• Title/Summary/Keyword: electronic packaging

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Reliability of Joint Between Solder Bump and Ag-Pd Thick Film Conductor and Interfacial Reaction (솔더범프와 Ag-Pd 후막도체의 접합 신뢰성 및 계면반응)

  • Kim Gyeong Seop;Lee Jong Nam;Yang Taek Jin
    • Proceedings of the International Microelectronics And Packaging Society Conference
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    • 2003.11a
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    • pp.151-155
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    • 2003
  • The requirements for harsh environment electronic controllers in automotive applications have been steadily becoming more and more stringent. Electronic substrate technologists have been responding to this challenge effectively in an effort to meet the performance, reliability and cost requirements. An effect of the plasma cleaning at the alumina substrate and the IMC layer between $Sn-37wt\%Pb$ solder and Ag-Pd thick film conductor after reflow soldering has been studied. Organic residual carbon layer was removed by the substrate plasma cleaning. So the interfacial adhesive strength was enhanced. As a result of AFM measurement, Ag-Pd conductor pad roughness were increased from 304nm to 330nm. $Cu_6Sn_5$ formed during initial ref]ow process at the interface between TiWN/Cu UBM and solder grew by the succeeding reflow process so the grains had a large diameter and dense interval. A cellular-shaped $Ag_3Sn$ was observed at the interface between Ag-Pd conductor pad and solder. The diameters of the $Ag_3Sn$ grains ranged from about $0.1\~0.6{\mu}m$. And a needle-shaped $Ag_3Sn$ was also observed at the inside of the solder.

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SIP based Tunable BPF for UHF TV Broadcasting (UHF대역 TV방송을 위한 가변형 대역통과필터)

  • Lee, Tae-C.;Park, Jae-Y.
    • Proceedings of the KIEE Conference
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    • 2008.07a
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    • pp.1925-1926
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    • 2008
  • 본 논문에서는 UHF TV방송 전 대역 Ch.14(473MHz)$\sim$Ch.69(803MHz)까지의 모든 채널에서 동작하는 유도결합구조의 RF동조회로를 설계하였다. 기존 자기결합구조의 RF동조회로는 PCB 양면을 사용하여야 하고 수작업으로 Air Coil 간격을 조절해야만 한다. 부품의 집적화와 양산 효율성 측면에서 자기결합구조의 단점을 해결할 수 있도록 하기 위해 본 논문에서 제안한 유도결합구조는 수동부품인 칩인덕터와 칩커패시터 및 가변용량 다이오드만을 사용하여 RF동조회로를 설계하였다. 칩인덕터는 Air Coil에 비해 낮은 소자 Q값을 가진다. 상대적으로 낮은 Q값을 갖는 칩인덕터를 사용하기 때문에 이를 보완하기 위해 Peaking용 칩인덕터를 설계 디자인에 적용하였다. 가변형 대역통과필터로 동작하기 위해 자기결합구조와 동일하게 가변용량 다이오드를 이용하였다. UHF TV방송 전 대역(470$\sim$806MHz)에서 -2.88 $\sim$ -3.97dB의 삽입손실 특성 및 -8dB 이상의 반사손실 특성과 330MHz의 중심주파수 변화 범위를 갖는다. 현재 상용중인 지상파 튜너에 적용되고 있는 자기결합구조의 RF동조회로를 대치하여 적용될 수 있을 것이다.

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Atmospheric Plasma Treatment on Copper for Organic Cleaning in Copper Electroplating Process: Towards Microelectronic Packaging Industry

  • Hong, Sei-Hwan;Choi, Woo-Young;Park, Jae-Hyun;Hong, Sang-Jeen
    • Transactions on Electrical and Electronic Materials
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    • v.10 no.3
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    • pp.71-74
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    • 2009
  • Electroplated Cu is a cost efficient metallization method in microelectronic packaging applications. Typically in 3-D chip staking technology, utilizing through silicon via (TSV), electroplated Cu metallization is inevitable for the throughput as well as reducing the cost of ownership (COO).To achieve a comparable film quality to sputtering or CVD, a pre-cleaning process as well as plating process is crucial. In this research, atmospheric plasma is employed to reduce the usage of chemicals, such as trichloroethylene (TCE) and sodium hydroxide (NaHO), by substituting the chemical assisted organic cleaning process with plasma surface treatment for Cu electroplating. By employing atmospheric plasma treatment, marginally acceptable electroplating and cleaning results are achieved without the use of hazardous chemicals. The experimental results show that the substitution of the chemical process with plasma treatment is plausible from an environmentally friendly aspect. In addition, plasma treatment on immersion Sn/Cu was also performed to find out the solderability of plasma treated Sn/Cu for practical industrial applications.

Effect of Underfill on $\mu$BGA Reliability ($\mu$BGA 장기신뢰성에 미치는 언더필영향)

  • 고영욱;신영의;김종민
    • Proceedings of the International Microelectronics And Packaging Society Conference
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    • 2002.05a
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    • pp.138-141
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    • 2002
  • There are continuous efforts in the electronics industry to a reduced electronic package size. Reducing the size of electronic packages can be achieved by a variety of means, and for ball grid array(BGA) packages an effective method is to decrease the pitch between the individual balls. Chip scale package(CSP) and BGA are now one of the major package types. However, a reduced package size has the negative effect of reducing board-level reliability. The reliability concern is for the different thermal expansion rates of the two-substrate materials and how that coefficient CTE mismatch creates added stress to the BGA solder joint when thermal cycled. The point of thermal fatigue in a solder joint is an important factor of BGA packages and knowing at how many thermal cycles can be ran before failure in the solder BGA joint is a must for designing a reliable BGA package. Reliability of the package was one of main issues and underfill was required to improve board-level reliability. By filling between die and substrate, the underfill could enhance the reliability of the device. The effect of underfill on various thermomechanical reliability issues in $\mu$BGA packages is studied in this paper.

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A Reliability and warpage of wafer level bonding for CIS device using polymer (폴리머를 이용한 CIS(CMOS Image Sensor) 디바이스용 웨이퍼 레벨 접합의 warpage와 신뢰성)

  • Park, Jae-Hyun;Koo, Young-Mo;Kim, Eun-Kyung;Kim, Gu-Sung
    • Journal of the Microelectronics and Packaging Society
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    • v.16 no.1
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    • pp.27-31
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    • 2009
  • In this paper, the polymer adhesive bonding technology using wafer-level technology was investigated and warpage results were analyzed. Si and glass wafer was bonded after adhesive polymer layer and dam pattern for uniform state was patterned on glass wafer. In this study, warpage result decreased as the low of bonding temperature of Si wafer, bonding pressure and height of adhesive bonding layer. The availability of adhesive polymer bonding was confirmed by TC, HTC, Humidity soak test after dicing. The result is that defect has not found without reference to warpage.

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Fracture and Residual Stresses in $Metal/Al_2O_3-SiO_2$ System

  • Soh, D.;Korobova, N.
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.11a
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    • pp.308-312
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    • 2003
  • The packaging of the integrated circuits requires knowledge of ceramics and metals to accommodate the fabrication of modules that are used to construct subsystems and entire systems from extremely small components. Composite ceramics ($Al_2O_3-SiO_2$) were tested for substrates. A stress analysis was conducted for a linear work-hardening metal cylinder embedded in an infinite ceramic matrix. The bond between the metal and ceramic was established at high temperature and stresses developed during cooling to room temperature. The calculations showed that the stresses depend on the mismatch in thermal expansion, the elastic properties, and the yield strength and work hardening rate of the metal. Experimental measurements of the surface stresses have also been made on a $Cu/Al_2O_3-SiO_2$ ceramic system, using an indentation technique. A comparison revealed that the calculated stresses were appreciably larger than the measured surface stresses, indicating an important difference between the bulk and surface residual stresses. However, it was also shown that porosity in the metal could plastically expand and permit substantial dilatational relaxation of the residual stresses. Conversely it was noted that pore clusters were capable of initiating ductile rupture, by means of a plastic instability, in the presence of appreciable tri-axiality. The role of ceramics for packaging of microelectronics will continue to be extremely challenging.

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Technical Trends of Flexible, Transparent Electromagnetic Interference Shielding Film (유연한 투명 전자기 간섭 차폐 필름의 기술개발 동향)

  • Lim, Hyun-Su;Oh, Jung-Min;Kim, Jong-Woong
    • Journal of the Microelectronics and Packaging Society
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    • v.28 no.1
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    • pp.21-29
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    • 2021
  • Recently, semiconductor chips and electronic components are increasingly being used in IT devices such as wearable watches, autonomous vehicles, and smart phones. As a result, there is a growing concern about device malfunctions that may occur due to electromagnetic interference being entangled with each other. In particular, electromagnetic wave emissions from wearable or flexible smart devices have detrimental effects on human health. Therefore, flexible and transparent electromagnetic interference (EMI) shielding materials and films with high optical transmittance and outstanding shielding effectiveness have been gaining more attention. The EMI shielding films for flexible and transparent electronic devices must exhibit high shielding effectiveness, high optical transmittance, high flexibility, ultrathin and excellent durability. Meanwhile, in order to prepare this EMI shielding films, many materials have been developed, and results regarding excellent EMI shielding performance of a new materials such as carbon nano tube (CNT), graphene, Ag nano wire and MXene have recently been reported. Thus, in this paper, we review the latest research results to EMI shielding films for flexible and transparent device using the new materials.

Resistive Switching Properties of N and F co-doped ZnO

  • Kim, Minjae;Kang, Kyung-Mun;Wang, Yue;Chabungbam, Akendra Singh;Kim, Dong-eun;Kim, Hyung Nam;Park, Hyung-Ho
    • Journal of the Microelectronics and Packaging Society
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    • v.29 no.2
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    • pp.53-58
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    • 2022
  • One of the most promising emerging technologies for the next generation of nonvolatile memory devices based on resistive switching (RS) is the resistive random-access memory mechanism. To date, RS effects have been found in many transition metal oxides. However, no clear evidence has been reported that ZnO-based resistive transition mechanisms could be associated with strong correlation effects. Here, we investigated N, F-co-doped ZnO (NFZO), which shows bipolar RS. Conducting micro spectroscopic studies on exposed surfaces helps tracking the behavioral change in systematic electronic structural changes during low and high resistance condition of the material. The significant difference in electronic conductivity was observed to attribute to the field-induced oxygen vacancy that causes the metal-insulator Mott transition on the surface. In this study, we showed the strong correlation effects that can be explored and incorporated in the field of multifunctional oxide electrons devices.

Control of Weighted Mobility Ratio to Enhance the Performance of Bi-Te-based Thermoelectric Materials (Bi-Te계 열전소재 성능 증대를 위한 Weighted Mobility Ratio 제어)

  • Kim, Min Young;Kim, Hyun-Sik;Lee, Kyu Hyoung
    • Journal of the Microelectronics and Packaging Society
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    • v.28 no.4
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    • pp.103-107
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    • 2021
  • Temperature dependences of electronic and thermal transport properties of narrow band gap thermoelectric materials are dependent on the transport behavior of minority carriers as well as majority carriers. Thus, weighted mobility ratio, which is defined the ratio of weighted mobility for majority carriers to that for minority carriers, must be one of the important parameters to enhance the performance of thermoelectric materials. Herein, we provided a practical guide for the development of high-performance Bi-Te-based thermoelectric materials based on the weighted mobility ratio control by considering theoretical backgrounds related to the electronic transport phenomena in semiconductors.

Elastic Properties and Repeated Deformation Reliabilities of Stiffness-Gradient Stretchable Electronic Packages (강성도 경사형 신축 전자패키지의 탄성특성 및 반복변형 신뢰성)

  • Han, Kee Sun;Oh, Tae Sung
    • Journal of the Microelectronics and Packaging Society
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    • v.26 no.4
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    • pp.55-62
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    • 2019
  • Stiffness-gradient stretchable electronic packages of the soft PDMS/hard PDMS/FPCB structure were processed using the polydimethylsiloxane (PDMS) as the base substrate and the more stiff flexible printed circuit board (FPCB) as the island substrate. The elastic characteristics of the stretchable packages were estimated and their long-term reliabilities on stretching cycles and bending cycles were characterized. With 0.28 MPa, 1.74 MPa, and 1.85 GPa as the elastic moduli of the soft PDMS, hard PDMS, and FPCB, respectively, the effective elastic modulus of the soft PDMS/hard PDMS/FPCB package was estimated as 0.6 MPa. The resistance of the stretchable packages varied for 2.8~4.3% with stretching cycles ranging at 0~0.3 strain up to 15,000 cycles and for 0.9~1.5% with 15,000 bending cycles at a bending radius of 25 mm.