in focus group interviews. Best-worst scaling analysis prioritized these major issues and challenges, and questionnaire surveys were completed by 31 mushroom industry experts. The results revealed that strengthening the mushroom quality and price competitiveness were the main priorities, followed sequentially by a diversification of the overseas export markets and stabilization of the domestic mushroom price.