• Journal of the Korean Data and Information Science Society
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• v.14 no.2
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• pp.143-152
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• 2003

A data set having missing observations is often completed by using imputed values. In this paper, performances and accuracy of five imputation procedures are evaluated when missing values exist only on the response variable in the exponential regression model. Our simulation results show that adjusted exponential regression imputation procedure can be well used to compensate for missing data, in particular, compared to other imputation procedures. An illustrative example using real data is provided.

• Journal of the Korean Statistical Society
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• v.28 no.3
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• pp.279-296
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• 1999

In this paper we establish some recurrence relations for both single and product moments of order statistics from a doubly truncated linear- exponential distribution with increasing hazard rate. These recurrence relations would enable one to compute all the higher order moments of order statistics for all sample sizes from those of the lower order in a simple recursive way. In addition, percentage points of order statistics are also discussed. These generalize the corresponding results for the linear- exponential distribution with increasing hazard rate derived by Balakrishnan and Malik(1986)

• Communications of the Korean Mathematical Society
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• v.23 no.3
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• pp.357-369
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• 2008

We obtain the superstability of a generalized exponential functional equation f(x+y)=E(x,y)g(x)f(y) and investigate the stability in the sense of R. Ger [4] of this equation in the following setting: $$|\frac{f(x+y)}{(E(x,y)g(x)f(y)}-1|{\leq}{\varphi}(x,y)$$ where E(x, y) is a pseudo exponential function. From these results, we have superstabilities of exponential functional equation and Cauchy's gamma-beta functional equation.

• Communications of the Korean Mathematical Society
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• v.29 no.1
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• pp.187-193
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• 2014

In this paper, we want to represent a method for ranking of two exponential trapezoidal fuzzy numbers. In this study a new Cardinality between exponential trapezoidal fuzzy numbers is proposed. Cardinality in this method is relatively simple and easier in computation and ranks various types of exponential fuzzy numbers. For the validation the results of the proposed approach are compared with different existing approaches.

• Journal of the Korean Data and Information Science Society
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• v.16 no.4
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• pp.923-931
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• 2005

The two parameter generalized exponential distribution was recently introduced by Gupta and Kundu (1999). It is observed that the generalized exponential distribution can be used quite effectively to analyze skewed data set. This paper develops the accelerated life test model using generalized exponential distribution and considers maximum likelihood estimation of parameters under the tampered random variable model. To show the performance of proposed maximum likelihood estimates, some simulation will be performed. Using a real data set, an example will be given.

• Journal of the Korean Data and Information Science Society
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• v.15 no.4
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• pp.899-910
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• 2004

In this paper we have proposed a new loss function, namely, non-linear exponential(NLINEX) loss function, which is quite asymmetric in nature. We obtained the Bayes estimator under exponential(LINEX) and squared error(SE) loss functions. Moreover, a numerical comparison among the Bayes estimators of power function distribution under SE, LINEX, and NLINEX loss function have been made.

• Honam Mathematical Journal
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• v.32 no.4
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• pp.537-544
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• 2010

We prove the superstability of a functional inequality associated with general exponential functions as follows; ${\mid}f(x+y)-a^{x^2y+xy^2}g(x)f(y){\mid}{\leq}H_p(x,y)$. It is a generalization of the superstability theorem for the exponential functional equation proved by Baker.

• Computers and Concrete
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• v.30 no.4
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• pp.237-242
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• 2022

This paper is concerned with exponential stability in mean square for stochastic static neutral neural networks with varying delays. By using Lyapunov functional method and with the help of stochastic analysis technique, the sufficient conditions to guarantee the exponential stability in mean square for the neural networks are obtained and some results of related literature are extended.

• The Journal of the Korea institute of electronic communication sciences
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• v.17 no.4
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• pp.641-648
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• 2022

In this study, the performance of the NHPP software reliability model with exponential distribution (Exponential Basic, Inverse Exponential, Lindley, Rayleigh) characteristics was comparatively analyzed, and based on this, the optimal reliability model was also presented. To analyze the software failure phenomenon, the failure time data collected during system operation was used, and the parameter estimation was solved by applying the maximum likelihood estimation method (MLE). Through various comparative analysis (mean square error analysis, true value predictive power analysis of average value function, strength function evaluation, and reliability evaluation applied with mission time), it was found that the Lindley model was an efficient model with the best performance. Through this study, the reliability performance of the distribution with the characteristic of the exponential form, which has no existing research case, was newly identified, and through this, basic design data that software developers could use in the initial stage can be presented.

• Journal of the Semiconductor & Display Technology
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• v.19 no.1
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• pp.61-66
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• 2020

Threshold voltage shift occurring during operation is implemented in a SPICE simulation tool. Among the shift models the stretched-exponential function model, which is frequently observed from both single-crystal silicon and thin-film transistors regardless of the nature of causes, is selected, adapted to transient simulation, and added to BSIM4 developed by BSIM Research Group at the University of California, Berkeley. The adaptation method used in this research is to select degradation and recovery models based on the comparison between the gate and threshold voltages. The threshold voltage shift is extracted from SPICE transient simulation and shows the stretched-exponential time dependence for both degradation and recovery situations. The implementation method developed in this research is not limited to the stretched-exponential function model and BSIM model. The proposed method enables to perform transient simulation with threshold voltage shift in situ and will help to verify the reliability of a circuit.