• 제목/요약/키워드: bulk material

검색결과 1,009건 처리시간 0.03초

유전함수를 이용한 ZnO-Bi2O3Cr2O3 바리스터의 a.c. 특성 분석 (Analysis of a.c. Characteristics in ZnO-Bi2O3Cr2O3 Varistor using Dielectric Functions)

  • 홍연우;신효순;여동훈;김진호
    • 한국전기전자재료학회논문지
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    • 제23권5호
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    • pp.368-373
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    • 2010
  • In this study, we have investigated the effects of Cr dopant on the bulk trap levels and grain boundary characteristics of $Bi_2O_3$-based ZnO (ZB) varistor using admittance spectroscopy and dielectric functions (such as $Z^*,\;Y^*,\;M^*,\;{\varepsilon}^*$, and $tan{\delta}$). Admittance spectra show more than two bulk traps of $Zn_i$ and $V_o$ probably in different ionization states in ZnO-$Bi_2O_3-Cr_2O_3$ (ZBCr) system. Three kinds of temperature-dependant activation energies ($E_{bt}'s$) were calculated as 0.11~0.14 eV of attractive coulombic center, 0.16~0.17 eV of $Zn_{\ddot{i}}$, and 0.33 eV of $V_o^{\cdot}$ as dominant bulk defects. The grain boundaries of ZBCr could be electrochemically divided into two types as a sensitive to ambient oxygen i.e. electrically active one and an oxygen-insensitive i.e. electrically inactive one. The grain boundaries were electrically single type under 460 K (equivalent circuit as parallel $R_{gb1}C_{gb1}$) but separated as double one ($R_{gb1}C_{gb1}-R_{gb2}C_{gb2}$) over 480 K. It is revealed that the dielectric functions are very useful tool to separate the overlapped bulk defect levels and to characterize the electrical properties of grain boundaries.

Self Heating Effects in Sub-nm Scale FinFETs

  • Agrawal, Khushabu;Patil, Vilas;Yoon, Geonju;Park, Jinsu;Kim, Jaemin;Pae, Sangwoo;Kim, Jinseok;Cho, Eun-Chel;Junsin, Yi
    • 한국전기전자재료학회논문지
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    • 제33권2호
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    • pp.88-92
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    • 2020
  • Thermal effects in bulk and SOI FinFETs are briefly reviewed herein. Different techniques to measure these thermal effects are studied in detail. Self-heating effects show a strong dependency on geometrical parameters of the device, thereby affecting the reliability and performance of FinFETs. Mobility degradation leads to 7% higher current in bulk FinFETs than in SOI FinFETs. The lower thermal conductivity of SiO2 and higher current densities due to a reduction in device dimensions are the potential reasons behind this degradation. A comparison of both bulk and SOI FinFETs shows that the thermal effects are more dominant in bulk FinFETs as they dissipate more heat because of their lower lattice temperature. However, these thermal effects can be minimized by integrating 2D materials along with high thermal conductive dielectrics into the FinFET device structure.

PD-SOI기판에 제작된 SiGe p-MOSFET의 신뢰성 분석 (Reliability Analysis of SiGe pMOSFETs Formed on PD-SOI)

  • 최상식;최아람;김재연;양전욱;한태현;조덕호;황용우;심규환
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2007년도 하계학술대회 논문집 Vol.8
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    • pp.533-533
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    • 2007
  • The stress effect of SiGe p-type metal oxide semiconductors field effect transistors(MOSFETs) has been investigated to compare device properties using Si bulk and partially depleted silicon on insulator(PD SOI). The electrical properties in SiGe PD SOI presented enhancements in subthreshold slope and drain induced barrier lowering in comparison to SiGe bulk. The reliability of gate oxides on bulk Si and PD SOI has been evaluated using constant voltage stressing to investigate their breakdown (~ 8.5 V) characteristics. Gate leakage was monitored as a function of voltage stressing time to understand the breakdown phenomena for both structures. Stress induced leakage currents are obtained from I-V measurements at specified stress intervals. The 1/f noise was observed to follow the typical $1/f^{\gamma}$ (${\gamma}\;=\;1$) in SiGe bulk devices, but the abnormal behavior ${\gamma}\;=\;2$ in SiGe PD SOI. The difference of noise frequency exponent is mainly attributed to traps at silicon oxide interfaces. We will discuss stress induced instability in conjunction with the 1/f noise characteristics in detail.

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Ni 도핑을 통한 정방성이 높은 벌크 PbTiO3 세라믹 합성 (Fabrication of Bulk PbTiO3 Ceramics with a High c/a Ratio by Ni Doping)

  • 선정우;조재현;조욱
    • 한국전기전자재료학회논문지
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    • 제35권4호
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    • pp.407-411
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    • 2022
  • Bulk-sized PbTiO3 (PT), which is widely known as a high-performance ferroelectric oxide but cannot be fabricated into a monolithic ceramic due to its high c/a ratio, was successfully prepared with a high tetragonality by partially substituting Ni ions for Pb ions using a solid-state reaction method. We found that Ni-doped PT was well-fabricated as a bulk monolith with a significant c/a ratio of ~1.06. X-ray diffraction on as-sintered and crushed samples revealed that NiTiO3 secondary phase was present at the doping level of more than 2 at.%. Scanning electron microscopic study showed that NiTiO3 secondary phase grew on the surface of PT specimens regardless of the doping level possibly due to the evaporation of Pb during sintering. We demonstrated that an unconventional introduction of Ni ions into A-site plays a key role on the fabrication of bulk PT, though how Ni ion functions should be studied further. We expect that this study contributes to a further development of displacive ferroelectric oxides with a high c/a ratio.

벌크 TiO2 산소 공공 결함에 대한 이론적 이해 (Theoretical Insights into Oxygen Vacancies in Reduced Bulk TiO2: A Mini Review)

  • 최재혁;이준호;이태훈
    • 한국전기전자재료학회논문지
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    • 제37권3호
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    • pp.231-240
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    • 2024
  • Titanium dioxide (TiO2) holds significant scientific and technological relevance as a key photocatalyst and resistive random-access memory, demonstrating unique physicochemical properties and serving as an n-type semiconductor. Understanding the density and arrangement of oxygen vacancies (VOs) is crucial for tailoring TiO2's properties to diverse technological needs, driving increased interest in exploring oxygen vacancy complexes and superstructures. In this mini review, we summarize the recent understandings of the fundamental properties of oxygen vacancies in bulk rutile (R-TiO2) and anatase (A-TiO2) based on DFT and beyond method. We specifically focus on the excess electrons and their spatial arrangement of disordered single VO in bulk R and A-TiO2, aligned with the experimental findings. We also highlight the theoretical works on investigating the geometries and stabilities of ordered VOs complexes in bulk TiO2. This comprehensive review provides insights into the fundamental properties of excess electrons in reduced TiO2, offering valuable perspectives for future research and technological advancements in TiO2-based devices.

탄성 변형 영역을 고려한 비정상 평면 변형 이상 공정 이론 (Nonsteady Plane-strain ideal forming with elastic dead zone)

  • 이원오;정관수
    • 한국소성가공학회:학술대회논문집
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    • 한국소성가공학회 2004년도 춘계학술대회 논문집
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    • pp.190-193
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    • 2004
  • Ever since the ideal forming theory has been developed fur process design purposes, application has been limited to sheet forming and, for bulk forming, to two-dimensional steady flow. Here, application for the non-steady case was performed under the plane-strain condition based on the theory previously developed. In the ideal flow, material elements deform following the minimum plastic work path (or mostly proportional true strain path) so that the ideal plane-strain flow can be effectively described using the two-dimensional orthogonal convective coordinate system. Besides kinematics, for a prescribed final part shape, schemes to optimize a preform shape out of a class of initial configurations and also to define the evolution of shapes and boundary tractions were developed. Discussions include the two problematic issues on internal tractions and the non-monotonous straining. For demonstration purposes, numerical calculations were made for a bulk part under forging.

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Nature of Surface and Bulk Defects Induced by Epitaxial Growth in Epitaxial Layer Transfer Wafers

  • Kim, Suk-Goo;Park, Jea-Gun;Paik, Un-Gyu
    • Transactions on Electrical and Electronic Materials
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    • 제5권4호
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    • pp.143-147
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    • 2004
  • Surface defects and bulk defects on SOI wafers are studied. Two new metrologies have been proposed to characterize surface and bulk defects in epitaxial layer transfer (ELTRAN) wafers. They included the following: i) laser scattering particle counter and coordinated atomic force microscopy (AFM) and Cu-decoration for defect isolation and ii) cross-sectional transmission electron microscope (TEM) foil preparation using focused ion beam (FIB) and TEM investigation for defect morphology observation. The size of defect is 7.29 urn by AFM analysis, the density of defect is 0.36 /cm$^2$ at as-direct surface oxide defect (DSOD), 2.52 /cm$^2$ at ox-DSOD. A hole was formed locally without either the silicon or the buried oxide layer (Square Defect) in surface defect. Most of surface defects in ELTRAN wafers originate from particle on the porous silicon.

The Solar Nebular on Fire: A Solution to the Carbon Deficit in the Inner Solar System

  • 이정은
    • 천문학회보
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    • 제35권1호
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    • pp.91.1-91.1
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    • 2010
  • Despite a surface dominated by carbon-based life, the bulk composition of the Earth is dramatically carbon poor when compared to the material available at formation. Bulk carbon deficiency extends into the asteroid belt representing a fossil record of the conditions under which planets are born. The initial steps of planet formation involve the growth of primitive sub-micron silicate and carbon grains in the Solar Nebula. We present a solution wherein primordial carbon grains are preferentially destroyed by oxygen atoms ignited by heating due to stellar accretion at radii < 5 AU. This solution can account for the bulk carbon deficiency in the Earth and meteorites, the compositional gradient within the asteroid belt, and for growing evidence for similar carbon deficiency in rocks surrounding other stars.

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벌크 아몰퍼스 성형의 유한요소 해석 (Finite Element Analysis for forming of bulk amorphous materials)

  • 윤상헌;고헌권;김용일;이용신
    • 대한기계학회:학술대회논문집
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    • 대한기계학회 2003년도 추계학술대회
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    • pp.1804-1809
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    • 2003
  • The purpose of this study is to clarify the bulk/sheet forming characteristics of bulk amorphous alloys in the supercooled liquid state. The temperature dependences of Newtonian viscosities of amorphous materials are obtained based on the previous experimental works. Finite element analyses for compression forming and sheet deep drawing of amorphous materials are performed. Effects of friction coefficients and temperature are examined and formability of amorphous material is explained in detail.

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평면 변형 하에서의 비정상 이상 공정 이론 (Non-steady Ideal Forming in Plane Strain)

  • 정관수;이원오
    • 한국소성가공학회:학술대회논문집
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    • 한국소성가공학회 2002년도 춘계학술대회 논문집
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    • pp.66-69
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    • 2002
  • In the ideal forming theory(1), which has been deviously developed as a direct method for optimizing forming process, material elements are required to deform following the minimum plastic work path (or the proportional true strain path). Besides the general theory(2,3), specific ideal forming theories have been developed for membrane sheet forming(4) as well as two-dimensional steady bulk forming(5-7). In this work, the ideal forming theory was successfully applied for non-steady bulk forming under the plane strain condition. Here, the shape change complying with the minimum plastic work path, was effectively described by developing a numerical code based on the characteristic method. Numerical results obtained for a specific industrial part also include the optimum pre-forming shape and its evolving shape change to the final shape as well as the boundary traction history.

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