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Design of Bayesian Zero-Failure Reliability Demonstration Test and Its Application  

Kwon, Young Il (Department of Industrial Engineering, Cheongju University)
Publication Information
Journal of Applied Reliability / v.13, no.1, 2013 , pp. 1-10 More about this Journal
Abstract
A Bayesian zero-failure reliability demonstration test method for products with exponential lifetime distribution is presented. Beta prior distribution for reliability of a product is used to design the Bayesian test plan and selecting a prior distribution using a prior test information is discussed. A test procedure with zero-failure acceptance criterion is developed that guarantees specified reliability of a product with given confidence level. An example is provided to illustrate the use of the developed Bayesian reliability demonstration test method.
Keywords
Bayesian reliability demonstration test; exponential distribution; beta distribution; zero-failure acceptance test; consumer's risk; confidence level;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
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