• 한국정보통신학회논문지
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• 제22권4호
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• pp.664-669
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• 2018

본 연구는 투명산화물반도체의 전기적인 특성과 산소공공과의 관계를 알아보기 위해서 $TiO_2$ 박막을 증착하여 MIM 구조를 만들어서 전압전류 특성을 관찰하였다. 산소공공은 XPS분석으로 이루어졌으며, 커패시턴스를 측정하여 전하의 용량이 많은 곳에서 산소공공이 어떤 영향을 주는가에 대하여도 조사하였다. 열처리를 통하여 결정질구조로 변하는 $TiO_2$ 박막은 산소공공이 가장 낮은 곳에서 커패시턴스 값이 가장 높았으며, 전하의 양이 많았다. 따라서 전하의 양이 많은 $TiO_2$박막이 $CO_2$ 가스에 대하여 가장 잘 민감하게 반응하는 것을 확인하였다.

• 한국표면공학회지
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• 제36권1호
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• pp.14-21
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• 2003

Thin films of ZrO$_2$ and TiO$_2$ were deposited on Si(100) substrates using RF magnetron sputtering technique. To study an influence of the sputtering parameters, systematic experiments were carried out in this work. XRD data show that the $ZrO_2$ films were mainly grown in the [111] orientation at the annealing temperature between 800 and $1000^{\circ}C$ while the crystal growth direction was changed to be [012] at above $1000^{\circ}C$. FT-IR spectra show that the oxygen stretching peaks become strong due to $SiO_2$ layer formation between film layers and silicon surface after annealing, and proved that a diffusion caused by either oxygen atoms of $ZrO_2$ layers or air into the interface during annealing. Different crystal growth directions were observed with the various deposition parameters such as annealing temperature, RF power magnitude, and added $O_2$ amounts. The growth rate of $TiO_2$ thin films was increased with RF power magnitude up to 150 watt, and was then decreased due to a sputtering effect. The maximum growth rate observed at 150 watt was 1500 nm/hr. Highly oriented, crack-free, stoichiometric polycrystalline $TiO_2$<110> thin film with Rutile phase was obtained after annealing at $1000^{\circ}C$ for 1 hour.

• 센서학회지
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• 제14권2호
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• pp.96-100
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• 2005

The planar Schottky diodes were fabricated and modeled to probe the device applicability of the cracked GaN epitaxial layer on a (111) silicon substrate. On the unintentionally n-doped GaN grown on silicon, we deposited Ti/Al/Ni/Au as the ohmic metal and Pt as the Schottky metal. The ohmic contact achieved a minimum contact resistivity of $5.51{\times}10.5{\Omega}{\cdot}cm^{2}$ after annealing in an $N_{2}$ ambient at $700^{\circ}C$ for 30 sec. The fabricated Schottky diode exhibited the barrier height of 0.7 eV and the ideality factor was 2.4, which are significantly lower than those parameters of crack free one. But in photoresponse measurement, the diode showed the peak responsivity of 0.097 A/W at 300 nm, the cutoff at 360 nm, and UV/visible rejection ratio of about $10^{2}$. The SPICE(Simulation Program with Integrated Circuit Emphasis) simulation with a proposed model, which was composed with one Pt/GaN diode and three parasitic diodes, showed good agreement with the experiment.

• 센서학회지
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• 제18권3호
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• pp.239-244
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• 2009

We fabricated nano-templates by low temperature BCP(block copolymer) process at 180 $^{\circ}C$, then we deposited 10 nm-thick $TiO_2$ layers with ALD(atomic layer deposition) at low temperature of 150 $^{\circ}C$. Through FE-SEM analysis, we confirmed the successful formation of the groove-type(width of crest : 30 nm, width of trough : 18 nm) and the cylinder-type(diameter : 10 nm, distance between hole : 25 nm) templates. Moreover, after $TiO_2$-ALD processing, we confirmed the deposition of the uniform nano layers of $TiO_2$ on the nano-templates. Through AFM analysis, the pitches of the crest-through(in groove-type) and hole-hole(in cylinder-type) were the same before and after $TiO_2$-ALD processing. In addition, we indirectly determined the existence of the uniform $TiO_2$ layers on nano-templates as the surface roughness decreased drastically. We successfully fabricated nano-template at low temperature and confirmed that the three-dimensional nano-structure for sensor application could be achieved by $TiO_2$-ALD processing at extremely low temperature of 150 $^{\circ}C$.

• 한국전기전자재료학회논문지
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• 제11권12호
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• pp.1122-1127
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• 1998

Group II-AF_2$films such as $CaF_2$, $SrF_2$, and $BaF_2$ have been commonly used many practical applications such as silicon on insulatro(SOI), three-dimensional integrated circuits, buffer layers, and gate dielectrics in filed effect transistor. This paper presents electrical and structural properties of fluoride films as a gate dielectric layer. Conventional gate dielectric materials of TFTs like oxide group exhibited problems on high interface trap charge density($D_it$), and interface state incorporation with O-H bond created by mobile hydrogen and oxygen atoms. To overcome such problems in conventional gate insulators, we have investigated $CaF_2$ films on Si substrates. Fluoride films were deposited using a high vacuum evaporation method on the Si and glass substrate. $CaF_2$ films were preferentially grown in (200) plane direction at room temperature. We were able to achieve a minimum lattice mismatch of 0.74% between Si and $CaF_2$ films. Average roughness of $CaF_2$ films was decreased from 54.1 ${\AA}$ to 8.40 ${\AA}$ as temperature increased form RT and $300^{\circ}C$. Well fabricated MIM device showed breakdown electric field of 1.27 MV/cm and low leakage current of $10^{-10}$ A/$cm^2$. Interface trap charge density between $CaF_2$ film and Si substrate was as low as $1.8{\times}10^{11}cm^{-2}eV^{-1}$.

• 한국제4기학회지
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• 제24권2호
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• pp.13-21
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• 2010

무안 피서리유적은 최근 서남해안 일대에서 확인되고 있는 구석기시대 유적들에 대한 의미 있는 자료들을 제공하고 있다. 무안 피서리유적에 대한 층위 및 지질학적 분석결과는 토양쐐기의 특성이 토양의 굳기나 토양내부의 성분 함량 및 고지표면의 기복에 따라 차이가 있을 수 있다는 것을 지시해주고 있다. 피서리유적에서 중기 구석기 늦은 단계 또는 후기 구석기 이른 단계의 석기들이 함께 출토되었는데 이는 이들 석기가 산출되는 문화층이 최대 빙하 발달시기 이후에 형성되었다는 것을 고려해 볼 때 활발한 침식과 재퇴적에 의해 여러 시기의 유물이 함께 재퇴적된 결과일 가능성을 지시해 주고 있다. 이번 연구를 통해 구석기 유물의 분포와 토양쐐기와 같은 토양층의 특성은 고지표면의 기복 및 기후환경과 같은 자연환경적 조건에 의해 영향 받을 수 있다는 것을 고찰하였다.

• 환경영향평가
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• 제21권1호
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• pp.81-91
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• 2012

In this study, it is grasped the status of nutrients through an investigation of release characteristics and physicochemical properties of sediments on reservoir. And then the effect of sediments is evaluated on the water quality in reservoir. In the results of physicochemical analysis, the pollution level of midstream is the highest, which shows the traits that the water is more deeper and takes place a deposition consistently. Then, the pollution level of upstream is higher than downstream's because inflow has influence on the upstream directly. The downstream is located near tidal gate so that the soil particles can be moved easily and are difficult to be deposited due to the distribution of seawater by control of tidal gate. Therefore, the downstream is showed the lowest pollution level than the others. Also, the concentration of SOD(Sediment Oxygen Demand) in the upstream which is influenced on the effect of inflow is highest than the others. When it analyzes under anaerobic and aerobic condition to understand the release characteristic of sediment, it shows that the release rate is low or negative under the aerobic condition. Whereas the release rate is usually positive under the unaerobic condition relatively. According to these results, it is necessary to maintain the proper environmental factors of water body for decreasing the release rate of sediment. Because the release rate is changeable under the different condition of water body. Therefore, proper strategies are required for increasing the self-purification of water as well as keeping the aerobic condition of sediment and managing a sediment layer directly to control the inner-pollution by the sediment of reservoir.

• 한국전기전자재료학회논문지
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• 제17권11호
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• pp.1241-1245
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• 2004

Continuous physical vapor deposition (PVD) method is one of many processes to fabricate long length coated conductor which is required for successful large-scale application of superconducting power devices. Three film deposition systems (pulsed laser deposition, sputtering, and evaporation) equipped with reel-to-reel(R2R) metal tape moving apparatus were installed and used to deposit multi-layer oxide thin films. Both RABiTS and IBAD texture templates are used. IBAD template consists of CeO$_2$(PLD)/YSZ(IBAD) on stainless steel(SS) metal tape, and RABiTS template has the structure of CeO$_2$/YSZ/Y$_2$O$_3$ which was continuously deposited on Ni-alloy tape using R$_2$R evaporation and DC reactive sputtering in a deposition system designed to do both processes. 0.4 m-long coated conductor with Ic(77 K) of 34 A/cm was fabricated using RABiTS template. 0.5 m and 1.1 m-long coated conductor with Ic(77 K) of 41 A/cm and 26 A/cm were fabricated using IBAD template.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2003년도 추계학술대회 논문집 Vol.16
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• pp.392-395
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• 2003

For the purpose of digital x-ray imaging, many materials such as $PbI_2$, $HgI_2$, TlBr, CdTe and CdZnTe have been under development for servaral years as direct converter layer. $Hgl_2$ film detector have recently been shown as one of the most promising semiconductor materials to be used as direct converters in x-ray digital radiography. This paper, the $HgI_2$ films are deposited on conductive-coated glass by screen printing, in which $HgI_2$ powder is embedded in a binder and solvent, and the slurry is used to coat the conductive-coated glass. We investigated electrical characteristic of the fabricated $HgI_2$ films. The x-ray response to radiological x-ray generator of 70Kvp using the current integration mode will be reported for screen printing films. These results indicate that $HgI_2$ detectors have high potential as new digital x-ray imaging devices for radiography.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2005년도 하계학술대회 논문집 Vol.6
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• pp.414-415
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• 2005

A solar cell is an element to transform the solar light energy into the electric energy in a moment. The single crystal element of high quality on which many studies were conducted in the past has a high efficiency of energy transformation, but its price competitiveness is so poor that it has failed to be popularized However, recently, in terms of an environment-friendly alternative energy, studies on applicability of the polycrystal solar cell have been actively under way. Among subject substances for such solar cell, $CuInSe_2$ has several good physical properties so that the greatest attention is paid to it as an optical absorption layer material for a low-cost solar cell of high efficiency. In order to manufacture the $CuInSe_2$ compound thin film, the unit element was deposited by using the sputtering method and the evaporation method and the heat treatment process was used in an electric furnace. Thereby, we intended to get a single-phase $CuInSe_2$ compound thin film.