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Implementation of Stretched-Exponential Time Dependence of Threshold Voltage Shift in SPICE  

Jung, Taeho (Department of Electronic and IT Media Engineering, Seoul National University of Science and Technology)
Publication Information
Journal of the Semiconductor & Display Technology / v.19, no.1, 2020 , pp. 61-66 More about this Journal
Abstract
Threshold voltage shift occurring during operation is implemented in a SPICE simulation tool. Among the shift models the stretched-exponential function model, which is frequently observed from both single-crystal silicon and thin-film transistors regardless of the nature of causes, is selected, adapted to transient simulation, and added to BSIM4 developed by BSIM Research Group at the University of California, Berkeley. The adaptation method used in this research is to select degradation and recovery models based on the comparison between the gate and threshold voltages. The threshold voltage shift is extracted from SPICE transient simulation and shows the stretched-exponential time dependence for both degradation and recovery situations. The implementation method developed in this research is not limited to the stretched-exponential function model and BSIM model. The proposed method enables to perform transient simulation with threshold voltage shift in situ and will help to verify the reliability of a circuit.
Keywords
Threshold voltage shift; Stretched-exponential; SPICE; Transient simulation;
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Times Cited By KSCI : 2  (Citation Analysis)
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