• Title/Summary/Keyword: p-MOS

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Microwave Annealing을 이용한 MOS Capacitor의 특성 개선

  • Jo, Gwang-Won;Jo, Won-Ju
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.08a
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    • pp.241.1-241.1
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    • 2013
  • 최근 고집적화된 금속-산화막 반도체 metal oxide semiconductor (MOS) 소자는 크기가 점점 작아짐에 따라 얇은 산화막과 다양한 High-K 물질과 전극에 대하여 연구되고 있다. 이러한 소자의 열적 안정성과 균일성을 얻기 위해 다양한 열처리 방법이 사용되고 있으며, 일반적인 열처리 방법으로는 conventional thermal annealing (CTA)과 rapid thermal annealing (RTA)이 많이 이용되고 있다. 본 실험에서는 microwave radiation에 의한 열처리로 소자의 특성을 개선시킬 수 있다는 사실을 확인하였고, 상대적으로 $100^{\circ}C$ 이하의 저온에서도 공정이 이루어지기 때문에 열에 의한 소자 특성의 열화를 억제할 수 있으며, 또한 짧은 처리 시간 및 공정의 단순화로 비용을 효과적으로 절감할 수 있다. 본 실험에서는 metal-oxide-silicon (MOS) 구조의 capacitor를 제작한 다음, 기존의 CTA나 RTA 처리가 아닌 microwave radiation을 실시하여 MOS capacitor의 전기적인 특성에 미치는 microwave radiation 효과를 평가하였다. 본 실험은 p-type Si 기판에 wet oxidation으로 300 nm 성장된 SiO2 산화막 위에 titanium/aluminium (Ti/Al) 금속 전극을 E-beam evaporator로 형성하여 capacitance-voltage (C-V) 특성 및 current-voltage (I-V) 특성을 평가하였다. 그 결과, microwave 처리를 통해 flat band voltage와 hysteresis 등이 개선되는 것을 확인하였고, microwave radiation 파워와 처리 시간을 최적화하였다. 또한 일반적인 CTA 열처리 소자와 비교하여 유사한 전기적 특성을 확인하였다. 이와 같은 microwave radiation 처리는 매우 낮은 온도에서 공정이 이루어짐에도 불구하고 시료 내에서의 microwave 에너지의 흡수가 CTA나 RTA 공정에서의 열에너지 흡수보다 훨씬 효율적으로 이루어지며, 결과적으로 산화막과 실리콘 기판의 계면 특성 개선에 매우 효과적이라는 것을 나타낸다. 따라서, microwave radiation 처리는 향후 저온공정을 요구하는 nano-scale MOSFET의 제작 및 저온 공정이 필수적인 display 소자 제작의 해결책으로 기대한다.

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Measurements of Interface States In a MOS Capacitor by DLTS System Using Wideband Monophase Lock-in Amplifier (광대역 단상 Lock-in 증폭기 DLTS 시스템을 이용한 MOS Capacitor 계면상태 측정)

  • Bae, Dong-Gun;Chung, Sang-Koo
    • Journal of the Korean Institute of Telematics and Electronics
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    • v.23 no.6
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    • pp.807-813
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    • 1986
  • Measurements of interface states in a MOS capacitor by DLTS system using wideband monophase lock-in amplifier are discussed. A new signal analysis method that takes into account the bias pulse width and the gate off width is presented to remove the errors in the measured parameters of interface states resulting from the traditional method which neglects the effect of those widths. Theoretical calculations are made for the parameters related to the rate window, signal to noise ratio, and the energy resolution. On the grounds of this discussion, interface states of the MOS capacitor on p-type substrate of (110) orentation are measured with the optimal gate-off width with respect to the S/N ratio and the energy resolution. The results are interface state density of the order of 10**10 (cm-\ulcornereV**-1) to 10**11 (cm-\ulcornereV**-1) in the energy range of Ev+0.15(dV) to Ev+0.5(eV), and constant capture cross section of the order of 10**-16 (cm\ulcorner.

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Ultra low temperature polycrystalline silicon thin film transistor using sequential lateral solidification and atomic layer deposition techniques

  • Lee, J.H.;Kim, Y.H.;Sohn, C.Y.;Lim, J.W.;Chung, C.H.;Park, D.J.;Kim, D.W.;Song, Y.H.;Yun, S.J.;Kang, K.Y.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2004.08a
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    • pp.305-308
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    • 2004
  • We present a novel process for the ultra low temperature (<150$^{\circ}C$) polycrystalline silicon (ULTPS) TFT for the flexible display applications on the plastic substrate. The sequential lateral solidification (SLS) was used for the crystallization of the amorphous silicon film deposited by rf magnetron sputtering, resulting in high mobility polycrystalline silicon (poly-Si) film. The gate dielectric was composed of thin $SiO_2$ formed by plasma oxidation and $Al_2O_3$ deposited by plasma enhanced atomic layer deposition. The breakdown field of gate dielectric on poly-Si film showed above 6.3 MV/cm. Laser activation reduced the source/drain resistance below 200 ${\Omega}$/ㅁ for n layer and 400 ${\Omega}$/ㅁ for p layer. The fabricated ULTPS TFT shows excellent performance with mobilities of 114 $cm^2$/Vs (nMOS) and 42 $cm^2$/Vs (pMOS), on/off current ratios of 4.20${\times}10^6$ (nMOS) and 5.7${\times}10^5$ (PMOS).

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Design of a Bitrate Scalable Speech Codec Based on G.723.1 (G.723.1 기반 비트율 scalable 음성 코덱 개발)

  • Kang Sangwon;Lee Kangeun;Park Dongwon;Lee Joonseok
    • The Journal of the Acoustical Society of Korea
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    • v.24 no.6
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    • pp.358-364
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    • 2005
  • In this Paper. we present a bitrate scalable speech codec which uses an ITU-T G.723.1 as the baseline coder and encodes the synthesis error signal in an enhancement coder. ITU-T P.862 (PESQ) is used to evaluate the Performance of the bitrate scalable coder. Experiments show that 6.7kbps enhancement layer based on G.723.1 5.3kbps produces the increase of 0.39 in MOS and 5.7kbps enhancement layer based on G.723.1 6.3kbps Produces the increase of 0.267 in MOS.

Study on Experimental Fabrication of a New MOS Transistor for High Speed Device (새로운 고주파용 MOS 트랜지스터의 시작에 관한 연구)

  • 성영권;민남기;성만영
    • 전기의세계
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    • v.27 no.4
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    • pp.45-51
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    • 1978
  • A new method of realizing the field effect transistor with a sub-.mu. channel width is described. The sub-.mu. channel width is made possible by etching grooves into n$^{+}$ pn$^{[-10]}$ n$^{[-10]}$ structure and using p region at the wall for the channel region of the Metal-Oxide-Semiconductor transistor (MOST), or by diffusing two different types of impurities through the same diffusion mask and using p region at the surface for the channel region of MOST. When the drain voltage is increased at the pn$^{[-10]}$ drainjunction the depletion layer extends into the n$^{[-10]}$ region instead of into p region; this is also the secret of success to realize the sub-.mu. channel width. As the result of the experimental fabrication, a microwave MOST was obtained. The cut-off frequency was calculated to be 15.4 GHz by Linvill's power equation using the measured capacitances and transconductance.

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Graphene Transistor Modeling Using MOS Model (MOS 모델을 이용한 그래핀 트랜지스터 모델링)

  • Lim, Eun-Jae;Kim, Hyeongkeun;Yang, Woo Seok;Yoo, Chan-Sei
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.26 no.9
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    • pp.837-840
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    • 2015
  • Graphene is a single layer of carbon material which shows very high electron mobility, so many kinds of research on the devices using graphene layer have been performed so far. Graphene material is adequate for high frequency and fast operation devices due to its higher mobility. In this research, the actual graphene layer is evaluated using RT-CVD method which can be available for mass production. The mobility of $7,800cm^2/Vs$ was extracted, that is more than 7 times of that in silicon substrate. The graphene transistor model having no band gap is evaluated using both of pMOS and nMOS based on the measured mobility values. And then the response of graphene transistor model regarding to gate length and width is examined.

A Study on the temperature sensing circuit using MOS applicable for the IC internal temperature measurement (IC 내부 온도측정이 가능한 MOS 온도센싱 회로에 관한 연구)

  • Kang, Byung-jun;Lee, Min-woo;Kim, Han-seul;Han, Jung-woo;Son, Sang-hee;Jung, on-sup
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2013.10a
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    • pp.695-697
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    • 2013
  • In this paper, temperature sensing circuit using by MOS is proposed. It produces the voltage as output and is applicable for the internal IC temperature measurement. It is designed by two current mirrors using MOS to implement the IC in the CMOS fabrication and is applicable for the various applications. It operates in two mode, temperature mode and sleep mode. From the simulation results, output voltage is measured from 0V to 1.2V by sweeping $0^{\circ}C{\sim}125^{\circ}C$ in temperature mode and output current flows under 100pA in sleep mode.

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The Fabrication of MOS Capacitor composed of $HfO_2$/Hf Gate Dielectric prepared by Atomic Layer Deposition (ALD 방법으로 증착된 $HfO_2$/Hf 박막을 게이트 절연막으로 사용한 MOS 커패시터 제조)

  • Lee, Dae-Gab;Do, Seung-Woo;Lee, Jae-Sung;Lee, Yong-Hyun
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.44 no.5
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    • pp.8-14
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    • 2007
  • In this paper, $HfO_2$/Hf stacked film has been applied as the gate dielectric in MOS devices. The $HfO_2$ thin film was deposited on p-type (100) silicon wafers by atomic layer deposition (ALD) using TEMAHf and $O_3$ as precursors. Prior to the deposition of the $HfO_2$ film, a thin Hf metal layer was deposited as an intermediate layer. Round-type MOS capacitors have been fabricated on Si substrates with 2000${\AA}$-thick Al or Pt top electrode. The prepared film showed the stoichiometric components. At the $HfO_2$/Si interface, both Hf-Si and Hf-Si-O bonds were observed, instead of Si-O bond. The sandwiched Hf metal layer suppressed the growing of $SiO_x$ layer so that $HfSi_xO_y$ layer was achieved. It seems that the intermediate Hf metal layer has a benefit for the enhancement of electric characteristics of gate dielectric in $HfO_2$/Si structure.

One-shot multi-speaker text-to-speech using RawNet3 speaker representation (RawNet3를 통해 추출한 화자 특성 기반 원샷 다화자 음성합성 시스템)

  • Sohee Han;Jisub Um;Hoirin Kim
    • Phonetics and Speech Sciences
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    • v.16 no.1
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    • pp.67-76
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    • 2024
  • Recent advances in text-to-speech (TTS) technology have significantly improved the quality of synthesized speech, reaching a level where it can closely imitate natural human speech. Especially, TTS models offering various voice characteristics and personalized speech, are widely utilized in fields such as artificial intelligence (AI) tutors, advertising, and video dubbing. Accordingly, in this paper, we propose a one-shot multi-speaker TTS system that can ensure acoustic diversity and synthesize personalized voice by generating speech using unseen target speakers' utterances. The proposed model integrates a speaker encoder into a TTS model consisting of the FastSpeech2 acoustic model and the HiFi-GAN vocoder. The speaker encoder, based on the pre-trained RawNet3, extracts speaker-specific voice features. Furthermore, the proposed approach not only includes an English one-shot multi-speaker TTS but also introduces a Korean one-shot multi-speaker TTS. We evaluate naturalness and speaker similarity of the generated speech using objective and subjective metrics. In the subjective evaluation, the proposed Korean one-shot multi-speaker TTS obtained naturalness mean opinion score (NMOS) of 3.36 and similarity MOS (SMOS) of 3.16. The objective evaluation of the proposed English and Korean one-shot multi-speaker TTS showed a prediction MOS (P-MOS) of 2.54 and 3.74, respectively. These results indicate that the performance of our proposed model is improved over the baseline models in terms of both naturalness and speaker similarity.