• Title/Summary/Keyword: drain-noise

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Design of a Distributed Mixer Using Dual-Gate MESFET's (Dual-Gate MESFET를 이용한 분포형 주파수 혼합기의 설계)

  • Oh, Yang-Hyun;An, Jeong-Sig;Kim, Han-Suk;Lee, Jong-Arc
    • Journal of IKEEE
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    • v.2 no.1 s.2
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    • pp.15-23
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    • 1998
  • In this paper, distributed mixer is studied at microwave frequency. The circuit of distributed mixer composed of gate 1,2, drain transmission lines, matching circuits in input and output terminal, DGFET's. For impedance matching of input and output port at higher frequency, image impedance concept is introduced. In distributed mixer, a DGFET's impedances are absorbed by artificial transmission line, this type of mixer can get a very broadband characteristics compared to that of current systems. A RF/LO signal is applied to each gate input port, and are excited the drain transmission line through transcondutance of the DGFET's. The output signals from each drain port of DGFET's added in same phases. We designed and frabricated the distributed mixer, and a conversion gain, noise figure, bandwidth, LO/RF isolation of the mixer are shown through computer simulation and experimentation.

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Linearity-Distortion Analysis of GME-TRC MOSFET for High Performance and Wireless Applications

  • Malik, Priyanka;Gupta, R.S.;Chaujar, Rishu;Gupta, Mridula
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.11 no.3
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    • pp.169-181
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    • 2011
  • In this present paper, a comprehensive drain current model incorporating the effects of channel length modulation has been presented for multi-layered gate material engineered trapezoidal recessed channel (MLGME-TRC) MOSFET and the expression for linearity performance metrics, i.e. higher order transconductance coefficients: $g_{m1}$, $g_{m2}$, $g_{m3}$, and figure-of-merit (FOM) metrics; $V_{IP2}$, $V_{IP3}$, IIP3 and 1-dB compression point, has been obtained. It is shown that, the incorporation of multi-layered architecture on gate material engineered trapezoidal recessed channel (GME-TRC) MOSFET leads to improved linearity performance in comparison to its conventional counterparts trapezoidal recessed channel (TRC) and rectangular recessed channel (RRC) MOSFETs, proving its efficiency for low-noise applications and future ULSI production. The impact of various structural parameters such as variation of work function, substrate doping and source/drain junction depth ($X_j$) or negative junction depth (NJD) have been examined for GME-TRC MOSFET and compared its effectiveness with MLGME-TRC MOSFET. The results obtained from proposed model are verified with simulated and experimental results. A good agreement between the results is obtained, thus validating the model.

MAGFET Hybrid IC with Frequency Output (주파수 출력을 갖는 MAGFET Hybrid IC)

  • Kim, Si-Hon;Lee, Cheol-Woo;Nam, Tae-Chul
    • Journal of Sensor Science and Technology
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    • v.6 no.3
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    • pp.194-199
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    • 1997
  • When voltage or current gets out of the magnetic sensor as it is, we have often faced the problems such as introduction of noise and loss of voltage. In order to reduce these problems, a 2 drain MAGFET operating in the saturation region and fabricated by CMOS process, the system of I/V converter, VCO with operational amplifier, and V/F conversion circuits with Schmitt Trigger are designed and fabricated in one package. The absolute sensitivity of magnetic sensor shows 1.9 V/T and the product sensitivity is $3.2{\times}10^{4}\;V/A{\cdot}T$. The characteristic of V/F conversion is very stabilized and has the value of 190 kHz/T.

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THE BOES CCD CAMERA II. CHARACTERISTICS OF THE CCD (BOES CCD 카메라 II. 카메라의 특성)

  • Park, B.G.;Seong, H.C.;Jang, J.G.;Jang, B.H.;Lee, B.C.;Park, Y.H.;Kim, K.M.;Han, I.
    • Publications of The Korean Astronomical Society
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    • v.18 no.1
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    • pp.75-79
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    • 2003
  • The characteristics of the BOES (Bohyunsan Observatory Echelle Spectrograph) CCD camera is presented. In order to get optimum gain and readout noise of the CCD, we examine the variation of the gain and readout noise by changing the value of output drain voltage of the CCD and measuring the gain using transfer curve, which is defined as the plot of variance versus mean exposure level of a homogeneous light onto the CCD surface. The gain and readout noises are optimised to be 0.5e$^-$/ADU and 3e$^-$, which is good for highest signal-to-noise ratio and contrast for the low light level characteristics of the BOES. We also measure the dark count of the CCD by getting five dark images with 3600 seconds exposure time. The mean dark count from median stacked dark images is essentially zero. A table of positions of defected pixels is also presented.

A 2 GHz 20 dBm IIP3 Low-Power CMOS LNA with Modified DS Linearization Technique

  • Rastegar, Habib;Lim, Jae-Hwan;Ryu, Jee-Youl
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.16 no.4
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    • pp.443-450
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    • 2016
  • The linearization technique for low noise amplifier (LNA) has been implemented in standard $0.18-{\mu}m$ BiCMOS process. The MOS-BJT derivative superposition (MBDS) technique exploits a parallel LC tank in the emitter of bipolar transistor to reduce the second-order non-linear coefficient ($g_{m2}$) which limits the enhancement of linearity performance. Two feedback capacitances are used in parallel with the base-collector and gate-drain capacitances to adjust the phase of third-order non-linear coefficients of bipolar and MOS transistors to improve the linearity characteristics. The MBDS technique is also employed cascode configuration to further reduce the second-order nonlinear coefficient. The proposed LNA exhibits gain of 9.3 dB and noise figure (NF) of 2.3 dB at 2 GHz. The excellent IIP3 of 20 dBm and low-power power consumption of 5.14 mW at the power supply of 1 V are achieved. The input return loss ($S_{11}$) and output return loss ($S_{22}$) are kept below - 10 dB and -15 dB, respectively. The reverse isolation ($S_{12}$) is better than -50 dB.

Dependence of the 1/f Noise Characteristics of CMOSFETs on Body Bias in Sub-threshold and Strong Inversion Regions

  • Kwon, Sung-Kyu;Kwon, Hyuk-Min;Kwak, Ho-Young;Jang, Jae-Hyung;Shin, Jong-Kwan;Hwang, Seon-Man;Sung, Seung-Yong;Lee, Ga-Won;Lee, Song-Jae;Han, In-Shik;Chung, Yi-Sun;Lee, Jung-Hwan;Lee, Hi-Deok
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.13 no.6
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    • pp.655-661
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    • 2013
  • In this paper, the 1/f noise characteristics of n-channel MOSFET (NMOSFET) and p-channel MOSFET (PMOSFET) are analyzed in depth as a function of body bias. The normalized drain current noise, $S_{ID}/I_D{^2}$ showed strong dependence on the body bias in the sub-threshold region for both NMOSFET and PMOSFET, and NMOSFET showed stronger dependence than PMOSFET on the body bias. On the contrary, both of NMOSFET and PMOSFET do not exhibit the dependence of $S_{ID}/I_D{^2}$ on body bias in strong inversion region, although the noise mechanisms of two MOSFETs are different from each other.

High-performance 94 GHz MMIC Low Noise Amplifier using Metamorphic HEMTs (Metamorphic HEMT를 이용한 우수한 성능의 94 GHz MMIC 저잡음 증폭기)

  • Kim, Sung-Chan;An, Dan;Rhee, Jin-Koo
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.45 no.8
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    • pp.48-53
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    • 2008
  • In this paper, we developed the MMIC low noise amplifier using 100 nm metamorphic HEMTs technology in combination with coplanar circuit topology for 94 GHz applications. The $100nm\times60{\mu}m$ MHEMT devices for the MMIC LNA exhibited DC characteristics with a drain current density of 655 mA/mm, an extrinsic transconductance of 720 mS/mm. The current gain cutoff frequency $(f_T)$ and maximum oscillation frequency $(f_{max})$ were 195 GHz and 305 GHz, respectively. The realized MMIC LNA represented $S_{21}$ gain of 14.8 dB and noise figure of 4.6 dB at 94 GHz with an over-all chip size of $1.8mm\times1.48mm$.

Highly Linear Wideband LNA Design Using Inductive Shunt Feedback

  • Jeong, Nam Hwi;Cho, Choon Sik;Min, Seungwook
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.14 no.1
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    • pp.100-108
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    • 2014
  • Low noise amplifier (LNA) is an integral component of RF receiver and frequently required to operate at wide frequency bands for various wireless system applications. For wideband operation, important performance metrics such as voltage gain, return loss, noise figure and linearity have been carefully investigated and characterized for the proposed LNA. An inductive shunt feedback configuration is successfully employed in the input stage of the proposed LNA which incorporates cascaded networks with a peaking inductor in the buffer stage. Design equations for obtaining low and high impedance-matching frequencies are easily derived, leading to a relatively simple method for circuit implementation. Careful theoretical analysis explains that input impedance can be described in the form of second-order frequency response, where poles and zeros are characterized and utilized for realizing the wideband response. Linearity is significantly improved because the inductor located between the gate and the drain decreases the third-order harmonics at the output. Fabricated in $0.18{\mu}m$ CMOS process, the chip area of this wideband LNA is $0.202mm^2$, including pads. Measurement results illustrate that the input return loss shows less than -7 dB, voltage gain greater than 8 dB, and a little high noise figure around 6-8 dB over 1.5 - 13 GHz. In addition, good linearity (IIP3) of 2.5 dBm is achieved at 8 GHz and 14 mA of current is consumed from a 1.8 V supply.

Vibration Related Branch Line Fatigue Failure (분기관 진동에 의한 피로파괴)

  • 전형식;박보용
    • Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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    • 1990.10a
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    • pp.113-124
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    • 1990
  • Tap lines are small branch piping generally less than two inches in diameter. They typically branch off of header piping having a much larger diameter. An example of a common tap line is a 3/4 inch size high point vent or low point drain. Most tap lines have at least one valve near the header tap connection to provide isolation. Two valves are often required for double isolation. A light water reactor(LWR) nuclear power plant will have several hundred tap lines. These lines come in many sizes and shapes and serve numerous functions. A single process piping valve may have three different tap lines associated with it (figure 1). Table 1 delineates the different categories of tap lines. Vibration failures of tap lines are a common occurrence in all industrial plants including nuclear and fossil power plants. These types of failures constitute a significant percentage of all piping related failures. An unscheduled plant shutdown or outage resulting from the failure of a tap line decreases plant reliability and may have a detrimental effect on plant safety. Most tap line vibration failures can be avoided through the use of appropriate routing and support techniques. Standardized designs can be developed for use in a myriad of applications. These designs will not only minimize failures but will also reduce the necessary analysis and installation efforts.

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DC and RF Characteristics of $0.15{\mu}m$ Power Metamorphic HEMTs

  • Shim, Jae-Yeob;Yoon, Hyung-Sup;Kang, Dong-Min;Hong, Ju-Yeon;Lee, Kyung-Ho
    • ETRI Journal
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    • v.27 no.6
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    • pp.685-690
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    • 2005
  • DC and RF characteristics of $0.15{\mu}m$ GaAs power metamorphic high electron mobility transistors (MHEMT) have been investigated. The $0.15{\mu}m{\times}100{\mu}m$ MHEMT device shows a drain saturation current of 480 mA/mm, an extrinsic transconductance of 830 mS/mm, and a threshold voltage of -0.65 V. Uniformities of the threshold voltage and the maximum extrinsic transconductance across a 4-inch wafer were 8.3% and 5.1%, respectively. The obtained cut-off frequency and maximum frequency of oscillation are 141 GHz and 243 GHz, respectively. The $8{\times}50{\mu}m$ MHEMT device shows 33.2% power-added efficiency, an 18.1 dB power gain, and a 28.2 mW output power. A very low minimum noise figure of 0.79 dB and an associated gain of 10.56 dB at 26 GHz are obtained for the power MHEMT with an indium content of 53% in the InGaAs channel. This excellent noise characteristic is attributed to the drastic reduction of gate resistance by the T-shaped gate with a wide head and improved device performance. This power MHEMT technology can be used toward 77 GHz band applications.

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