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검색결과 392건 처리시간 0.035초

CMOS 공정에 적합한 AlN 압전 마이크로 발전기의 제작 및 특성 (Fabrication of AlN piezoelectric micro power generator suitable with CMOS process and its characteristics)

  • 정귀상;이병철
    • 센서학회지
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    • 제19권3호
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    • pp.209-213
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    • 2010
  • This paper describes the fabrication and characteristics of AlN piezoelectric MPG(micro power generator). The micro energy harvester was fabricated to convert ambient vibration energy to electrical power as a AlN piezoelectric cantilever with Si proof-mass. To be compatible with CMOS process, AlN thin film was grown at low temperature by RF magnetron sputtering and micro power generators were fabricated by MEMS technologies. X-ray diffraction pattern proved that the grown AlN film had highly(002) orientation with low value of FWHM(full width at the half maximum, $\theta=0.276^{\circ}$) in the rocking curve around(002) reflections. The implemented harvester showed the $198.5\;{\mu}m$ highest membrane displacement and generated 6.4 nW of electrical power to $80\;k{\Omega}$ resistive load with $22.6\;mV_{rms}$ voltage from 1.0 G acceleration at its resonant frequency of 389 Hz. From these results, the AlN piezoelectric MPG will be possible to suitable with the batch process and confirm the possibility for power supply in portable, mobile and wearable microsystems.

저온공정을 이용한 AlN 박막의 우선배향성과 모폴로지에 관한 연구 (The preferred orientation and morphology characteristics of AlN thin films prepared by RF power under Room Temperature process)

  • 오수영;이태용;김응권;강현일;송준태
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2007년도 추계학술대회 논문집
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    • pp.313-314
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    • 2007
  • AlN is used a wide variety of applications such as electroacoustic devices, blue diode and metal-insulator-semiconductor structures. AlN thin films were deposited on Si substrates by rf sputter technique with low temperature process. The orientation and morphology of AlN thin films at various power in the range from 150 to 300 w was studied. X-ray diffraction (XRD), full width at half-maximum (FWHM) and field emission scanning electron microscopy were employed to characterize the deposited films. The c-axis orientation along (002) Plane at experimental results was enhanced with the increasing of the rf power from 150 to 300 w and the surface morphology of the films showed a homogeneous and nano-sized microstructure.

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p형 반전층을 갖는 ZnO계 자외선 수광소자의 설계 및 제작에 관한 연구 (A Study on the Design and Fabrication of ZnO Based UV Photodetector with p-type Inversion Layer)

  • 오상현;김호걸;박춘배
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2007년도 하계학술대회 논문집 Vol.8
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    • pp.370-371
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    • 2007
  • To investigate the ZnO thin films which are interested in the next generation of short wavelength LEDs and Lasers and UV photodetector with p-type inversion layer, the ZnO thin films were deposited by. RF sputtering system. Substrate temperature and work pressure is $100^{\circ}C$ and 15 mTorr, respectively, and the purity of ZnO target is 5N. The ZnO thin films were deposited at $100^{\circ}C$, $200^{\circ}C$, $300^{\circ}C$, and $400^{\circ}C$. For sample deposited at $300^{\circ}C$, we observed full width at half maximum (FWHM) of 0.240 and good surface morphology.

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Properties of Infrared Detector and Growth for HgCdTe Epilayers

  • 홍광준;유상하
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2003년도 추계학술대회 논문집 Vol.16
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    • pp.116-119
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    • 2003
  • [ $Hg_{1-x}Cd_xTe$ ] (MCT) was grown by hot wall epitaxy method. Prior to the MCT growth, the CdTe (111) buffer layer was grown on the GaAs substrate at the temperature of 590 C for 15 min. When the thickness of the CdTe buffer layer was 5 m or thicker, the full width at half maximum values obtained from the x-ray rocking curves were found to significantly decrease. After a good quality CdTe buffer layer was grown, the MCT epilayers were grown on the CdTe (111) /GaAs substrate at various temperature in situ. The crystal quality for those epilayers was investigated by means of the x-ray rocking curves and the photocurrent experiment. The photoconductor characterization for the epilayers was also measured. The energy band gap of MCT was determined from the photocurrent measurement and the x composition rates from the temperature dependence of the energy band gap were turned out.

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Photoluminescence Studies of ZnO Nanostructures Fabricated by Using Combination of Hydrothermal Method and Plasma-Assisted Molecular Beam Epitaxy Regrowth

  • Nam, Giwoong;Kim, Byunggu;Park, Youngbin;Kim, Soaram;Lee, Sang-Heon;Kim, Jong Su;Leem, Jae-Young
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2013년도 제45회 하계 정기학술대회 초록집
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    • pp.202.1-202.1
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    • 2013
  • ZnO nanostructure was fabricated on a Si substrate using two-step growth. The seed layer was grown on the Si substrate by a sol-gel spin-coating. In the first step, ZnO nanorods were grown by a hydrothermal method at $140^{\circ}C$ for 5 min. In the second step, a ZnO thin film was grown on the ZnO nanorods by spin-coating. After growth, these films were annealed at $800^{\circ}C$ for 10 min. Electrical and optical properties of ZnO nanostructures have modified by plasma-assisted molecular beam epitaxy (PA-MBE) regrowth. The carrier concentration and resistivity increased by PA-MBE regrowth. In the photoluminescence, the full width at half maximum and intensity were decreased and increased, respectively, by PA-MBE regrowth.

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Cascaded Volume Bragg Grating for Narrow Spectral Linewidth in High-power Laser Diodes

  • Lee, Dong-Jin;Shim, Gyu-Beom;Jeong, Ji-Hun;O, Beom-Hoan
    • Current Optics and Photonics
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    • 제6권3호
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    • pp.282-287
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    • 2022
  • Narrowing the spectral linewidth and improving the wavelength stability of high-power laser diodes (HPLDs) are both in high demand for rapidly maturing industrial laser applications. In this study, we investigate the spectral behavior of a commercial HPLD bar module composed of 19 laser diodes (LDs) in a single-layered bar with a built-in volume Bragg grating (VBG) and an additional cascaded VBG. Optical loss due to the extra cascaded VBG is kept below 5% when the optical output is 5 W or more. The full width at half maximum of the Fabry-Perot peak from the cascaded VBG is reduced to about 12.4% and 29.1% at the edge (1st LD) and center (10th LD) of the HPLD bar module respectively, compared to using only a built-in VBG at an optical power of 10 W or more. In addition, fine wavelength tuning is achieved by temperature control of the extra VBG, and the obtained wavelength-tuning range amounts to about 10.6 pm/K.

기판 효과에 따른 저 자장 영역에서의 자기저항 효과에 관한 연구 (The Low-field Tunnel-type Magnetoresistance Characteristics of Thin Films Deposited on Different Substrate)

  • 이희민;심인보;김철성
    • 한국자기학회지
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    • 제12권2호
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    • pp.41-45
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    • 2002
  • 졸-겔법으로 제조된 La/sub 0.7/Pb/sub 0.3/MnO₃(LPM)박막의 기판 효과에 따른 저 자장 영역에서의 터널형 자기저항 효과에 대하여 연구하였다. 다결정 LPMO 박막은 SiO₂/Si(100) 기판과 그 위에 확산 방지막(diffusion barrier)으로 안정화 지르코니아(yttria-stabilized zirconia, YSZ) 중간층을 도입한 기판에 증착하였으며, 반면에 c-축 방향 성장을 갖는 박막의 경우 LaA1O₃(001) (LAO) 단결정 기판을 사용하였다. LPMO/LAO 박막에서의 rocking curve 측정 결과 full width half maximum (FWHM) 값은 0.32°값을 가짐을 알 수 있었다. 상온(300 K)에서 측정한 자기저항비(MR ratio) 값은 500 Oe리 외부자장을 인가시 LPMO/SiO₂/Si 박막의 경우 0.52%, LPMO/YSZ/SiO₂/Si 박막인 경우는 0.68% 그리고, LPMO/LAO의 경우에는 0.4%에도 미치지 못하는 값을 가졌다. 이때 MR최대값을 나타내는 peaks는 자기이력 곡선의 보자력 부근에서 나타남으로 그 두 결과가 잘 일치함을 보여 주고 있다. 이러한 저 자장 영역에서의 자기저항 값의 타이는 박막 시료의 기판 효과에 의한 grain boundary특성의 차이로부터 기인된다.

졸-겔 방법으로 $SiO_2/Si$ 기판 위에 제작된 (Bi,La)$Ti_3O_12$ 강유전체 박막의 특성 연구 (Characterization of (Bi,La)$Ti_3O_12$ Ferroelectric Thin Films on $SiO_2/Si$/Si Substrates by Sol-Gel Method)

  • 장호정;황선환
    • 마이크로전자및패키징학회지
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    • 제10권2호
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    • pp.7-12
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    • 2003
  • 졸-겔(Sol-Gel)법으로 $SiO_2/Si$ 기판 위에 $Bi_{3.3}La_{0.7}O_{12}$(BLT) 강유전체 박막을 스핀코팅하여 Metal-Ferroelectric-Insulator-Silicon 구조의 캐패시터 소자를 제작하였다. 열처리하지 않은 BLT 박막시료를 $650^{\circ}C$$700^{\circ}C$의 온도에서 열처리함으로서 임의 배향을 가지는 퍼롭스카이트 결정구조를 나타내었다. 열처리 온도를 $650^{\circ}C$에서 $700^{\circ}C$로 증가시킴에 따라서 (117) 주피크의 full width at half maximum(FWHM)값이 약 $0.65^{\circ}$에서 $0.53^{\circ}$로 감소하여 결정성이 개선되었으며 결정립 크기와 $R_rms$ 값이 증가하면서 박막표면이 거칠어지는 경향을 보여주었다. $700^{\circ}C$에서 열처리한 BLT 박막시료에 대해 인가 전압에 따른 정전용량(C-V)값을 측정한 결과 5V의 인가전압에서 메모리 원도우 값이 약 0.7V를 보여주었으며, 3V의 인가전압에서 누설전류 값이 약 $3.1{\times}10^{-8}A/cm^2$을 나타내었다.

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스핀코팅 방법으로 제작된 ZnO 나노 섬유질 박막의 전구체 농도에 따른 표면 및 광학적 특성 (Effects of Precursor Concentration on Surface and Optical Properties of ZnO Nano-Fibrous Thin Films Fabricated by Spin-Coating Method)

  • 김민수;김군식;임광국;조민영;전수민;최현영;이동율;김진수;김종수;이주인;임재영
    • 한국진공학회지
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    • 제19권6호
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    • pp.483-488
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    • 2010
  • 스핀코팅 방법을 이용하여 다양한 농도의 전구체로 ZnO 나노 섬유질 박막(ZnO nano-fibrous thin films)을 성장하였고, 그에 따른 표면 및 광학적 특성 변화를 scanning electron microscopy (SEM)와 photoluminescence (PL)을 이용하여 측정하였다. 전구체 농도가 0.4 mol (M) 이하 일 때는 성장률이 낮아 ZnO 핵생성만이 되었고, 0.6 M 이상일 때 ZnO 박막은 나노섬유질 구조가 되었다. 전구체 농도가 더욱 증가함에 따라 ZnO 나노 섬유질의 굵기가 굵어졌고 ZnO 박막의 두께도 단계적으로 두꺼워졌다. 전구체 농도가 증가함에 따라 ZnO 나노 섬유질 박막의 photoluminescence (PL)의 근밴드가장자리 광방출(near-band-edge emission) 피크 세기와 full-width at half-maximu (FWHM)이 증가하였고, 깊은 준위 광방출(deep-level mission) 피크는 적색편이(red-shift)하였다.

Nitrogen source로 ammonia를 사용해 GSMBE로 성장된 GaN 박막 특성 (Growth of GaN on sapphire substrate by GSMBE(gas source molecular beam epitaxy) using ammonia as nitrogen source)

  • 조해종;한교용;서영석
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 2004년도 하계종합학술대회 논문집(2)
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    • pp.501-504
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    • 2004
  • High quality GaN layer was obtained on 0001 sapphire substrate using ammonia($NH_3$) as a nitrogen source by gas source molecular beam epitaxy. As a result, RHEED is used to investigate the relaxation processes which take place during the growth of GaN. In-situ RHEED(reflection high electron energy diffraction) appeared streaky-like pattern. The full Width at half maximum of the x-ray diffraction(FWHM) rocking curve measured from plane of GaN has exhibited as narrow as 8arcmin and surface roughness was 7.83nm. Photoluminescence measurement of GaN was investigated at room temperature, where the intensity of the band edge emission is much stronger than that of deep level emission. The GaN epitaxy layer according to various growth condition was investigated.

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