• 제목/요약/키워드: breakdown voltage.

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ON 저항이 작은 Recessed Source 구조 SOI LDMOS의 수치해석 (Numerical Analysis of a SOI LDMOS with a Recessed Source for Low ON Resistance)

  • 양회윤;김성룡;최연익
    • 대한전기학회논문지:전기물성ㆍ응용부문C
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    • 제48권9호
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    • pp.605-610
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    • 1999
  • An SOI(Silicon-On-Insulator) LD(Lateral Double-diffused)MOS with a recessed source structure is proposed to improve the on-resistance and the breakdown voltage. The recessed source structure can decrease the on-resistance by reducing the path of electron current, also increase the breakdown voltage by extending the effective length of gate field plate. Simulation results by TSUPREM4 and MEDICI have shown that the on-resistance of the LDMOS with a recessed source was 26% lower than conventional LDMOS. The breakdown voltage of proposed device was found to be 45V while that of conventional device was 36.5 V. At the same breakdown voltage of 36.5V, the on-resistance of the LDMOS with a recessed source was 41% lower than that of conventional structure.

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Cylindrical 구조를 갖는 LDMOS의 Drain 역방향 항복전압의 계산 방법 (The Calculation Method of the Breakdown Voltage for the Drain Region with the Cylindrical Structure in LDMOS)

  • 이은구
    • 전기학회논문지
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    • 제61권12호
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    • pp.1872-1876
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    • 2012
  • A calculation method of the breakdown voltage for the drain region with the cylindrical structure in LDMOS is proposed. The depletion region of the drain is divided into many smaller regions and the doping concentration of each split region is assumed to be uniformly distributed. The field and potential in each split region is calculated by the integration of the Poisson equation and the ionization integral method is used to compute the breakdown voltage. The breakdown voltage resulted from the proposed method shows the maximum relative error of 2.2% compared with the result of the 2-dimensional device simulation using BANDIS.

사이리스터의 결함과 항복전압의 관계 분석 (Analysis of the relationship between breakdown voltage and defect of thyristor)

  • 이양재;서길수;김형우;김기현;김상철;김남균;김병철
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2005년도 하계학술대회 논문집 Vol.6
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    • pp.149-150
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    • 2005
  • Thyristor breakdown voltage variation acceleration aging test was investigated. The breakdown voltage was deceased after 1000 hours acceleration aging test. It temperature rising caused by electric field concentration at the edge beveling region of the thyristor was confirmed using Silvaco device simulation. The local temperature rising is driving force for the defect propagation. Consequently, propagated defects of the beveling region seems to decrease thyristor's breakdown voltage.

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견인전동기 고정자 권선의 절연상태 분석 (Analysis of Insulation Condition in Traction Motor Stator Windings)

  • 김희동;박영
    • 한국전기전자재료학회논문지
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    • 제20권7호
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    • pp.631-635
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    • 2007
  • Diagnostic, surge and ac breakdown tests are widely used to evaluate the insulation condition of stator winding in traction motor. Diagnostic test included ac current, tan delta and maximum partial discharge. The result of diagnostic test indicates that five kinds of stator windings are good condition. Surge test was peformed to confirm the healthy of turn insulation in stator windings. This test is very easy to detect the turn insulation failure between normal and defect stator windings. After completing the diagnostic test, ac breakdown test has conducted gradually increasing ac voltage, until the stator winding punctured. No. 5 stator windings failed near rated voltage of 18.9 kV The breakdown voltage of No. 1 stator windings was 13.0 kV The ac breakdown voltage of normal winding is about 1.45 times higher than that of defect windings. The failure was located in a line-end coil at the exit from the core slot.

표면 도핑 기법을 사용한 SOI RESURF LDMOSFET의 항복전압 및 온-저항 특성 분석 (Breakdown Voltage and On-resistance Characteristics of the Surface Doped SOI RESURF LDMOSFET)

  • 김형우;김상철;방욱;강인호;김기현;김남균
    • 한국전기전자재료학회논문지
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    • 제19권1호
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    • pp.23-28
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    • 2006
  • In this paper, breakdown voltage and on-resistance characteristics of the surface doped SOI RESURF LDMOSFET were investigated as a function of surface doping depth. In order to verify the variation of characteristics, two-dimensional device simulation was carried out. Breakdown voltage of the proposed structure is varied from $73 {\~}138V$ while surface doping depth varied from $0.5{\~}2.0{\mu}m$. And on-resistance is decreased from $0.18{\~}0.143{\Omega}/cm^2$ while surface doping depth increased from $0.5 {\~}2.0{\mu}m$. Maximum breakdown voltage of the proposed structure is 138 V at $1.5{\mu}m$ depth of surface doping, yielding $22.1\%$ of improvement of breakdown voltage in comparison with that of the conventional SOI RESURF LDMOSFET with same epi-layer concentration. On-resistance characteristic is also improved about $21.7\%$.

A Study on the Design and Electrical Characteristics Enhancement of the Floating Island IGBT with Low On-Resistance

  • Jung, Eun-Sik;Cho, Yu-Seup;Kang, Ey-Goo;Kim, Yong-Tae;Sung, Man-Young
    • Journal of Electrical Engineering and Technology
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    • 제7권4호
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    • pp.601-605
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    • 2012
  • Insulated Gate Bipolar Transistors(IGBTs) have received wide attention because of their high current conduction and good switching characteristics. To reduce the power loss of IGBT, the onstate voltage drop should be lowered and the switching time should be shortened. However, there is trade-off between the breakdown voltage and the on-state voltage drop. The FLoatingIsland(FLI) structure can lower the on-state voltage drop without reducing breakdown voltage. In this paper, The FLI IGBT shows an on-state voltage drop that is 22.5% lower than the conventional IGBT, even though the breakdown voltages of each IGBT are almost identical.

고전압 전력기기 개발을 위한 기중 절연파괴특성 분석에 관한 연구 (A Study on the Lightning Impulse Dielectric Characteristics of Air for the Development of Air-Insulated High Voltage Apparatuses)

  • 남석호;강형구
    • 전기학회논문지
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    • 제60권5호
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    • pp.1005-1010
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    • 2011
  • The accidents caused by dielectric instability have been increasing in power grid. It is important to enhance the dielectric reliability of a high voltage apparatus to reduce the damage from electrical hazards. To develop an electrically reliable high voltage apparatus, the experimental study on the electrical breakdown field strength is indispensable, as well as theoretical approach. In this paper, the lightning impulse breakdown characteristics considering utilization factors are studied for the establishment of insulation design criteria of an high voltage apparatus. The utilization factors are represented as the ratio of mean electric field to maximum electric field. Dielectric experiments are performed by using several kinds of sphere-plane electrode systems made of stainless steel. As a result, it is found that dielectric characteristics are affected by not only maximum electric field intensity but also utilization factors of electrode systems. The results are expected to be applicable to designing the air-insulated high voltage apparatuses.

A Study on the Insulation Characteristics for Stator Windings of IGBT PWM Inverter-Fed Induction Motors

  • Hwang, Don-Ha;Kang, Dong-Sik;Kim, Yong-Joo;Lim, Tae-Hoon;Bae Sung-Woo;Kim Dong-Hee;Ro Chae-Gyun
    • Journal of Power Electronics
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    • 제3권3호
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    • pp.159-166
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    • 2003
  • The winding insulation of low-voltage induction motors in adjustable-speed drive system with voltage-fed Inverters is substantially stressed due to the uneven voltage distribution and excessive voltage stress (dv/dt), which result in the premature insulation breakdown In this paper, the detailed insulation test results of 26 low-voltage induction motors are presented. Six different types of insulation techniques are applied to 26 motors. The insulation characteristics are analyzed with partial discharge, discharge inception voltage, AC current, and dissipation factor tests Also, insulation breakdown tests by high voltage pulses are performed, and the corresponding breakdown voltages obtained.

트렌치 콜렉터를 가지는 새로운 TIGBT 에 관한 연구 (A Study on the Novel TIGBT with Trench Collector)

  • 이재인;양성민;배영석;성만영
    • 한국전기전자재료학회논문지
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    • 제23권3호
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    • pp.190-193
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    • 2010
  • Various power semiconductor devices have been developed and evolved since 1950s. Among them, IGBT is the most developed power semiconductor device which has high breakdown voltage, high current conduction and suitable switching speed which perform trade-offs between each other. In other words, there are trade-offs between a breakdown voltage and on-state voltage drop, and between on-state voltage drop and turn-off time. In this paper, the new structure is proposed to improve a trade-off between a breakdown voltage and on-state voltage drop. The proposed structure has a trench collector and this trench collector induces an accumulation layer at the bottom of an n-drift region during off-state. And this accumulation layer prevents expansion of depletion layer so that trapezoidal electric field distribution is performed in the n-drift region. As a result of this, breakdown voltage is increased without increasing on-state voltage drop. The electrical characteristics of the proposed IGBT is analyzed and optimized by using representative device simulator, TSUPREM4 and MEDICI. After optimization, the electrical characteristics of the proposed IGBT is compared with NPT IGBT which have the same device thickness. As a result of this, it can be confirmed that the proposed structure increases the breakdown voltage of 800 V than that of the conventional NPT IGBT without increasing the on-state voltage drop.

362 kV GIB 내에서 건조공기의 절연파괴 특성 (Breakdown Characteristics of Dry Air under 362 kV GIB)

  • 한기선;주형준;윤진열;유홍근
    • 한국전기전자재료학회논문지
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    • 제23권10호
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    • pp.804-808
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    • 2010
  • In this paper, we studied the dielectric breakdown voltage characteristics by the AC withstand voltage test on using green insulation dry air instead of $SF_6$ insulation gas used in the GIB (gas insulated bus) of 362 kV GIS (gas insulated switchgear). The AC withstand voltage test applied to the standard KEPCO's 362 kV GIB with dry air insulation, and the equivalence of dielectric breakdown voltage for dry air and $SF_6$ gas were examined, and the empirical formulas of dielectric breakdown voltage for dry air were calculated, and the criterion of AC withstand voltage test for dry air insulation was derived. Using the criterion, dry air can be used instead of $SF_6$ gas for 362 kV GIB in the factory acceptance test was confirmed.