• Title/Summary/Keyword: power MOSFET

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The Switching Characteristic and Efficiency of New Generation SiC MOSFET (차세대 전력반도체 SiC MOSFET의 스위칭 특성 및 효율에 관한 연구)

  • Choi, Won-mook;Ahn, Ho-gyun
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.21 no.2
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    • pp.353-360
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    • 2017
  • Recently, due to physical limitation of Si based power semiconductor, development speed of switching power semiconductors is falling and it is difficult to expect any further performance improvements. SiC based power semiconductor with superior characteristic than Si-based power semiconductor have been developed to overcome these limitations. however, there is not method to apply for real system. Therefore, suggested the feasibility and solution for SiC-based power semiconductor system. design to 1kW class DC-DC boost converter and demonstrated the superiority of SiC MOSFET under the same operating conditions by analyzing switching frequency, duty ratio, voltage and current, and comparing with Si based power semiconductor through experimental efficiency according to each system load. The SiC MOSFET has high efficiency and fast switching speed, and can be designed with small inductors and capacitors which has the advantage of volume reduction of the entire system.

Analysis of Lattice Temperature in Super Junction Trench Gate Power MOSFET as Changing Degree of Trench Etching

  • Lee, Byeong-Il;Geum, Jong Min;Jung, Eun Sik;Kang, Ey Goo;Kim, Yong-Tae;Sung, Man Young
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.14 no.3
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    • pp.263-267
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    • 2014
  • Super junction trench gate power MOSFETs have been receiving attention in terms of the trade-off between breakdown voltage and on-resistance. The vertical structure of super junction trench gate power MOSFETs allows the on-resistance to be reduced compared with conventional Trench Gate Power MOSFETs. The heat release of devices is also decreased with the reduction of on-resistance. In this paper, Lattice Temperature of two devices, Trench Gate Power MOSFET and Super junction trench gate power MOSFET, are compared in several temperature circumstance with the same Breakdown Voltage and Cell-pitch. The devices were designed by 100V Breakdown voltage and measured from 250K Lattice Temperature. We have tried to investigate how much temperature rise in the same condition. According as temperature gap between top of devices and bottom of devices, Super junction trench gate power MOSFET has a tendency to generate lower heat release than Trench Gate Power MOSFET. This means that Super junction trench gate power MOSFET is superior for wide-temperature range operation. When trench etching process is applied for making P-pillar region, trench angle factor is also important component. Depending on trench angle, characteristics of Super junction device are changed. In this paper, we focus temperature characteristic as changing trench angle factor. Consequently, Trench angle factor don't have a great effect on temperature change.

The Electrical Characteristics of Power FET using Super Junction for Advance Power Modules

  • Kang, Ey Goo
    • Journal of IKEEE
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    • v.17 no.3
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    • pp.360-364
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    • 2013
  • The maximum breakdown voltage's characteristic within the Super Junction MOSFET structure comes from N-Drift and P-Pillar's charge balance. By developing P-Pillar from Planar MOSFET, it was confirmed that the breakdown voltage is improved through charge balance, and by setting the gate voltage at 10V, the characteristic comparisons of Planar MOSFET and Super Junction MOSFET are shown in picture 6. The results show that it had the same breakdown voltage as Planar MOSFET which increased temperature resistance by 87.4% at $.019{\Omega}cm^2$ which shows that by the temperature resistance increasing, the power module's power dissipation improved.

Effect of Hot Carrier Stress on The Power Performance Degradation in SOI MOSFET (Hot Carrier Stress로 인한 SOI MOSFET의 전력 성능 저하)

  • Lee, Byung-Jin;Park, Sung-Wook;Park, Jong-Kwan
    • 전자공학회논문지 IE
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    • v.45 no.4
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    • pp.7-10
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    • 2008
  • In this work investigates hot carrier stress on the RF power of SOI MOSFET using load-pull measurement. We found that the RF power characteristics are affected by the hot carrier stress, and the DC performance of SOI MOSFET is clearly degraded after hot carrier stress at constant voltage measurement. And these experimental observations can be explained by the change of DC performance degradation coefficient under hot carrier stress.

Highly Efficient MOSFET Inverter for Single-Phase Grid-Connected Photovoltaic Power Generation Systems (단상 계통연계형 태양광 발전 시스템용 고효율 MOSFET 인버터)

  • Ryu, Hyung-Min
    • The Transactions of the Korean Institute of Power Electronics
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    • v.19 no.3
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    • pp.227-232
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    • 2014
  • A highly efficient MOSFET inverter for single-phase grid-connected photovoltaic power generation systems is presented in this paper. It is a full-MOSFET version of the conventional transformerless full-bridge inverter with dual L-C filters using unipolar PWM. The key idea lies on smart pre switching(SPS), which can make the large switching loss due to a poor reverse recovery of the MOSFET's body diode reduced dramatically. The validity of the proposed inverter is verified by experiment.

CoolSiCTM SiC MOSFET Technology, Device and Application

  • Ma, Kwokwai
    • Proceedings of the KIPE Conference
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    • 2017.07a
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    • pp.577-595
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    • 2017
  • ${\bullet}$ Silicon Carbide (SiC) had excellent material properties as the base material for next generation of power semiconductor. In developing SiC MOSFET, gate oxide reliability issues had to be first overcome before commercial application. Besides, a high and stable gate-source voltage threshold $V_{GS(th)}$ is also an important parameter for operation robustness. SiC MOSFET with such characteristics can directly use existing high-speed IGBT gate driver IC's. ${\bullet}$ The linear voltage drop characteristics of SiC MOSFET will bring lower conduction loss averaged over full AC cycle compared to similarly rate IGBT. Lower switching loss enable higher switching frequency. Using package with auxiliary source terminal for gate driving will further reduce switching losses. Dynamic characteristics can fully controlled by simple gate resistors. ${\bullet}$ The low switching losses characteristics of SiC MOSFET can substantially reduce power losses in high switching frequency operation. Significant power loss reduction is also possible even at low switching frequency and low switching speed. in T-type 3-level topology, SiC MOSFET solution enable three times higher switching freqeuncy at same efficiency.

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Gate Workfunction Optimization of a 32 nm Metal Gate MOSFET for Low Power Applications (저전력 분야 응용을 위한 32nm 금속 게이트 전극 MOSFET 소자의 게이트 workfunction 의 최적화)

  • Oh, Yong-Ho;Kim, Young-Min
    • Proceedings of the KIEE Conference
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    • 2005.07c
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    • pp.1974-1976
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    • 2005
  • The feasibility of a midgap metal gate is investigated for 32nm MOSFET low power applications. The midgap metal gate MOSFET is found to deliver a driving current as high as a bandedge gate one for the low power applications if a proper retrograde channel is used. An adequate design of the retrograde channel is essential to achieve the performance requirement given in ITRS roadmap. In addition, a process simulation is run using halo implants and thermal processes to evaluate the feasibility of the necessary retrograde profile in manufacturing environments. From the thermal budget point of view, the bandedge metal gate MOSFET is more vulnerable to the following thermal process than the midgap metal gate MOSFET since it requires a steeper retrograde doping profile. Based on the results, a guideline for the gate workfunction and the channel profile in the 32 nm MOSFET is proposed.

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Study on the overcurrent detection and blocking method of SiC MOSFET using the PCB pattern Rogowski coil (PCB패턴 Rogowski 코일을 이용한 SiC MOSFET의 과전류 검출 및 차단 기법에 관한 연구)

  • Yoon, Hanjong;Cho, Younghoon
    • Proceedings of the KIPE Conference
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    • 2018.11a
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    • pp.92-94
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    • 2018
  • 본 논문은 SiC MOSFET 디바이스를 사용하는 전력변환장치에서 Rogowski 코일을 이용하여 SiC MOSFET 디바이스에 흐르는 전류를 측정하여, 과전류를 검출하고 게이팅 신호를 차단하는 기법에 관하여 연구한다. SiC MOSFET는 소자의 특성으로 보편적으로 사용되는 과전류 검출 방법인 DeSAT 적용이 어렵기 때문에 Rogowski 코일을 사용하여 스위치 전류를 측정, 과전류를 검출한다. 본 논문에서는 PCB패턴 Rogowski 코일의 설계 방법뿐만 아니라 Rogowski 코일과 적분기의 대역폭에 대해서도 논의한다. 실험은 직류링크 커패시터에 SiC MOSFET 스위치 레그를 병렬로 연결하고, 직류링크 커패시터에 직류전압을 충전 후 스위치 레그를 약 6us정도 단락시켜 SiC MOSFET에 과전류를 발생시킨다. 이 때, 제안한 Rogowski 코일을 이용한 과전류 검출 및 차단 기법의 적용 전후를 비교하여 동작 및 성능(검출 및 차단 소요시간)을 확인한다. 마지막으로 실험 결과를 통해 본 논문에서 제안한 PCB패턴 Rogowski 코일을 이용하여 과전류 검출 및 차단 기법이 검증되었다.

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A Lateral Trench Electrode Power MOSFET with Improved Blocking Characteristics (개선된 항복 특성을 갖는 수평형 트렌치 전극 파워 MOSFET)

  • Kim, Dae-Jong;Kim, Sang-Sig;Sung, Man-Young;Kang, Ey-Goo;Rhie, Dong-Hee
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.07a
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    • pp.323-326
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    • 2003
  • In this paper, a new small size Lateral Trench Electrode Power MOSFET is proposed. This new structure, called "LTEMOSFET"(Lateral Trench Electrode Power MOSFET), is based on the conventional MOSFET. The entire electrode of LTEMOSFET is placed in trench oxide. The forward blocking voltage of the proposed LTEMOSFET is improved by 1.6 times with that of the conventional MOSFET. The forward blocking voltage of LTEMOSFET is 250V. At the same size, a increase of the forward blocking voltage of about 1.6 times relative to the conventional MOSFET is observed by using TMA-MEDICI which is used for analyzing device characteristics. Because the electrodes of the proposed device are formed in trench oxide, the electric field in the device are crowded to trench oxide. We observed that the characteristics of the proposed device was improved by using TMA-MEDICI and that the fabrication of the proposed device is possible by using TMA-TSUPREM4.

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Design of Ultra Low-Voltage NCL Circuits in Nanoscale MOSFET Technology (나노 MOSFET 공정에서의 초저전압 NCL 회로 설계)

  • Hong, Woo-Hun;Kim, Kyung-Ki
    • Journal of Korea Society of Industrial Information Systems
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    • v.17 no.4
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    • pp.17-23
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    • 2012
  • Ultra low-power design and energy harvesting applications require digital systems to operate under extremely low voltages approaching the point of balance between dynamic and static power consumption which is attained in the sub-threshold operation mode. Delay variations are extremely large in this mode. Therefore, in this paper, a new low-power logic design methodology using asynchronous NCL circuits is proposed to reduce power consumption and not to be affected by various technology variations in nanoscale MOSFET technology. The proposed NCL is evaluated using various benchmark circuits at 0.4V supply voltage, which are designed using 45nm MOSFET predictive technology model. The simulation results are compared to those of conventional synchrouns logic circuits in terms of power consumption and speed.