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http://dx.doi.org/10.9723/jksiis.2015.20.4.103

Development of a ROM Writer for Shmoo Test of a Flash Memory Integrated into the MCU  

Kim, Tae-Sun (경운대학교 항공전자공학과)
Park, Cha-Hun (경운대학교 항공전자공학과)
Publication Information
Journal of Korea Society of Industrial Information Systems / v.20, no.4, 2015 , pp. 103-109 More about this Journal
Abstract
This paper presents the development of a ROM writer for shmoo test of a flash memory integrated into the MCU(Micro Controller Unit). A shmoo test is a graphical display of the response of a component or system varying over a range of conditions and inputs. Often used to represent the results of the testing of complex electronic systems such as computers or integrated circuits such as DRAMs, ASICs or microprocessors. A shmoo test and data write time(32k) of the development ROM writer is 6.4 seconds, which was improved by about 20% compared to the rate of the currently used ROM writer.
Keywords
memory test; shmoo test; rom writer;
Citations & Related Records
Times Cited By KSCI : 3  (Citation Analysis)
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