• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.07b
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• pp.1254-1257
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• 2004

This paper presents a built-in current sensor(BICS) that can detect defects in CMOS integrated circuits through current testing technique - Iddq test. Current test has recently been known to a complementary testing method because traditional voltage test cannot cover all kinds of bridging defects. So BICS is widely used for current testing. but there are some critical issues - a performance degradation, low speed test, area overhead, etc. The proposed BICS has a two operating mode- normal mode and test mode. Those methods minimize the performance degradation in normal mode. We also used a current-mode differential amplifier that has a input as a current, so we can realize higher speed current testing. Furthermore, only using 10 MOSFETS and 3 inverters, area overhead can be reduced by 6.9%. The circuit is verified by HSPICE simulation with 0.25 urn CMOS process parameter.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.1
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• pp.14-19
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• 2008

Semiconductor testing area challenges many testing issues due to the minimization and ultra high performance of current semiconductors. Among these issues, signal integrity test on interconnections must be solved for highly integrated circuits like SoC. In this paper, we propose an effective pattern application method for signal integrity test on interconnects. Proposed method can be applied by using boundary scan architecture and very efficient test can be preceded with pretty short test time.

• 한국태양에너지학회:학술대회논문집
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• 2009.11a
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• pp.98-103
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• 2009

In this paper, we test the electrical resistance of flat wire in the PV module. normally solar cell has two kind of flat wire(inter connection ribbon and bus bar ribbon). we found the phenomenon that has a unbalance with resistance when we make a wiling between of string. So, we measurement the resistance of flat wire each other. and analysis of missmatch with resistance between flat wires on PV module. next to survey of IR picture on missmatch flat wire samples for analyze of missmatch with current in the wire. and we perform IR test with solar cell that has a connection with flat wire for test the effect of missmatch resistance on solar cell. Finally we perform the Dark I-V test for survey of effect by the unbalance of resistance. By the result of Dark I-V test, the series resistance of existing connection sample is large more then innovated connection sample.

• Journal of Electrical Engineering and Technology
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• v.13 no.5
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• pp.2050-2058
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• 2018

Impulse characteristic of transmission tower grounding grid is needed for lightning protection of transmission line. This paper describes an outdoor experimental test facility established for large-scale grounding grid of transmission tower, made up of four impulse current generators and a circle current return electrode. The amplitude of impulse current is up to 100 kA. The results of the CDEGS simulation and GPR measurement reveal the uniform current distribution in the test arrangement. An impulse test for a square electrode with extended conductors is carried out in condition of three current waveforms with different amplitude. Based on the electrical network model and iterative algorithm method, a calculation model is proposed to simulate the impulse characteristic of large-scale grounding grid considering soil ionization. The curve of impulse resistance against the current amplitude shows the soil ionization both from the simulation and test. Deviation between the simulation and test result is less than 15%.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.05e
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• pp.11-14
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• 2003

Sintered Cu-W has been used for the electrode of GIS for interrupting the abnormal current. In this study the effect of Ni addition in Cu-W electrode was investigated. Cu-W electrodes used contains 0.1~0.2wt% Ni and were conducted the experiments which was attacked by DC arc test (70V-70A) for 300 times periodically. As the contents of Ni in Cu-W electrode increase, the hardness and electrical conductivity were decreased. The weight change ($\Delta$mg) of electrode after DC arc test increased with increasing Ni contents and test times. The hardness and electrical conductivity of electrode after DC arc test were decreased compared with non-arc affected electrode, which was owing to the defects near surface of electrode and degradation by arc heat. It was considered that Cu in the Cu-W electrode was scattered to all directions by arc heat, therefore, the electrodes were damaged and deformed in the surface and cross-section of electrode. It is difficult to estimate directly the characteristics of Cu-W electrode for GIS related with high voltage and current from the results of DC arc test conducted in this study. However, the results of the effect of Ni addition in Cu-W electrode could be applied for the research of electrode for GIS.

• ETRI Journal
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• v.35 no.1
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• pp.109-119
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• 2013

Static testing of analog-to-digital (A/D) and digital-to-analog (D/A) converters becomes more difficult when they are embedded in a system on chip. Built-in self-test (BIST) reduces the need for external support for testing. This paper proposes a new static BIST structure for testing both A/D and D/A converters. By sharing test circuitry, the proposed BIST reduces the hardware overhead. Furthermore, test time can also be reduced using the simultaneous test strategy of the proposed BIST. The proposed method can be applied in various A/D and D/A converter resolutions and analog signal swing ranges. Simulation results are presented to validate the proposed method by showing how linearity errors are detected in different situations.

• Proceedings of the KIEE Conference
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• 2005.05a
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• pp.155-157
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• 2005

The Electrical Test Bed(ETB) integrates the test environment, required for acceptance tests of system level, prior to FM testing. The ETB will be used for the validation of system-level functions and interface between each subsystem. The FTB supports early functional and limited performance checkout of electrical subsystems. Therefore, it provides the environment for the verification of the Flight Software including AOCS, EPS, and TC&R simulators. These ETB will be composed of engineering version of spacecraft BUS, which are laid on the laboratory table.

• Proceedings of the KIEE Conference
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• 1996.07c
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• pp.1917-1919
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• 1996

This paper aims to extract the air clearance in 22.9KV the metal enclosed switchgear. First, we investigated the actual conditions on the clearance in the metal enclosed switchgear which has been used in domestic. The test model and 9 test electrodes for the air insulation strength tests have been designed and manufactured based on the investigation results. To find optimal clearance in the metal enclosed switchgear, we performed 50% flash-over test by the up and down method and lightning impulse withstand voltage test. And we obtained results that the clearance or phase-to-phase is 230 [mm] and clearance or phase-to-earth is 210[mm].

• 한국정보디스플레이학회:학술대회논문집
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• 2002.08a
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• pp.217-220
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• 2002

In this paper, an accelerated lifetime test method of MgO thin film is suggested. The most important test factors are surface temperature of the PDP, gas pressure, the applied voltage and frequency. The standard test conditions are $50^{\circ}C$, 400Torr, 20% over voltage and 300kHz ,respectively. The accelerated lifetime of MgO is significantly varied with the MgO preparing conditions.

• Nuclear Engineering and Technology
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• v.55 no.11
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• pp.4252-4265
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• 2023

In the case of nuclear power plants near end of their design life, a reassessment of the performance of safetyrelated equipment may be necessary to determine whether to shut down or extend the operation of the power plant. Therefore, it is necessary to evaluate the level of performance decline due to degradation. Electrical cabinets, including MCC and switchgear, are representative safety-related equipment. Several studies have assessed the degradation and seismic performance of nuclear power plant equipment. Most of those researches are limited to individual components due to the size of safety-related equipment and test equipment. However, only a few studies assessed the degradation performance of electrical cabinets. The equipment of various nuclear power plants is anchored to concrete foundations, and crack in concrete foundations is one of the most representative of degradation that could be visually confirmed. However, it is difficult to find a study for analysis through testing the effect of cracks in concrete foundations on the response of electrical cabinet internal equipment fixed by anchors. In this study, using a simple cabinet model considering cast-in-place anchor in uncracked and cracked concretes, a tri-axial shaking table tests were performed and the seismic behavior were observed.