• Korean Journal of Optics and Photonics
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• v.13 no.4
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• pp.301-307
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• 2002

The propagation characteristic of an optical waveguide was investigated by measuring with a near-field scanning optical microscope (NSOM) the evanescent field formed at the neighbor of its core-cladding interface. For this purpose, the NSOM system was developed specially as a form of Photon scanning tunneling microscope. The evanescent field distributions of several channel waveguides were measured at the wavelength of 1550 ㎚, and the usefulness of the system was verified by comparing experimental results with simulation results. In particular, the interference phenomena of the guided modes during their propagation along a multimode channel waveguide could be observed directly from the measured evanescent field distribution.

• Current Optics and Photonics
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• v.5 no.3
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• pp.229-237
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• 2021

The capabilities of the near-field scanning optical microscope (NSOM) for obtaining high resolution lateral topographical images as well as for mapping the spectroscopic and optical properties of a sample below the diffraction limit of light have made it an attractive research field for most researchers dealing with optical characteristics of materials in nano scales. The apertured NSOM technique involves confining light into an aperture of sub-wavelength size and using it to illuminate a sample maintained at a distance equal to a fraction of the sub-wavelength aperture (near-field region). In this article, we present a setup for developing NSOM using a cantilever with a sub-wavelength aperture at the tip. A single laser is used for both cantilever deflection measurement and near-field sample excitation. The laser beam is focused at the apex of the cantilever where a portion of the beam is reflected and the other portion goes through the aperture and causes local near-field optical excitation of the sample, which is then raster scanned in the near-field region. The reflected beam is used for an optical beam deflection technique that yields topographical images by controlling the probe-sample in nano-distance. The fluorescence emissions signal is detected in far-field by the help of a silicon avalanche photodiode. The images obtained using this method show a good correlation between the topographical image and the mapping of the fluorescence emissions.

• ETRI Journal
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• v.26 no.3
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• pp.189-194
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• 2004

We demonstrate a high-speed recording based on field-induced manipulation in combination with an optical reading of recorded bits on Au cluster films using the atomic force microscope (AFM) and the near-field scanning optical microscope (NSOM). We reproduced 50 nm-sized mounds by applying short electrical pulses to conducting tips in a non-contact mode as a writing process. The recorded marks were then optically read using bent fiber probes in a transmission mode. A strong enhancement of light transmission is attributed to the local surface plasmon excitation on the protruded dots.

• Proceedings of the Korean Vacuum Society Conference
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• 2012.02a
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• pp.559-559
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• 2012

We developed a new scheme for the highly sensitive near-field scanning optical microscope (NSOM) by using a dithering sample stage rather than a dithering probe. In the proposed scheme, the sample is directly loaded on one prong surface of a dithering bare tuning fork. Gap control between probe and sample is performed by detecting the shear force between an immobile fiber probe and the dithering sample. In a conventional NSOM, the Q factor drastically decreases from 7783 to 1000 or even to 100 by attaching a probe to the tuning fork. In our proposed NSOM, on the contrary, the Q factor does not change significantly, 7783 to 7480, when the sample is loaded directly to the tuning fork instead of attaching a probe. Consequently, the graphene sheets that cannot be observed by a conventional NSOM were clearly observed by the proposed method with sub-nanometer vertical resolution due to the extremely high Q factor.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2004.10a
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• pp.590-595
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• 2004

The shape and size variations of the nanopatterns produced on a positive photoresist using a near-field scanning optical microscope(NSOM) are investigated with respect to the process variables. A cantilever type nanoprobe having a 100nm aperture at the apex of the pyramidal tip is used with the NSOM and a He-Cd laser at a wavelength of 442nm as the illumination source. Patterning characteristics are examined for different laser beam power at the entrance side of the aperture( $P_{in}$ ), scan speed of the piezo stage(V), repeated scanning over the same pattern, and operation modes of the NSOM(DC and AC modes). The pattern size remained almost the same for equal linear energy density. Pattern size decreased for lower laser beam power and greater scan speed, leading to a minimum pattern width of around 50nm at $P_{in}$ =1.2$\mu$W and V=12$\mu$m/. Direct writing of an arbitrary pattern with a line width of about 150nm was demonstrated to verify the feasibility of this technique for nanomask fabrication. Application on high-density data storage using azopolymer is discussed at the end.

• Proceedings of the Optical Society of Korea Conference
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• 2001.02a
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• pp.122-123
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• 2001

본 연구에서는 주사 근접장 광학 현미경(Near-field Scanning Optical Microscope, 이하 NSOM이라 한다)을 이용하여 빛이 전파되고 있는 광 도파로 주변에 형성되는 evanescent field를 측정함으로써 광도파로 내부에서의 빛의 전파특성을 알아보았다. 광소자의 설계에 있어서 광도파로 내부에서의 빛이 어떻게 전파되어지는 가는 매우 중요한 인자가 된다. (중략)

• Korean Journal of Optics and Photonics
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• v.15 no.1
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• pp.51-55
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• 2004

Surface plasmons (SPs) are charge density oscillations that propagate along an interface between a dielectric and metal. In this paper, the electric field of SPs and the intereference of two SPs are observed by using Near-field Scanning Optical Microscope (NSOM). The excitation condition of SPs is changed as the optical tip approaches the metal surface, because the excitation condition of SPs is very sensitive to surface structures. To measure the microscope field of SPs, the distance between metal surface and optical tip must contain a specific interval.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2005.06a
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• pp.1539-1542
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• 2005

Self-assembled monolayers (SAMs) formed by the adsorption of alkanethiols, $HS(CH_2)_nX$, where X is an organic functional group, onto gold surfaces have attracted widespread interest as templates for the fabrication of molecular and biomolecular microstructures. Previously photopatterning has been thought of as being restricted to the micron scale, because of the wellknown diffraction limit. So, we have explored a novel approach to nanofabrication by utilizing a femtosecond laser coupled to a near-field scanning optical microscope (NSOM).

• Journal of the Korean Society for Precision Engineering
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• v.22 no.12 s.177
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• pp.7-15
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• 2005

• Korean Journal of Optics and Photonics
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• v.10 no.4
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• pp.267-272
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• 1999

We attached a fiber tip on the branch of a quartz crystal oscillator in order to make a feedback control system for near field optical microscope. The electrical impedance of the quartz crystal oscillator depends on the distance between the surface of the sample and the tip caused by the surface damping. Using this method, we can directly monitor the distance between the sample and the tip without inserting extra beam which might give extra optical noise. We characterize the XY scanning resolution and the amplitude of the vibrating tip and the Z-dependent decay of the evanescent wave.