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http://dx.doi.org/10.3807/KJOP.2004.15.1.051

Measurement of surface plasmon using near-field scanning optical microscope  

고선아 (한양대학교 물리학과 마이크로광학 국가지정연구실)
이관수 (한양대학교 물리학과 마이크로광학 국가지정연구실)
박승룡 (한양대학교 물리학과 마이크로광학 국가지정연구실)
윤재웅 (한양대학교 물리학과 마이크로광학 국가지정연구실)
송석호 (한양대학교 물리학과 마이크로광학 국가지정연구실)
김필수 (한양대학교 물리학과 마이크로광학 국가지정연구실)
오차환 (한양대학교 물리학과 마이크로광학 국가지정연구실)
Publication Information
Korean Journal of Optics and Photonics / v.15, no.1, 2004 , pp. 51-55 More about this Journal
Abstract
Surface plasmons (SPs) are charge density oscillations that propagate along an interface between a dielectric and metal. In this paper, the electric field of SPs and the intereference of two SPs are observed by using Near-field Scanning Optical Microscope (NSOM). The excitation condition of SPs is changed as the optical tip approaches the metal surface, because the excitation condition of SPs is very sensitive to surface structures. To measure the microscope field of SPs, the distance between metal surface and optical tip must contain a specific interval.
Keywords
surface plasmon; near-field scanning optical microscope.;
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