Design of Bayesian Zero-Failure Reliability Demonstration Test for Products with Weibull Lifetime Distribution

와이불 수명분포를 갖는 제품에 대한 베이지안 신뢰성 입증시험 설계

A Bayesian zero-failure reliability demonstration test method for products with Weibull lifetime distribution is presented. Inverted gamma prior distribution for the scale parameter of the Weibull distribution is used to design the Bayesian test plan and selecting a prior distribution using a prior test information is discussed. A test procedure with zero-failure acceptance criterion is developed that guarantee specified reliability of a product with given confidence level. An example is provided to illustrate the use of the developed Bayesian reliability demonstration test method.