• 제목/요약/키워드: c-FLIP

검색결과 158건 처리시간 0.022초

미세피치용 Cu/SnAg 더블 범프 플립칩 어셈블리의 신뢰성에 관한 연구 (Reliability Studies on Cu/SnAg Double-Bump Flip Chip Assemblies for Fine Pitch Applications)

  • 손호영;김일호;이순복;정기조;박병진;백경욱
    • 마이크로전자및패키징학회지
    • /
    • 제15권2호
    • /
    • pp.37-45
    • /
    • 2008
  • 본 논문에서는 유기 기판 위에 $100{\mu}m$ 피치를 갖는 플립칩 구조인 Cu(60 um)/SnAg(20 um) 더블 범프 플립칩 어셈블리를 구현하여 이의 리플로우, 고온 유지 신뢰성, 열주기 신뢰성, Electromigration 신뢰성을 평가하였다. 먼저, 리플로우의 경우 횟수와 온도에 상관없이 범프 접속 저항의 변화는 거의 나타나지 않음을 알 수 있었다. 125도 고온 유지 시험에서는 2000시간까지 접속 저항 변화가 관찰되지 않았던 반면, 150도에서는 Kirkendall void의 형성으로 인한 접속 저항의 증가가 관찰되었다 또한 Electromigration 시험에서는 600시간까지 불량이 발생하지 않았는데 이는 Al금속 배선에서 유발되는 높은 전류 밀도가 Cu 칼럼의 높은 두께로 인해 솔더 영역에서는 낮아지기 때문으로 해석되었다. 열주기 시험의 경우, 400 cycle 이후부터 접속 저항의 증가가 발견되었으며, 이는 열주기 시험 동안 실리콘 칩과 Cu 칼럼 사이에 작용하는 압축 변형에 의해 그 사이에 있는 Al 및 Ti 층이 바깥쪽으로 밀려나감으로 인해 발생하는 것으로 확인되었다.

  • PDF

플립칩 Sn-3.5Ag 솔더범프의 Electromigration과 Thermomigration 특성 (Electromigration and Thermomigration Characteristics in Flip Chip Sn-3.5Ag Solder Bump)

  • 이장희;임기태;양승택;서민석;정관호;변광유;박영배
    • 대한금속재료학회지
    • /
    • 제46권5호
    • /
    • pp.310-314
    • /
    • 2008
  • Electromigration test of flip chip solder bump is performed at $140^{\circ}C$ C and $4.6{\times}10^4A/cm^2$ conditions in order to compare electromigration with thermomigration behaviors by using electroplated Sn-3.5Ag solder bump with Cu under-bump-metallurgy. As a result of measuring resistance with stressing time, failure mechanism of solder bump was evaluated to have four steps by the fail time. Discrete steps of resistance change during electromigration test are directly compared with microstructural evolution of cross-sectioned solder bump at each step. Thermal gradient in solder bump is very high and the contribution of thermomigration to atomic flux is comparable with pure electromigration effect.

플립칩용 에폭시 접착제의 저온 속경화 거동에 미치는 경화제의 영향 (Effects of Hardeners on the Low-Temperature Snap Cure Behaviors of Epoxy Adhesives for Flip Chip Bonding)

  • 최원정;유세훈;이효수;김목순;김준기
    • 한국재료학회지
    • /
    • 제22권9호
    • /
    • pp.454-458
    • /
    • 2012
  • Various adhesive materials are used in flip chip packaging for electrical interconnection and structural reinforcement. In cases of COF(chip on film) packages, low temperature bonding adhesive is currently needed for the utilization of low thermal resistance substrate films, such as PEN(polyethylene naphthalate) and PET(polyethylene terephthalate). In this study, the effects of anhydride and dihydrazide hardeners on the low-temperature snap cure behavior of epoxy based non-conductive pastes(NCPs) were investigated to reduce flip chip bonding temperature. Dynamic DSC(differential scanning calorimetry) and isothermal DEA(dielectric analysis) results showed that the curing rate of MHHPA(hexahydro-4-methylphthalic anhydride) at $160^{\circ}C$ was faster than that of ADH(adipic dihydrazide) when considering the onset and peak curing temperatures. In a die shear test performed after flip chip bonding, however, ADH-containing formulations indicated faster trends in reaching saturated bond strength values due to the post curing effect. More enhanced HAST(highly accelerated stress test) reliability could be achieved in an assembly having a higher initial bond strength and, thus, MHHPA is considered to be a more effective hardener than ADH for low temperature snap cure NCPs.

비전도성 접착제가 사용된 플립칩 패키지의 신뢰성에 관한 연구 (Characteristics of Reliability for Flip Chip Package with Non-conductive paste)

  • 노보인;이종범;원성호;정승부
    • 마이크로전자및패키징학회지
    • /
    • 제14권4호
    • /
    • pp.9-14
    • /
    • 2007
  • 본 연구에서는 가속화 조건에서의 비전도성 접착제가 사용된 플립칩 패키지의 열적 신뢰성에 관하여 평가하였다. 실리콘 칩에 $17{\mu}m$두께의 Au 범프를 형성하고 무전해 Ni/Au 도금과 Cu 패드의 두께가 각각 $5{\mu}m$$25{\mu}m$로 형성된 연성 기판을 사용하여 플립칩 패키지를 형성하였다. 유리전이온도가 $72^{\circ}C$인 비전도성 접착제를 사용하여 플립칩을 접합시킨 후 열충격 시험과 항온항습 시험을 실시하였다. 열충격 싸이클과 항온항습 유지 시간이 증가할수록 플립칩 패키지의 전기 저항이 증가하는 것을 확인할 수 있었다. 이는 Au 범프와 Au 범프 사이의 균열, 칩과 비전도성 접착제 또는 기판과 비전도성 접착제 사이의 층간 분리에 의한 것으로 사료된다. 또한 항온항습 하에서의 전기 저항의 변화가 열충격하에서 보다 큰 것을 확인할 수 있었다. 따라서 비전도성 접착제가 사용된 플립칩 패키지는 온도보다 습기에 더욱 민감하다는 것을 알 수 있었다.

  • PDF

마이크로솔더링을 이용한 정전류다이오드 회로 자외선 LED 광원모듈 제작 (Fabrication Of Ultraviolet LED Light Source Module Of Current Limiting Diode Circuit By Using Flip Chip Micro Soldering)

  • 박종민;유순재;카완 안일
    • 한국전기전자재료학회논문지
    • /
    • 제29권4호
    • /
    • pp.237-240
    • /
    • 2016
  • The improvement of irradiation intensity and irradiation uniformity is essential for large area and high power UVA light source application. In this study, large number of chips bonded by micro soldering technique were driven by low current, and current limiting diodes were configured to supply constant current to parallel circuits consisting of large number of series strings. The dimension of light source module circuit board was $350{\times}90mm^2$ and 16,650 numbers of 385 nm flip chip LEDs were used with a configuration of 90 parallel and 185 series strings. The space between LEDs in parallel and series strings were maintained at 1.9 mm and 1.0 mm distance, respectively. The size of the flip chip was $750{\times}750{\mu}m^2$ were used with contact pads of $260{\times}669{\mu}m^2$ size, and SAC (96.5 Sn/3.0 Ag/0.5 Cu) solder was used for flip chip bonding. The fabricated light source module with 7.5 m A supply current showed temperature rise of $66^{\circ}C$, whereas irradiation was measured to be $300mW/cm^2$. Inaddition, 0.23% variation of the constant current in each series string was demonstrated.

최적화된 Flip Angle Pattern을 사용한 Turbo FLASH MRI: Inversion-Recovery T1-Weighted Imaging에의 응용 (Turbo FLASH NRI Using Optimized Flip Angle Pattern: Application to Inversion-Recovery T1-Weighted Imaging)

  • 오창현;최환준;양윤정;이덕래;류연철;현정호;김사라;이윤;정관진;안창범
    • 대한의용생체공학회:학술대회논문집
    • /
    • 대한의용생체공학회 1998년도 추계학술대회
    • /
    • pp.55-56
    • /
    • 1998
  • The 3-D Fast Gradient Echo (Turbo FLASH, Turbo Fast Low Angle Shot) sequence is optimized to achieve a good T1 contrast using variable excitation flip angles. In Turbo FLASH sequence, depending on the contrast preparation scheme, various types of image contrast can be established. While proton density contrast is obtained when using a short repetition time with a short echo time and small flip angles, T1 or T2 weighting can be obtained with proper contrast preparation sequences applied before the above proton density Turbo FLASH sequence. To maximize the contrast to noise ratio while retaining a sharp impulse response (smooth frequency domain response), the excitation flip-angle pattern is optimized through simulation and experiments. The TI (the delay after the preparation sequence which is a 180 degree inversion RF pulse in the IR T1 weighted imaging case), TD (the delay time between the Turbo FLASH sequence and the next preparation), and TR are also optimized fur the best image quality. The proposed 3-D Turbo FLASH provides $1mm\times1mm\times1.5mm$ high resolution images within a reasonable 5-8 minutes of imaging time. The proposed imaging sequence has been implemented in a Medison's Magnum 1.0T system and verified through simulations as well as human volunteer imaging. The experimental results show the utility of the proposed method.

  • PDF

회로 분할에 의한 순차회로의 테스트생성 (Test Generation for Sequential Circuits Based on Circuit Partitioning)

  • 최호용
    • 전자공학회논문지C
    • /
    • 제35C권4호
    • /
    • pp.30-37
    • /
    • 1998
  • In this paper, we propose a test generation method for large scale sequential circuits based on circuit partitioning to increase the size of circuits that the implicit product machine traversal (IPMT) method can handle. Our method paratitions a circuit under test into subset circuits with only single output, and performs a partial scan design using the state transtition cost that represents a degree of the connectivity of the subset circuit. The IPMT method is applied to the partitioned partial scan circuits in test generation. Experimental results for ISCAS89 benchmark circuits with more thatn 50 flip-flops show that our method has generated test patterns with almost 100% fault coverage at high speed by use of 34%-73% scanned flip-flops.

  • PDF

플립 칩 BGA 최종 검사를 위한 최대퍼지엔트로피 기반의 다중임계값 선정 알고리즘 (A Multiple Threshold Selection Algorithm Based on Maximum Fuzzy Entropy for the Final Inspection of Flip Chip BGA)

  • 김경범
    • 한국정밀공학회지
    • /
    • 제21권4호
    • /
    • pp.202-209
    • /
    • 2004
  • Quality control is essential to the final product in BGA-type PCB fabrication. So, many automatic vision systems have been developed to achieve speedy, low cost and high quality inspection. A multiple threshold selection algorithm is a very important technique for machine vision based inspection. In this paper, an inspected image is modeled by using fuzzy sets and then the parameters of specified membership functions are estimated to be in maximum fuzzy entropy with the probability of the fuzzy sets, using the exhausted search method. Fuzzy c-partitions with the estimated parameters are automatically generated, and then multiple thresholds are selected as the crossover points of the fuzzy sets that form the estimated fuzzy partitions. Several experiments related to flip chip BGA images show that the proposed algorithm outperforms previous ones using both entropy and variance, and also can be successfully applied to AVI systems.

2.5GHz $0.25{\mu}m$ CMOS Dual-Modulus 프리스케일러 설계 (Design of a 2.5GHz $0.25{\mu}m$ CMOS Dual-Modulus Prescaler)

  • 오근창;강기섭;박종태;유종근
    • 대한전기학회:학술대회논문집
    • /
    • 대한전기학회 2006년 학술대회 논문집 정보 및 제어부문
    • /
    • pp.476-478
    • /
    • 2006
  • A prescaler is an essential building block for PLL-based frequency synthesizers and must satisfy high-speed and low-power characteristics. The design of D-flip flips used in the prescaler implementation is thus critical. In this paper a 64/65, 128/129 dual-modulus prescaler is designed using a $0.25{\mu}m$ CMOS process. In the design a new dynamic D-flip flop is employed, where glitches are minimized using discharge suppression scheme, speed is improved by making balanced propagation delay, and low power consumption is achieved by removing unnecessary discharge. The designed prescaler operates up to 2.5GHz and consumes 3.1mA at 2.5GHz operation.

  • PDF

Development of Miniature Quad SAW Filter Bank based on PCB Substrate

  • Lee, Young-Jin;Kim, Chang-Il;Paik, Jong-Hoo
    • Transactions on Electrical and Electronic Materials
    • /
    • 제9권1호
    • /
    • pp.33-37
    • /
    • 2008
  • This paper describes the development of a new $5.0{\times}3.2mm$ SAW filter bank which is consist of 12 L, C matching components and 4 SAW bare chips on PCB substrate with CSP technology. We improved the manufacturing cost by removing the ceramic package through direct flip bonding of $LiTaO_3$ SAW bare chip on PCB board after mounting L, C passive element on PCB board. After that we realized the hermitic sealing by laminating the epoxy film. To confirm the confidentiality and durability of the above method, we have obtained the optimum flip bonding & film laminating condition, and figured out material property and structure to secure the durability & moisture proof of PCB board. The newly developed super mini $5.0{\times}3.2mm$ filter bank shows the superior features than those of existing products in confidence, electrical, mechanical characters.