• 제목/요약/키워드: reliability test plan

검색결과 169건 처리시간 0.021초

베이지안 신뢰성입증시험 설계와 활용 (Design of Bayesian Zero-Failure Reliability Demonstration Test and Its Application)

  • 권영일
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제13권1호
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    • pp.1-10
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    • 2013
  • A Bayesian zero-failure reliability demonstration test method for products with exponential lifetime distribution is presented. Beta prior distribution for reliability of a product is used to design the Bayesian test plan and selecting a prior distribution using a prior test information is discussed. A test procedure with zero-failure acceptance criterion is developed that guarantees specified reliability of a product with given confidence level. An example is provided to illustrate the use of the developed Bayesian reliability demonstration test method.

A Time Truncated Two-Stage Group Sampling Plan for Weibull Distribution

  • Aslam, Muhammad;Jun, Chi-Hyuck;Rasool, Mujahid;Ahmad, Munir
    • Communications for Statistical Applications and Methods
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    • 제17권1호
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    • pp.89-98
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    • 2010
  • In this paper, a two-stage group sampling plan based on the time truncated life test is proposed for the Weibull distribution. The design parameters such as the number of groups and the acceptance number in each stage are determined by satisfying the producer's and consumer's risks simultaneously when the group size and the test duration are specified. The acceptable reliability level is expressed by the ratio of the true mean life to the specified life. It was demonstrated from the comparison with single-stage group sampling plans that the proposed plan can reduce the average sample number or improve the operating characteristics.

와이불 수명분포를 갖는 제품에 대한 베이지안 신뢰성 입증시험 설계 (Design of Bayesian Zero-Failure Reliability Demonstration Test for Products with Weibull Lifetime Distribution)

  • 권영일
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제14권4호
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    • pp.220-224
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    • 2014
  • A Bayesian zero-failure reliability demonstration test method for products with Weibull lifetime distribution is presented. Inverted gamma prior distribution for the scale parameter of the Weibull distribution is used to design the Bayesian test plan and selecting a prior distribution using a prior test information is discussed. A test procedure with zero-failure acceptance criterion is developed that guarantee specified reliability of a product with given confidence level. An example is provided to illustrate the use of the developed Bayesian reliability demonstration test method.

경제적인 무고장 신뢰성 인증시험 설계 (Economic Design of Zero-Failure Reliability Qualification Test)

  • 권영일
    • 품질경영학회지
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    • 제39권1호
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    • pp.71-77
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    • 2011
  • In the fields of reliability application, the most commonly used test methods for reliability qualification are zero failure tests since they require fewer test samples and less test time compared to other test methods that guarantee the same reliability with a given confidence level. An economic zero failure test plan is developed that minimizes the total cost related to perform a life test to guarantee a specified reliability of a product with a given confidence level and a numerical example is provided to illustrate the use of the proposed test method.

2006년 이후 발표된 가속수명시험 계획에 관한 문헌 연구 (A Review on the Accelerated Life Test Plan: 2006~2015)

  • 성시일
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제15권2호
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    • pp.84-89
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    • 2015
  • Accelerated life tests are widely used to evaluate the product reliability within a resonable amount of time and cost. This article provides literature review about accelerated life test plans between 2006~2015. The literature on planning accelerated life tests are reviewed with respect to the test scenario, assumed accelerated model and estimation method and optimization criteria. Finally, recommendations for the future research are presented.

Accelerated life test plan under modified ramp-stress loading with two stress factors

  • Srivastava, P.W.;Gupta, T.
    • International Journal of Reliability and Applications
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    • 제18권2호
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    • pp.21-44
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    • 2017
  • Accelerated life tests (ALTs) are frequently used in manufacturing industries to evaluate the reliability of products within a reasonable amount of time and cost. Test units are subjected to elevated stresses which yield quick failures. Most of the previous works on designing ALT plans are focused on tests that involve a single stress. Many times more than one stress factor influence the product's functioning. This paper deals with the design of optimum modified ramp-stress ALT plan for Burr type XII distribution with Type-I censoring under two stress factors, viz., voltage and switching rate each at two levels- low and high. It is assumed that usage time to failure is power law function of switching rate, and voltage increases linearly with time according to modified ramp-stress scheme. The cumulative exposure model is used to incorporate the effect of changing stresses. The optimum plan is devised using D-optimality criterion wherein the ${\log}_{10}$ of the determinant of Fisher information matrix is maximized. The method developed has been explained using a numerical example and sensitivity carried out.

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Developing the Optimized Method of Reliability-Growth Target Setting for Complex and Repairable Products from Business View

  • So, Young-Kug;Jeon, Young-Rok;Ryu, Byeong-Jin
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제15권4호
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    • pp.248-255
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    • 2015
  • Purpose : The purpose of this research is to develop the optimized method and process in the reliability-growth target setting, especially for complex and repairable system (or products) such as vehicle and airplane, construction equipment. Method : A reliability-growth test plan specifies a scenario to achieve the planned reliability value (or reliability target). The major elements in test planning are reliability-growth starting time and reliability level at that time, reliability-growth rate and reliability-growth target. All of them except a reliability target can be referred to the previous development data and reference researches. The reliability target level is directly influencing to test period (or time) which is related to test and warranty cost together. There are a few researches about the reliability target setting method and but showing the limitations to consider the views of engineering, business and customer together. There is no research how to handle the target setting process in detail. Result : We develop the optimized method and systematic process in reliability target setting with considering such views. This research also establish the new concept as production capability which means company (or supplier) capability to product its products. Conclusion : In this research result, we apply the new method to a few projects and can set the reasonable test planning. The developing results is showing the good balance between the developing cost and warranty cost at market.

자동차용 윈도우 스위치의 신뢰성 평가기준 (Reliability Assessment Criteria of Window switch for automobiles)

  • 최만엽;최범진;백재욱
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제11권1호
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    • pp.1-15
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    • 2011
  • Automobile markets are so fierce in the world market that every major manufacturer assure the buyer of the car by give a provocative warranty plan for their cars. For instance Hyundai motor company offer 10 years and 100,000 miles of warranty whichever comes first. But in order for this effort to be successful every critical component such as window switch has to be proven to be reliable in an adverse environment. Therefore, in this article reliability assessment criteria for window switch are established in terms of basic performance test, environment test and life test.

Bilevel-programming based failure-censored ramp-stress ALTSP for the log-logistic distribution with warranty cost

  • Srivastava, P.W.;Sharma, D.
    • International Journal of Reliability and Applications
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    • 제17권1호
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    • pp.85-105
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    • 2016
  • In this paper accelerated life testing is incorporated in quality control technique of acceptance sampling plan to induce early failures in high reliability products.Stress under accelerated condition can be applied in constant-stress, step-stress and progressive-stress or combination of such loadings. A ramp-stress results when stress is increased linearly (from zero) with time. In this paper optimum failure-censored ramp-stress accelerated life test sampling plan for log-logistic distribution has been formulated with cost considerations. The log-logistic distribution has been found appropriate for insulating materials. The optimal plans consist in finding optimum sample size, sample proportion allocated to each stress, and stress rate factor such that producer's and consumer's interests are safeguarded. Variance optimality criterion is used when expected cost per lot is not taken into consideration, and bilevel programming approach is used in cost optimization problems. The methods developed have been illustrated using some numerical examples, and sensitivity analyses carried out in the context of ramp-stress ALTSP based on variable SSP for proportion nonconforming.

고체 추진기관 시스템의 신뢰성 평가 방안 (Reliability evaluation plan of Rocket motor system)

  • 권택만;정지선;심행근;장주수
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제11권4호
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    • pp.399-407
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    • 2011
  • Reliability evaluation of One-Shot system which flies at speed of Mach must be evaluated as the result of many firing tests. But many firing tests are impossible because of budget deficit. Consequently the reliability prediction which substitutes firing tests is used. The accuracy of reliability prediction is decided according to a quantity of accumulated test data. If the test data is insufficient, the direction of prediction can not be set. So we propose the reliability prediction method which applies MIL-HDBK-217 Plus. MIL-HDBK-217 Plus is described about reliability prediction method without sufficient test data. So we apply MIL-HDBK-217 Plus to the rocket motor system, and we accomplish a modeling and a reliability prediction about the system.