• Title/Summary/Keyword: compact random set

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DISSIPATIVE RANDOM DYNAMICAL SYSTEMS AND LEVINSON CENTER

  • Asmahan A. Yasir;Ihsan J. Kadhim
    • Nonlinear Functional Analysis and Applications
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    • v.28 no.2
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    • pp.521-535
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    • 2023
  • In this work, some various types of Dissipativity in random dynamical systems are introduced and studied: point, compact, local, bounded and weak. Moreover, the notion of random Levinson center for compactly dissipative random dynamical systems presented and prove some essential results related with this notion.

Random completley generalized nonlinear variational inclusions with non-compact valued random mappings

  • Huang, Nan-Jing;Xiang Long;Cho, Yeol-Je
    • Bulletin of the Korean Mathematical Society
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    • v.34 no.4
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    • pp.603-615
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    • 1997
  • In this paper, we introduce and study a new class of random completely generalized nonlinear variational inclusions with non-compact valued random mappings and construct some new iterative algorithms. We prove the existence of random solutions for this class of random variational inclusions and the convergence of random iterative sequences generated by the algorithms.

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The Concepts of Tightness for Fuzzy Set Valued Random Variables

  • Kim, Yun-Kyong
    • International Journal of Fuzzy Logic and Intelligent Systems
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    • v.9 no.2
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    • pp.147-153
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    • 2009
  • In this paper, we introduce several concepts of tightness for a sequence of random variables taking values in the space of normal and upper-semicontinuous fuzzy sets with compact support in $R^p$ and give some characterizations of their concepts. Also, counter-examples for the relationships between the concepts of tightness are given.

An Empirical Central Limit Theorem for the Kaplan-Meier Integral Process on [0,$\infty$)

  • Bae, Jong-Sig
    • Journal of the Korean Statistical Society
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    • v.26 no.2
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    • pp.231-243
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    • 1997
  • In this paper we investigate weak convergence of the intergral processes whose index set is the non-compact infinite time interval. Our first goal is to develop the empirical central limit theorem as random elements of [0, .infty.) for an integral process which is constructed from iid variables. In developing the weak convergence as random elements of D[0, .infty.), we will use a result of Ossiander(4) whose proof heavily depends on the total boundedness of the index set. Our next goal is to establish the empirical central limit theorem for the Kaplan-Meier integral process as random elements of D[0, .infty.). In achieving the the goal, we will use the above iid result, a representation of State(6) on the Kaplan-Meier integral, and a lemma on the uniform order of convergence. The first result, in some sense, generalizes the result of empirical central limit therem of Pollard(5) where the process is regarded as random elements of D[-.infty., .infty.] and the sample paths of limiting Gaussian process may jump. The second result generalizes the first result to random censorship model. The later also generalizes one dimensional central limit theorem of Stute(6) to a process version. These results may be used in the nonparametric statistical inference.

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OPENNESS OF ANOSOV FAMILIES

  • Acevedo, Jeovanny de Jesus Muentes
    • Journal of the Korean Mathematical Society
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    • v.55 no.3
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    • pp.575-591
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    • 2018
  • Anosov families were introduced by A. Fisher and P. Arnoux motivated by generalizing the notion of Anosov diffeomorphism defined on a compact Riemannian manifold. Roughly, an Anosov family is a two-sided sequence of diffeomorphisms (or non-stationary dynamical system) with similar behavior to an Anosov diffeomorphisms. We show that the set consisting of Anosov families is an open subset of the set consisting of two-sided sequences of diffeomorphisms, which is equipped with the strong topology (or Whitney topology).

Random Pattern Testability of AND/XOR Circuits

  • Lee, Gueesang
    • Journal of Electrical Engineering and information Science
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    • v.3 no.1
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    • pp.8-13
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    • 1998
  • Often ESOP(Exclusive Sum of Products) expressions provide more compact representations of logic functions and implemented circuits are known to be highly testable. Motivated by the merits of using XOR(Exclusive-OR) gates in circuit design, ESOP(Exclusive Sum of Products) expressions are considered s the input to the logic synthesis for random pattern testability. The problem of interest in this paper is whether ESOP expressions provide better random testability than corresponding SOP expressions of the given function. Since XOR gates are used to collect product terms of ESOP expression, fault propagation is not affected by any other product terms in the ESOP expression. Therefore the test set for a fault in ESOP expressions becomes larger than that of SOP expressions, thereby providing better random testability. Experimental results show that in many cases, ESOP expressions require much less random patterns compared to SOP expressions.

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PCA vs. ICA for Face Recognition

  • Lee, Oyoung;Park, Hyeyoung;Park, Seung-Jin
    • Proceedings of the IEEK Conference
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    • 2000.07b
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    • pp.873-876
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    • 2000
  • The information-theoretic approach to face recognition is based on the compact coding where face images are decomposed into a small set of basis images. Most popular method for the compact coding may be the principal component analysis (PCA) which eigenface methods are based on. PCA based methods exploit only second-order statistical structure of the data, so higher- order statistical dependencies among pixels are not considered. Independent component analysis (ICA) is a signal processing technique whose goal is to express a set of random variables as linear combinations of statistically independent component variables. ICA exploits high-order statistical structure of the data that contains important information. In this paper we employ the ICA for the efficient feature extraction from face images and show that ICA outperforms the PCA in the task of face recognition. Experimental results using a simple nearest classifier and multi layer perceptron (MLP) are presented to illustrate the performance of the proposed method.

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LARGE TIME ASYMPTOTICS OF LEVY PROCESSES AND RANDOM WALKS

  • Jain, Naresh C.
    • Journal of the Korean Mathematical Society
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    • v.35 no.3
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    • pp.583-611
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    • 1998
  • We consider a general class of real-valued Levy processes {X(t), $t\geq0$}, and obtain suitable large deviation results for the empiricals L(t, A) defined by $t^{-1}{\int^t}_01_A$(X(s)ds for t > 0 and a Borel subset A of R. These results are used to obtain the asymptotic behavior of P{Z(t) < a}, where Z(t) = $sup_{u\leqt}\midx(u)\mid$ as $t\longrightarrow\infty$, in terms of the rate function in the large deviation principle. A subclass of these processes is the Feller class: there exist nonrandom functions b(t) and a(t) > 0 such that {(X(t) - b(t))/a(t) : t > 0} is stochastically compact, i.e., each sequence has a weakly convergent subsequence with a nondegenerate limit. The stable processes are in this class, but it is much larger. We consider processes in this class for which b(t) may be taken to be zero. For any t > 0, we consider the renormalized process ${X(u\psi(t))/a(\psi(t)),u\geq0}$, where $\psi$(t) = $t(log log t)^{-1}$, and obtain large deviation probability estimates for $L_{t}(A)$ := $(log log t)^{-1}$${\int_{0}}^{loglogt}1_A$$(X(u\psi(t))/a(\psi(t)))dv$. It turns out that the upper and lower bounds are sharp and depend on the entire compact set of limit laws of {X(t)/a(t)}. The results extend to random walks in the Feller class as well. Earlier results of this nature were obtained by Donsker and Varadhan for symmetric stable processes and by Jain for random walks in the domain of attraction of a stable law.

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