• Title/Summary/Keyword: coupled N structure

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A COUPLED 𝒩-STRUCTURE WITH AN APPLICATION IN A SUBTRACTION ALGEBRA

  • Williams, D.R. Prince;Ahn, Sun Shin;Jun, Young Bae
    • Honam Mathematical Journal
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    • v.36 no.4
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    • pp.863-884
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    • 2014
  • In this paper, we introduce a coupled $\mathcal{N}$-structure which is the generalization of $\mathcal{N}$-structure. Using this coupled $\mathcal{N}$-structure, we have applied in a subtraction algebra and have introduced the notion of a coupled $\mathcal{N}$-subalgebra, a coupled $\mathcal{N}$-ideal. Also the characterization of coupled $\mathcal{N}$-ideal is presented.

COUPLED N-STRUCTURES APPLIED TO IDEALS IN d-ALGEBRAS

  • Ahn, Sun Shin;Ko, Jung Mi
    • Communications of the Korean Mathematical Society
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    • v.28 no.4
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    • pp.709-721
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    • 2013
  • The notions of coupled N-subalgebra, coupled (positive implicative) N-ideals of $d$-algebras are introduced, and related properties are investigated. Characterizations of a coupled $\mathcal{N}$-subalgebra and a coupled (positive implicative) $\mathcal{N}$-ideals of $d$-algebras are given. Relations among a coupled $\mathcal{N}$-subalgebra, a coupled $\mathcal{N}$-ideal and a coupled positive implicative $\mathcal{N}$-ideal of $d$-algebras are discussed.

APPLICATIONS OF COUPLED N-STRUCTURES IN BH-ALGEBRAS

  • Seo, Min Jeong;Ahn, Sun Shin
    • Honam Mathematical Journal
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    • v.34 no.4
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    • pp.585-596
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    • 2012
  • The notions of a $\mathcal{N}$-subalgebra, a (strong) $\mathcal{N}$-ideal of BH-algebras are introduced, and related properties are investigated. Characterizations of a coupled $\mathcal{N}$-subalgebra and a coupled (strong) $\mathcal{N}$-ideals of BH-algebras are given. Relations among a coupled $\mathcal{N}$-subalgebra, a coupled $\mathcal{N}$-ideal and a coupled strong $\mathcal{N}$ of BH-algebras are discussed.

Effect of Inductively Coupled Plasma on the Microstructure, Structure and Mechanical Properties of NbN Coatings (유도결합 플라즈마 파워가 NbN 코팅막의 미세구조, 결정구조 및 기계적 특성에 미치는 영향에 관한 연구)

  • Chun, Sung-Yong
    • Journal of the Korean institute of surface engineering
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    • v.48 no.5
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    • pp.205-210
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    • 2015
  • NbN coatings were prepared by ICP (inductively coupled plasma) assisted magnetron sputtering from a Nb metal target in $Ar+N_2$ atmosphere at various ICP powers. Effect of ICP on the microstructure, crystalline structure and mechanical properties of NbN coatings was investigated by field emission electron microscopy, X-ray diffraction, atomic force microscopy and nanoindentation measurements. The results show that ICP power has a significant influence on coating microstructure, structure and mechanical properties of NbN coatings. With the increasing of ICP power, coating microstructure evolves from the columnar structure of DC process to a highly dense one. Crystalline structure of NbN coatings were changed from cubic ${\delta}$-NbN to hexagonal ${\beta}-Nb_2N$ with increase of ICP power. The maximum nano hardness of 25.4 GPa with Ra roughness of 0.5 nm was obtained from the NbN coating sputtered at ICP power of 200 W.

Relationship between inductively coupled plasma and crystal structure, mechanical and electrical properties of MoN coatings (유도결합 플라즈마 파워에 따른 MoN 코팅막의 결정구조 및 기계·전기적 특성 변화)

  • Jang, Hoon;Chun, Sung-Yong
    • Journal of the Korean institute of surface engineering
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    • v.55 no.2
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    • pp.77-83
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    • 2022
  • Nanocrystalline MoN coatings were prepared by inductively coupled plasma magnetron sputtering (ICPMS) changing the plasma power from 0 W to 200 W. The properties of the coatings were analyzed by x-ray diffraction, field emission scanning electron microscopy, atomic force microscopy, nanoindentation tester and semiconductor characterization system. As the ICP power increases, the crystal structure of the MoN coatings changed from a mixed phase of γ-Mo2N and α-Mo to a single phase γ-Mo2N. MoN coatings deposited by ICPMS at 200 W showed the most compact microstructure with the highest nanoindentation hardness of 27.1 GPa. The electrical resistivity of the coatings decreased from 691.6 μΩ cm to 325.9 μΩ cm as the ICP power increased.

Effect of Inductively Coupled Plasma (ICP) Power on the Properties of Ultra Hard Nanocrystalline TiN Coatings (유도결합 플라즈마 파워변화에 따른 초경도 나노결정질 TiN 코팅막의 물성변화)

  • Chun, Sung-Yong
    • Journal of the Korean Ceramic Society
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    • v.50 no.3
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    • pp.212-217
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    • 2013
  • Ultra hard TiN coatings were fabricated by DC and ICP (inductively coupled plasma) magnetron sputtering techniques. The effects of ICP power, ranging from 0 to 300 W, on the coating microstructure, crystallographic, and mechanical properties were systematically investigated with FE-SEM, AFM, HR-XRD and nanoindentation. The results show that ICP power has a significant influence on the coating microstructure and mechanical properties of TiN coatings. With an increasing ICP power, the film microstructure evolves from an apparent columnar structure to a highly dense one. Grain sizes of TiN coatings decreased from 12.6 nm to 8.7 nm with an increase of the ICP power. A maximum nanohardness of 67.6 GPa was obtained for the coatings deposited at an ICP power of 300 W. The crystal structure and preferred orientation in the TiN coatings also varied with the ICP power, exerting an effective influence on film nanohardness.

A Comparative Study of Superhard TiN Coatings Deposited by DC and Inductively Coupled Plasma Magnetron Sputtering (DC 스퍼터법과 유도결합 플라즈마 마그네트론 스퍼터법으로 증착된 수퍼하드 TiN 코팅막의 물성 비교연구)

  • Chun, Sung-Yong
    • Journal of the Korean institute of surface engineering
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    • v.46 no.2
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    • pp.55-60
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    • 2013
  • Superhard TiN coatings were fabricated by DC and ICP (inductively coupled plasma) assisted magnetron sputtering techniques. The effect of ICP power, ranging from 0 to 300 W, on coating microstructure, preferred orientation mechanical properties were systematically investigated with HR-XRD, SEM, AFM and nanoindentation. The results show that ICP power has a significant influence on coating microstructure and mechanical properties of TiN coatings. With the increasing of ICP power, coating microstructure evolves from the columnar structure of DC process to a highly dense one. Grain sizes of TiN coatings were decreased from 12.6 nm to 8.7 nm with increase of ICP power. The maximum nanohardness of 67.6 GPa was obtained for the coatings deposited at ICP power of 300 W. Preferred orientation in TiN coatings also vary with ICP power, exerting an effective influence on film nanohardness.

Network function Characterizing the General n-Line 2n-Port coupled Transmission System (일반화한 n선로 결합 전송구조의 회로망 함수)

  • 진년강
    • Journal of the Korean Institute of Telematics and Electronics
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    • v.22 no.3
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    • pp.84-90
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    • 1985
  • A general procedure for finding the immittances of a general, uniformly coupled, n-line structure in an inhomogeneous medium is Presented. The expressions derived in terms of the normal modes of the system are in a convenient matrix form and can be used to compute or to derive the explicit expressions for the elements of the In-port immittance matrix. As an example, the closed form expressions for the elements of the admittance matrix of a sym-metrical four-line eight-port structure are given.

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Field Emission Characteristics a-C:F:N Film Deposited by Inductively Coupled Plasma Chemical Vapor Deposition

  • Jae, Chung-Suk;Jung, Han-Eun;Jang Jin
    • Journal of the Korean Vacuum Society
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    • v.7 no.s1
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    • pp.134-139
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    • 1998
  • Amorphous fluorocarbon (a-C:F) is of interest for low dielectric interlayer material, but in this work we applied this material to FED field emitter. N-doped a-C:F films were deposited by inductively coupled plasma chemical vapor deposition (ICPCVD). The Raman spectra were measured to study the film structure and inter-band optical absorption coefficients were measured using Perkin-Elmer UV-VIS-IR spectrophotometer and optical band gap was obtained using Tauc's plot. XPS spectrum and AFM image were investigated to study bond structure and surface morphology. Current-electric field(I-E) characteristic of the film was measured for the characterization of electron emission properties. The optimum doping concentration was found to be [N2]/[CF4]=9% in the gas phase. The turn-on field and the emission current density at $[N_2]/[CF_4]$=9% were found to be 7.34V/$\mu\textrm{m}$ and 16 $\mu\textrm{A}/\textrm{cm}^2$ at 12.8V/$\mu\textrm{m}$, respectively.

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Microstructural evolution of tantalum nitride thin films synthesized by inductively coupled plasma sputtering

  • Sung-Il Baik;Young-Woon Kim
    • Applied Microscopy
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    • v.50
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    • pp.7.1-7.10
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    • 2020
  • Tantalum nitride (TaNx) thin films were grown utilizing an inductively coupled plasma (ICP) assisted direct current (DC) sputtering, and 20-100% improved microhardness values were obtained. The detailed microstructural changes of the TaNx films were characterized utilizing transmission electron microscopy (TEM), as a function of nitrogen gas fraction and ICP power. As nitrogen gas fraction increases from 0.05 to 0.15, the TaNx phase evolves from body-centered-cubic (b.c.c.) TaN0.1, to face-centered-cubic (f.c.c.) δ-TaN, to hexagonal-close-packing (h.c.p.) ε-TaN phase. By increasing ICP power from 100 W to 400 W, the f.c.c. δ- TaN phase becomes the main phase in all nitrogen fractions investigated. The higher ICP power enhances the mobility of Ta and N ions, which stabilizes the δ-TaN phase like a high-temperature regime and removes the micro-voids between the columnar grains in the TaNx film. The dense δ-TaN structure with reduced columnar grains and micro-voids increases the strength of the TaNx film.