• Title/Summary/Keyword: moving average process

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[ $\overline{X}$ ] Chart with Geometrically Adjusted Control Limits under Continually Improving Processes (지속적으로 향상되는 공정에서 기하 조정 관리한계를 사용한 $\overline{X}$ 관리도)

  • Ryu, Mi-Jung;Park, Chang-Soon
    • Journal of Korean Society for Quality Management
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    • v.34 no.4
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    • pp.125-132
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    • 2006
  • An adjusted control limit of the $\overline{X}$ chart is proposed for monitoring the continually improving processes. The continual improvement of the process implies the decrease of the process variance, which is represented by a logistic curve. The process standard deviation is estimated by the exponentially weighted moving average of the sample standard deviations from the past to the current times. The control limits are adjusted by the estimated standard deviation at every sampling time. The performance of the adjusted control limit is compared with that of the standard control limits for various cases of the decreasing speed and size of the variance. The results show that the $\overline{X}$ chart with the adjusted control limits provides better performances for monitoring the small and moderate shifts in continually improving processes.

An Adaptive Moving Average (A-MA) Control Chart with Variable Sampling Intervals (VSI) (가변 샘플링 간격(VSI)을 갖는 적응형 이동평균 (A-MA) 관리도)

  • Lim, Tae-Jin
    • Journal of Korean Institute of Industrial Engineers
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    • v.33 no.4
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    • pp.457-468
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    • 2007
  • This paper proposes an adaptive moving average (A-MA) control chart with variable sampling intervals (VSI) for detecting shifts in the process mean. The basic idea of the VSI A-MA chart is to adjust sampling intervals as well as to accumulate previous samples selectively in order to increase the sensitivity. The VSI A-MA chart employs a threshold limit to determine whether or not to increase sampling rate as well as to accumulate previous samples. If a standardized control statistic falls outside the threshold limit, the next sample is taken with higher sampling rate and is accumulated to calculate the next control statistic. If the control statistic falls within the threshold limit, the next sample is taken with lower sampling rate and only the sample is used to get the control statistic. The VSI A-MA chart produces an 'out-of-control' signal either when any control statistic falls outside the control limit or when L-consecutive control statistics fall outside the threshold limit. The control length L is introduced to prevent small mean shifts from being undetected for a long period. A Markov chain model is employed to investigate the VSI A-MA sampling process. Formulae related to the steady state average time-to signal (ATS) for an in-control state and out-of-control state are derived in closed forms. A statistical design procedure for the VSI A-MA chart is proposed. Comparative studies show that the proposed VSI A-MA chart is uniformly superior to the adaptive Cumulative sum (CUSUM) chart and to the Exponentially Weighted Moving Average (EWMA) chart, and is comparable to the variable sampling size (VSS) VSI EWMA chart with respect to the ATS performance.

Extreme Value of Moving Average Processes with Negative Binomial Noise Distribution

  • Park, You-Sung
    • Journal of the Korean Statistical Society
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    • v.21 no.2
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    • pp.167-177
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    • 1992
  • In this paper, we investigate the limiting distribution of $M_n = max (X_1, X-2, \cdots, X_n)$ in the infinite moving average process ${X_t = \sum c_i Z_{t-i}}$ generated from i.i.d. negative binomial variables $Z_i$'s. While no limit result is possible, nonetheless asymptotic bounds are derived. We also present the tail behavior of $X_t$, i.e., weighted sum of i.i.d. random variables. This continues a study made by Rootzen (1986) for discrete innovation sequences.

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Adaptive Exponentially Weighted Moving Average Control Chart Using a Kalman Filter (칼만필터를 적용한 Adaptive EWMA관리도)

  • 김양호;정윤성;김광섭
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.16 no.28
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    • pp.93-101
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    • 1993
  • In this paper, two adaptive exponentially weighted moving avenge control chart schemes which available for real-time are proposed. The weighting coefficient is estimated using a recursive kalman filter algorithm. Simulated average run lengths indicate the proposed schemes are sensitive to process shifts And their performance is comparable to CUSUM control chart and customary EWMA control chart.

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Unit Root Tests for Autoregressive Moving Average Processes Based on M-estimators

  • Shin, Dong-Wan;Lee, Oesook
    • Journal of the Korean Statistical Society
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    • v.31 no.3
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    • pp.301-314
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    • 2002
  • For autoregressive moving average (ARMA) models, robust unit root tests are developed using M-estimators. The tests are parametric in the sense ARMA parameters are estimated jointly with unit roots. A Monte-Carlo experiment reveals superiority of the parametric tests over the semipararmetric tests of Lucas (1995a) in terms of both empirical sizes and powers.

ON THE COMPLETE MOMENT CONVERGENCE OF MOVING AVERAGE PROCESSES GENERATED BY ρ*-MIXING SEQUENCES

  • Ko, Mi-Hwa;Kim, Tae-Sung;Ryu, Dae-Hee
    • Communications of the Korean Mathematical Society
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    • v.23 no.4
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    • pp.597-606
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    • 2008
  • Let {$Y_{ij}-{\infty}\;<\;i\;<\;{\infty}$} be a doubly infinite sequence of identically distributed and ${\rho}^*$-mixing random variables with zero means and finite variances and {$a_{ij}-{\infty}\;<\;i\;<\;{\infty}$} an absolutely summable sequence of real numbers. In this paper, we prove the complete moment convergence of {${\sum}^n_{k=1}\;{\sum}^{\infty}_{i=-{\infty}}\;a_{i+k}Y_i/n^{1/p}$; $n\;{\geq}\;1$} under some suitable conditions. We extend Theorem 1.1 of Li and Zhang [Y. X. Li and L. X. Zhang, Complete moment convergence of moving average processes under dependence assumptions, Statist. Probab. Lett. 70 (2004), 191.197.] to the ${\rho}^*$-mixing case.

Complete Moment Convergence of Moving Average Processes Generated by Negatively Associated Sequences

  • Ko, Mi-Hwa
    • Communications for Statistical Applications and Methods
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    • v.17 no.4
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    • pp.507-513
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    • 2010
  • Let {$X_i,-{\infty}$ < 1 < $\infty$} be a doubly infinite sequence of identically distributed and negatively associated random variables with mean zero and finite variance and {$a_i,\;-{\infty}$ < i < ${\infty}$} be an absolutely summable sequence of real numbers. Define a moving average process as $Y_n={\sum}_{i=-\infty}^{\infty}a_{i+n}X_i$, n $\geq$ 1 and $S_n=Y_1+{\cdots}+Y_n$. In this paper we prove that E|$X_1$|$^rh$($|X_1|^p$) < $\infty$ implies ${\sum}_{n=1}^{\infty}n^{r/p-2-q/p}h(n)E{max_{1{\leq}k{\leq}n}|S_k|-{\epsilon}n^{1/p}}{_+^q}<{\infty}$ and ${\sum}_{n=1}^{\infty}n^{r/p-2}h(n)E{sup_{k{\leq}n}|k^{-1/p}S_k|-{\epsilon}}{_+^q}<{\infty}$ for all ${\epsilon}$ > 0 and all q > 0, where h(x) > 0 (x > 0) is a slowly varying function, 1 ${\leq}$ p < 2 and r > 1 + p/2.

Power Enhanced Design of Robust Control Charts for Autocorrelated Processes : Application on Sensor Data in Semiconductor Manufacturing (검출력 향상된 자기상관 공정용 관리도의 강건 설계 : 반도체 공정설비 센서데이터 응용)

  • Lee, Hyun-Cheol
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.34 no.4
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    • pp.57-65
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    • 2011
  • Monitoring auto correlated processes is prevalent in recent manufacturing environments. As a proactive control for manufacturing processes is emphasized especially in the semiconductor industry, it is natural to monitor real-time status of equipment through sensor rather than resultant output status of the processes. Equipment's sensor data show various forms of correlation features. Among them, considerable amount of sensor data, statistically autocorrelated, is well represented by Box-Jenkins autoregressive moving average (ARMA) model. In this paper, we present a design method of statistical process control (SPC) used for monitoring processes represented by the ARMA model. The proposed method shows benefits in the power of detecting process changes, and considers robustness to ARMA modeling errors simultaneously. We prove benefits through Monte carlo simulation-based investigations.

Study on Control Model Based on Signal Processing In End-Milling Process (엔드밀 공정에서의 신호처리에 따른 제어모델에 관한 연구)

  • 양우석;이건복
    • Proceedings of the Korean Society of Machine Tool Engineers Conference
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    • 2001.04a
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    • pp.192-196
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    • 2001
  • This work describes the modeling of cutting process for feedback control based on signal processing in end-milling. Here, cutting force is used to design control model by a variety of schemes which are moving average, ensemble average, peak value, root mean square and analog low-pass filtering. It is expected that each model offers its own peculiar advantage in following cutting force control.

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Exponentially Weighted Moving Average Chart for High-Yield Processes

  • Kotani, Takayuki;Kusukawa, Etsuko;Ohta, Hiroshi
    • Industrial Engineering and Management Systems
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    • v.4 no.1
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    • pp.75-81
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    • 2005
  • Borror et al. discussed the EWMA(Exponentially Weighted Moving Average) chart to monitor the count of defects which follows the Poisson distribution, referred to the $EWMA_c$ chart, as an alternative Shewhart c chart. In the $EWMA_c$ chart, the Markov chain approach is used to calculate the ARL (Average Run Length). On the other hand, in order to monitor the process fraction defectives P in high-yield processes, Xie et al. presented the CCC(Cumulative Count of Conforming)-r chart of which quality characteristic is the cumulative count of conforming item inspected until observing $r({\geq}2)$ nonconforming items. Furthermore, Ohta and Kusukawa presented the $CS(Confirmation Sample)_{CCC-r}$ chart as an alternative of the CCC-r chart. As a more superior chart in high-yield processes, in this paper we present an $EWMA_{CCC-r}$ chart to detect more sensitively small or moderate shifts in P than the $CS_{CCC-r}$ chart. The proposed $EWMA_{CCC-r}$ chart can be constructed by applying the designing method of the $EWMA_C$ chart to the CCC-r chart. ANOS(Average Number of Observations to Signal) of the proposed chart is compared with that of the $CS_{CCC-r}$ chart through computer simulation. It is demonstrated from numerical examples that the performance of proposed chart is more superior to the $CS_{CCC-r}$ chart.