• Journal of Korean Society of Industrial and Systems Engineering
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• v.21 no.45
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• pp.319-328
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• 1998

In this paper, the design of ALT(Accelerated Life Test) requires a sampling plan based on failure-censored(Type II censored) ALT with lognormal life distribution. Specially the environmental effect of products has been emphasized, so we considered the upper life limit as well as lower life limit in the ALT sampling plan. The optimal plan with a high stress and a low stress is used as test plan, and the total sample size for test and lot acceptability constant which minimize an asymptotic variance of maximum likelihood estimator of assumed model parameters and satisfy the given producer's risk and customer's risk are drawn out. These values can be acquired by means of the computer program that we coded for resolving the difficulty and complexity of calculation.

• Journal of Korean Society for Quality Management
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• v.17 no.1
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• pp.89-106
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• 1989

For Weibull distributed lifetimes, this paper presents asymptotically optimal accelerated life test plans for practical applications under intermittent inspection and type-I censoring. Computational results show that the asymptotic variance of a low quantile at the design stress as optimal criterion is insensitive to the number of inspections at overstress levels. Sensitivity analyses indicate that optimal plans are robust enough to moderate departures of estimated failure probabilities at the design and high stresses as input parameters to plan accelerated life tests from their true values. Monte Carlo simulation for small sample study on optimal accelerated life test plans developed by the asymptotic maximum likelihood theory is conducted. Simulation results suggest that optimal plans are satisfactory for sample size in practice.

• Journal of Korean Society for Quality Management
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• v.17 no.1
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• pp.48-59
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• 1989

The motor vehicle emission is expected to be constrained strongly in the future in accordance with the current policy as to prevention of air pollution. This paper establishes a sequential rectifying inspection plan which satisfies the standard motor vehicle emission for the automobile producers who are currently producting the automobiles with catalytic converts. This plan also considered the constraint of the effective motor vehicle emission by way of rectifying the certification test in the past. In order to evaluate the performance of the inspection plan, the recent certification test data have also been applied. The result of the application has proved that the rectified sequential inspection plan presented in this paper satisfies the standard motor vehicle emission and can be the optimal economic inspection plan. As a result the inspection plan given in this paper will be contributed to constrain the motor vehicle emission most effectively.

• Journal of the Korea Institute of Military Science and Technology
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• v.14 no.3
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• pp.405-413
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• 2011

Defense Systems Test Center in ADD supports increasingly various missile test requirements such as higher altitude event, multi target operation and low-altitude, high velocity target tracking. In this paper, we have proposed the development of instrumentation radar tracking status simulator based on virtual reality. This simulator can predict the tracking status and risk of failure using several modeling algorithms. It consists of target model, radar model, environment model and several algorithms includes the multipath interference effects. Simulation results show that the predict tracking status and signal are similar to the test results of the live flight test. This simulator predicts and analyze all of the status and critical parameters such as the optimal site location, servo response, optimal flight trajectory, LOS(Line of Sight). This simulator provides the mission plan with a powerful M&S tool to rehearse and analyze instrumentation tracking radar measurement plan for live flight test at DSTC(Defense Systems Test Center).

• International Journal of Reliability and Applications
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• v.17 no.1
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• pp.21-49
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• 2016

Many mechanical, electrical and electronic products have more than one performance characteristics (PCs). For example the performance degradation of rubidium discharge lamps can be characterized by the rubidium consumption or the decreasing intensity the lamp. The product may degrade due to all the PCs which may be independent or dependent. This paper deals with the design of optimal bivariate step-stress partially accelerated degradation test (PADT) with degradation paths modelled by gamma process. The dependency between PCs has been modelled through Frank copula function. In partial step-stress loading, the unit is tested at usual stress for some time, and then the stress is accelerated. This helps in preventing over-stressing of the test specimens. Failure occurs when the performance characteristic crosses the critical value the first time. Under the constraint of total experimental cost, the optimal test duration and the optimal number of inspections at each intermediate stress level are obtained using variance optimality criterion.

• Journal of Korean Society for Quality Management
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• v.40 no.2
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• pp.117-125
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• 2012

For the highly reliable products, an accelerated degradation test (ADT) is a useful tool which has been employed in industry to obtain reliability-related information within an affordable amount of time and cost. In an ADT, as all other reliability tests, it is important to carefully design the ADT beforehand to obtain estimates of the quantities of interest as precisely as possible. In this paper, optimal ADTs are developed assuming that the constant-stress loading method is employed and the degradation characteristic follows a Wiener process. Under the constraint that the total cost does not exceed a pre-specified budget, the stress levels, the number of test units allocated to each stress level and the number of measurement (termination time) are determined such that the asymptotic variance of the maximum likelihood estimator of the q-th quantile of the lifetime distribution at the use condition is minimized.

• Journal of Korean Society for Quality Management
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• v.24 no.4
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• pp.44-58
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• 1996

This paper presents optimal accelerated life test plans with different censoring times for exponential, Weibull, and lognormal lifetime distributions, respectively. For an optimal plan, low stress level, proportion of test units allocated and censoring time at each stress are determined such that the asymptotic variance of the maximum likelihood estimator of a certain quantile at use condition is minimized. The proposed plans are compared with the corresponding optimal plans with a common censoring time over range of parameter values. Computational results indicate that those plans are statistically optimal ones in terms of accuracy of estimator when total censoring times of two plans are equal.

• Journal of Applied Reliability
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• v.13 no.2
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• pp.87-98
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• 2013

Accelerated degradation tests (ADTs) measuring failure-related degradation characteristic at the accelerated condition are widely used to assess the reliability of highly reliable products. Often, however, little degradation could be observed even in single-stress ADTs due to the high reliability of test unit, and as a result poor estimate of the reliability may be obtained. ADTs with multiple stress variables can be employed to overcome such difficulties. In this paper, optimal ADT plans with two stress variables are developed assuming that the degradation characteristic follows Weibull distribution by determining the stress levels, the proportion of test units allocated to each stress level such that the asymptotic variance of the maximum likelihood estimator of the q-th quantile of the lifetime distribution at the use condition is minimized.

• Journal of Applied Reliability
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• v.17 no.2
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• pp.129-135
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• 2017

Purpose: This article provides step-stress accelerated degradation test (ADT) plans based on the Wiener process. Method: Step-stress levels and the stress change times are determined based on the D-optimality criteria to develop test plans. Further, a simple grid search method is provided for obtaining the optimal test plan. Results: Based on the solution procedure, ADT plans which include the stress levels and change times are developed for conducting the reliability test. Conclusion: Optimal step-stress ADT plans are provided for the case where the number of measurements is small.

• International Journal of Reliability and Applications
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• v.15 no.2
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• pp.125-150
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• 2014

Accelerated life tests (ALTs) are extensively used to determine the reliability of a product in a short period of time. Test units are subject to elevated stresses which yield quick failures. ALT can be carried out using constant-stress, step-stress, progressive-stress, cyclic-stress or random-stress loading and their various combinations. An ALT with linearly increasing stress is ramp-stress test. Much of the previous work on planning ALTs has focused on constant-stress, step-stress, ramp-stress schemes and their various combinations where the stress is generally increased. This paper presents an optimal design of ramp soak-stress ALT model which is based on the principle of Thermal cycling. Thermal cycling involves applying high and low temperatures repeatedly over time. The optimal plan consists in finding out relevant experimental variables, namely, stress rates and stress rate change points, by minimizing variance of reliability function with pre-specified mission time under normal operating conditions. The Burr type XII life distribution and time-censored data have been used for the purpose. Burr type XII life distribution has been found appropriate for accelerated life testing experiments. The method developed has been explained using a numerical example and sensitivity analysis carried out.