• Title/Summary/Keyword: memory test

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A Study on the Built-in Test Circuit Design for Parallel Testing of CAM(Content Addressable Memory) (CAM(Content Addressable Memory)의 병렬테스팅을 위한 Built-in 테스트회로 설계에 관한 연구)

  • 조현묵;박노경;차균현
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.19 no.6
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    • pp.1038-1045
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    • 1994
  • In this paper, algorithm and built-in test circuit for testing all PSF(Pattern Sensitive Fault) occuring in CAM(Content Addressable Memory) are proposed. That is, built-in test circuit that uses minimum additional circuit without external equipment is designed. Additional circuit consist`s of parallel comparator, error detector, and modified decoder for parallel testing. Besides, the study on eulerian path for effectiv test pattern is carried out simultaneously. Consequently, using proposed algorithm, we can test all contents of CAM with 325+2b(b:number of bits) operations regardless of number of words. The area occupied by test circuit is about 7.5% of total circuit area.

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Development of a ROM Writer for Shmoo Test of a Flash Memory Integrated into the MCU (MCU에 내장된 플레쉬 메모리 오동작 테스트 가능한 ROM Writer 개발)

  • Kim, Tae-Sun;Park, Cha-Hun
    • Journal of Korea Society of Industrial Information Systems
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    • v.20 no.4
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    • pp.103-109
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    • 2015
  • This paper presents the development of a ROM writer for shmoo test of a flash memory integrated into the MCU(Micro Controller Unit). A shmoo test is a graphical display of the response of a component or system varying over a range of conditions and inputs. Often used to represent the results of the testing of complex electronic systems such as computers or integrated circuits such as DRAMs, ASICs or microprocessors. A shmoo test and data write time(32k) of the development ROM writer is 6.4 seconds, which was improved by about 20% compared to the rate of the currently used ROM writer.

A Concurrent Testing of DRAMs Utilizing On-Chip Networks (온칩네트워크를 활용한 DRAM 동시 테스트 기법)

  • Lee, Changjin;Nam, Jonghyun;Ahn, Jin-Ho
    • Journal of the Semiconductor & Display Technology
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    • v.19 no.2
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    • pp.82-87
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    • 2020
  • In this paper, we introduce the novel idea to improve the B/W usage efficiency of on-chip networks used for TAM to test multiple DRAMs. In order to avoid the local bottleneck of test packets caused by an ATE, we make test patterns using microcode-based instructions within ATE and adopt a test bus to transmit test responses from DRAM DFT (Design for Testability) called Test Generator (TG) to ATE. The proposed test platform will contribute to increasing the test economics of memory IC industry.

Assessment of long-term working memory by a delayed nonmatch-to-place task using a T-maze

  • Kim, Jung-Eun;Choi, Jun-Hyeok;Kaang, Bong-Kiun
    • Animal cells and systems
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    • v.14 no.1
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    • pp.11-15
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    • 2010
  • Long-term working memory (LTWM) is a subdivision concept of working memory and indicates the enhancement of performance in a working memory task. LTWM has been shown in humans who have been engaged in a specific task requiring working memory over a long time. However, there is very little understanding of the exact mechanism of LTWM because of limitations of experimental methods in human studies. We have modified the standard T-maze task, which is used to test working memory in mice, to demonstrate LTWM in an animal model. We observed an enhancement of performance by repeated experience with the same working memory load in mice, which can be regarded as an LTWM. This effect seems to depend on the condition wherein a delay was given. This task may be a good experimental protocol to assess LTWM in animal studies.

Design of BIST Circuits for Test Algorithms Using VHDL (VHDL을 이용한 테스트 알고리즘의 BIST 회로 설계)

  • 배성환;신상근;김대익;이창기;전병실
    • The Journal of the Acoustical Society of Korea
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    • v.18 no.1
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    • pp.67-71
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    • 1999
  • In this paper, we design circuits embedded in memory chip which perform memory testing algorithms using BIST scheme to reduce testing time and cost for testing. In order to implement circuits for MSCAN, Marching and checkerboard test algorithms, which have widely used in memory testing, we survey structure of the BIST circuits and describe each block of BIST circuits by using VHDL. Thereafter, We verify behavior of each VHDL coding block and extract BIST circuits for target testing algorithms by CAD tool for simulation and synthesis. Extracted circuits have very low area overhead.

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The design to the periphery circuit for operaton and characteristic assessment of the Nano Floating Gate Memory (Nano Floating Gate Memory 의 동작 및 특성 평가를 위한 주변회로 설계)

  • Park, Kyung-Soo;Choi, Jae-Won;Kim, Si-Nae;Yoon, Han-Sub;Kwack, Kae-Dal
    • Proceedings of the IEEK Conference
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    • 2006.06a
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    • pp.647-648
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    • 2006
  • This paper presents the design results of peripheral circuits of non-volatile memory of nano floating gate cells. The designed peripheral circuits included command decoder, decoders, sense amplifiers and oscillator, which are targeted with 0.35um technology EEPROM process for operating test and reliable test. The simulation results show each operation and test mode of output voltage for word line, bit line, well and operating of sense amplifier.

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Study on the Activation Energy of Charge Migration for 3D NAND Flash Memory Application (3차원 플래시 메모리의 전하 손실 원인 규명을 위한 Activation Energy 분석)

  • Yang, Hee Hun;Sung, Jae Young;Lee, Hwee Yeon;Jeong, Jun Kyo;Lee, Ga won
    • Journal of the Semiconductor & Display Technology
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    • v.18 no.2
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    • pp.82-86
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    • 2019
  • The reliability of 3D NAND flash memory cell is affected by the charge migration which can be divided into the vertical migration and the lateral migration. To clarify the difference of two migrations, the activation energy of the charge loss is extracted and compared in a conventional square device pattern and a new test pattern where the perimeter of the gate is exaggerated but the area is same. The charge loss is larger in the suggested test pattern and the activation energy is extracted to be 0.058 eV while the activation energy is 0.28 eV in the square pattern.

An exprimental Study of the Effects of Yukmijiwhangtanggamibang on Growth, Learning and Memory of Rats (육미지황탕가미방(六味地黃湯加味方)이 흰쥐의 성장(成長)과 학습(學習) 및 기억(記憶)에 미치는 영향(影響))

  • Koo, Jin-Suk;Kim, Jang-Hyun
    • The Journal of Pediatrics of Korean Medicine
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    • v.19 no.1
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    • pp.67-82
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    • 2005
  • Objectives : This study was conducted to find out the effect of Yukmijiwhangtanggamibang (YM) on growth, learning and memory of rats. Methods : It was divided SD rats into Sham group, 192 Saporin injection(SA+Saline) group and Injection of 192 Saporin with YM(SA+YM) group. Growth measure length of bone and tail. Memory performance was used aquisition test and learning retention of morris water maze. It was detected acetylcholinesterase(AChE), cholineacetyltransferase(ChAT) at medial septum and hippocampus by immunohistochemistry Results : Body Weight of the SA+YM Group increased effectively, as compared with SA Saline group. Growth of bone in the SA+YM Group increased effectively, as compared with SA+Saline group. Growth of Tail in the SA+YM Group increased effectively, as compared with SA_Saline group. The SA+YM Group in Aquisition Test improved effectively, as compared with SA+Saline group. The SA+YM Group in Learning Test improved effectively, as compared with SA+Saline group. The numbers of ChAT cells in Medial septum increased effectively, as compared with SA+Saline group. The numbers of ChAT cells in CA1 of Hippocampus increased, but was not effective. Conclusion : These results suggest that YM has an improving effect on the impaired learning through the effects on memory registration and retrieval.

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Protective Effect of Arabinoxylan against Scopolamine-Induced Learning and Memory Impairment

  • Kim, Chang-Yul;Lee, Gil-Yong;Park, Gyu Hwan;Lee, Jongwon;Jang, Jung-Hee
    • Biomolecules & Therapeutics
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    • v.22 no.5
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    • pp.467-473
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    • 2014
  • The purpose of this study is to investigate the memory enhancing effect and underlying molecular mechanism of arabinoxylan (AX), a major component of dietary fiber in wheat against scopolamine (SCO)-induced amnesia in Sprague-Dawley (SD) rats. Diverse behavior tests including Y-maze, Morris water maze, and passive avoidance tests were performed to measure cognitive functions. SCO significantly decreased the spontaneous alterations in Y-maze test and step-through latency in passive avoidance test, whereas increased time spent to find the hidden platform in Morris water maze test compared with the sham control group. In contrast, oral administration of AX (25 mg/kg and 50 mg/kg) effectively reversed the SCO-induced cognitive impairments in SD rats. Furthermore, AX treatment up-regulated the expression of brain-derived neurotrophic factor (BDNF) in the cortex and hippocampus via promoting activation of cAMP response element binding protein (CREB). Therefore, our findings suggest that AX can improve SCO-induced learning and memory impairment possibly through activation of CREB and up-regulation of BDNF levels, thereby exhibiting a cognition-enhancing potential.

The Ameliorating Effect of Kyung-Ok-Go on Menopausal Syndrome Observed in Ovariectomized Animal Model (난소 절제 동물모델을 이용한 경옥고의 갱년기 증후군 개선 효과)

  • Cho, Kyungnam;Jung, Seo Yun;Bae, Ho Jung;Ryu, Jong Hoon
    • Korean Journal of Pharmacognosy
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    • v.51 no.4
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    • pp.310-316
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    • 2020
  • Kyung-Ok-Go (KOK) is a traditional prescription used for debilitating natural aging and post-illness debilitation. KOK has been used in a variety of ways because it strengthens immunity, prevents illness, and helps recovery in case of illness. In particular, recent research has revealed that KOK helps improve memory and cognition. Therefore, in this study, we investigated whether KOK was effective in improving memory decline and depression-state observed during menopause. In the present study, we employed ovariectomized mouse as an animal model for measuring menopausal syndrome. The administration of KOK for 8 weeks, the object recognition memory and working memory were improved in novel object recognition test and Y-maze test. And in the forced swimming test, the immobility time were decreased. Additionally, the expression level of mature brain derived neurotropic factor (mBDNF) was increased by KOK administration in ovariectomized mouse hippocampus. These results suggested that KOK could improve cognitive decline and depression during menopausal period, and it might be come from enhancing expression level of mBDNF in hippocampus.