• Title/Summary/Keyword: maximum lifetime

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Effect of under-bump-metallization structure on electromigration of Sn-Ag solder joints

  • Chen, Hsiao-Yun;Ku, Min-Feng;Chen, Chih
    • Advances in materials Research
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    • v.1 no.1
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    • pp.83-92
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    • 2012
  • The effect of under-bump-metallization (UBM) on electromigration was investigated at temperatures ranging from $135^{\circ}C$ to $165^{\circ}C$. The UBM structures were examined: 5-${\mu}m$-Cu/3-${\mu}m$-Ni and $5{\mu}m$ Cu. Experimental results show that the solder joint with the Cu/Ni UBM has a longer electromigration lifetime than the solder joint with the Cu UBM. Three important parameters were analyzed to explain the difference in failure time, including maximum current density, hot-spot temperature, and electromigration activation energy. The simulation and experimental results illustrate that the addition 3-${\mu}m$-Ni layer is able to reduce the maximum current density and hot-spot temperature in solder, resulting in a longer electromigration lifetime. In addition, the Ni layer changes the electromigration failure mode. With the $5{\mu}m$ Cu UBM, dissolution of Cu layer and formation of $Cu_6Sn_5$ intermetallic compounds are responsible for the electromigration failure in the joint. Yet, the failure mode changes to void formation in the interface of $Ni_3Sn_4$ and the solder for the joint with the Cu/Ni UBM. The measured activation energy is 0.85 eV and 1.06 eV for the joint with the Cu/Ni and the Cu UBM, respectively.

Interface Passivation Properties of Crystalline Silicon Wafer Using Hydrogenated Amorphous Silicon Thin Film by Hot-Wire CVD (열선 CVD법으로 증착된 비정질 실리콘 박막과 결정질 실리콘 기판 계면의 passivation 특성 분석)

  • Kim, Chan-Seok;Jeong, Dae-Young;Song, Jun-Yong;Park, Sang-Hyun;Cho, Jun-Sik;Yoon, Kyoung-Hoon;Song, Jin-Soo;Kim, Dong-Hwan;Yi, Jun-Sin;Lee, Jeong-Chul
    • 한국신재생에너지학회:학술대회논문집
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    • 2009.06a
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    • pp.172-175
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    • 2009
  • n-type crystalline silicon wafers were passivated with intrinsic a-Si:H thin films on both sides using HWCVD. Minority carrier lifetime measurement was used to verify interface passivation properties between a-Si:H thin film and crystalline Si wafer. Thin film interface characteristics were investigated depending on $H_2/SiH_4$ ratio and hot wire deposition temperature. Vacuum annealing were processed after deposition a-Si:H thin films on both sides to investigate thermal effects from post process steps. We noticed the effect of interface passivation properties according to $H_2/SiH_4$ ratio and hot wire deposition temperature, and we had maximum point of minority carrier lifetime at H2/SiH4 10 ratio and $1600^{\circ}C$ wire temperature.

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Determination of indoor doses and excess lifetime cancer risks caused by building materials containing natural radionuclides in Malaysia

  • Abdullahi, Shittu;Ismail, Aznan Fazli;Samat, Supian
    • Nuclear Engineering and Technology
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    • v.51 no.1
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    • pp.325-336
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    • 2019
  • The activity concentrations of $^{226}Ra$, $^{232}Th$, and $^{40}K$ from 102 building materials samples were determined using a high-purity germanium (HPGe) detector. The activity concentrations were evaluated for possible radiological hazards to the human health. The excess lifetime cancer risks (ELCR) were also estimated, and the average values were recorded as $0.42{\pm}0.24{\times}10^{-3}$, $3.22{\pm}1.83{\times}10^{-3}$, and $3.65{\pm}1.85{\times}10^{-3}$ for outdoor, indoor, and total ELCR respectively. The activity concentrations were further subjected to RESRAD-BUILD computer code to evaluate the long-term radiation exposure to a dweller. The indoor doses were assessed from zero up to 70 years. The simulation results were $92{\pm}59$, $689{\pm}566$, and $782{\pm}569{\mu}Sv\;y^{-1}$ for indoor external, internal, and total effective dose equivalent (TEDE) respectively. The results reported were all below the recommended maximum values. Therefore, the radiological hazards attributed to building materials under study are negligible.

An Estimation of Parameters in Weibull Distribution Using Least Squares Method under Random Censoring Model (임의 중단모형에서 최소제곱법을 이용한 와이블분포의 모수 추정)

  • Lee, Woo-Dong
    • Journal of the Korean Data and Information Science Society
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    • v.7 no.2
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    • pp.263-272
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    • 1996
  • In this parer, under random censorship model, an estimation of scale and shape parameters in Weibull lifetime model is considered. Based on nonparametric estimator of survival function, the least square method is proposed. The proposed estimation method is simple and the performance of the proposed estimator is as efficient as maximum likelihood estimators. An example is presented, using field winding data. Simulation studies are performed to compare the performaces of the proposed estimator and maximum likelihood estimator.

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Estimation of Fatigue Damage Due to Rolling Contact in a Railway Wheel Using FEM Analysis (유한요소법을 이용한 철도 차륜에서 구름 접촉으로 인한 피로손상 평가)

  • Lee, Sang-Hoon;Kim, Ho-Kyung
    • Journal of the Korean Society of Safety
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    • v.26 no.3
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    • pp.1-7
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    • 2011
  • Fatigue damage on the train wheel surface was estimated by considering the effect of friction coefficient of rolling on the contact surface between the wheel and rail during operation. From FEM analys, the maximum Tresca stress was 550.7 MPa at a depth of 2.07 mm under the maximum contact pressure ($P_{max}$ = 894.3 MPa) between wheel and rail. The maximum stress continued to increase along with the increase in the frictional coefficient. The fatigue initiation lifetime of the wheel by the rolling contact was predicted using the Smith-Watson-Topper (SWT) equation and the maximum principal strain equation (${\varepsilon}$-N).

Excitation energy transfer from carotenoids probed by femtosecond time-resolved fluorescence spectroscopy

  • Akimoto, Seiji;Yamazaki, Iwao;Mimuro, Mamoru
    • Journal of Photoscience
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    • v.9 no.2
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    • pp.78-81
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    • 2002
  • Fluorescence rise and decay curves of carotenoids were measured in solutions and in pigment protein complexes with a femtosecond time-resolved fluorescence spectroscopy. For linear carotenoids, the S$_2$ lifetimes showed the maximum value around n = 9-10. The conjugation of a keto-carbonyl group shortened the S$_2$lifetime and prolonged the S$_1$lifetime. The excitation relaxation dynamics within carotenoids and the excitation energy transfer kinetics from carotenoids to chlorophylls are discussed as a function of molecular structure of carotenoids.

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Lifetime Estimation for Mixed Replacement Grouped Data in Competing Failures Model

  • Lee, Tai-Sup;Yun, Sang-Un
    • International Journal of Reliability and Applications
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    • v.2 no.3
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    • pp.189-197
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    • 2001
  • The estimation of mean lifetimes in presence of interval censoring with mixed replacement procedure is examined when the distributions of lifetimes are exponential. It is assumed that, due to physical restrictions and/or economic constraints, the number of failures is investigated only at several inspection times during the lifetime test; thus there is interval censoring. The maximum likelihood estimator is found in an implicit form. The Cramor-Rao lower bound, which is the asymptotic variance of the estimator, is derived. The estimation of mean lifetimes for competing failures model has been expanded.

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Evaluation of Multiaxial Fatigue Strength of a Urban Railway Wheel Steel (도시철도 차량 차륜재의 다축 피로강도 평가)

  • Ahn, Jong-Gon;You, In-Dong;Kwon, Seok-Jin;Kim, Ho-Kyung
    • Journal of the Korean Society of Safety
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    • v.27 no.2
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    • pp.1-6
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    • 2012
  • Uniaxial and biaxial torsional fatigue tests were conducted on the samples extracted from urban railway wheel steel. Ultimate and yield strengths of the steel were 1027.7 MPa and 626 MPa, respectively. The uniaxial fatigue limit was 422.5 MPa, corresponding 67% of the ultimate tensile strength. The ratio of ${\tau}_e/{\sigma}_e$ was 0.63. Fatigue strength coefficient and exponent were 1319.5 MPa and 0.339, respectively. Maximum principal and equivalent strain were found to be adequate parameter to predict fatigue lifetime of the steel under multiaixal fatigue condition.

Development of Reliability Acceptance Sampling Plan for the Exponential Lifetime Distribution under Periodic Inspection and Type I Censoring (수명이 지수분포를 따를 때 정기검사 및 정시종결하에서 신뢰성 샘플링검사계획의 개발)

  • 서순근;김갑석
    • Journal of the Korean Operations Research and Management Science Society
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    • v.21 no.1
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    • pp.115-129
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    • 1996
  • A reliability Acceptance Sampling Plan (RASP) is developed for testing the exponential mean lifetime under the periodic (i. e., equally-spaced) inspection and Type I censoring. Under the periodic inspection, the exact sampling distribution of maximum likelihood (ML) estimator of mean can not be derived. Hence sample size and acceptance criterion are determined by the algorithm proposed on the basis of Monte Carlo simulation such that the producer's and consumer's risks are satisfied for given censoring time and number of inspections. In addition, the developed RASP is compared in terms of sampling size, OC curve, and expected completion time. The effects for the RASP by the chosen inspection scheme are also discussed.

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Estimating the Probability of Perfect PM in the Brown-Proschan Imperfect PM Model (Brown-Proschan 불완전 PM 모형에서 완전 PM 확률의 추정)

  • 임태진
    • Journal of the Korean Operations Research and Management Science Society
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    • v.22 no.4
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    • pp.151-165
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    • 1997
  • We propose a method for estimating the probability of perfect PM from successive failure times of a repairable system. The system under study is maintained preventively at periodic times, and it undergoes minimal repair at failure. We consider Brown-Proschan imperfect PM model in which the system is restored to a condition as good as new with probability P and is otherwise restored to its condition just prior to failure. We discuss the identifiability problem when the PM modes are not recorded. The expectation-maximization principle is employed to handle the incomplete data problem. We assume that the lifetime distribution belongs to a parametric family with increasing failure rate. For the two parameter Weibull lifetime distribution, we propose a specific algorithm for finding the maximum lifelihood estimates of the reliability parameters : the probability of perfect PM (P), as well as the distribution parameters. The estimation method will provide useful results for maintaining real systems.

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