• Title/Summary/Keyword: accelerated stress test

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A Study on the Life Characteristic of an Automotive Water-pump Bearing Using the Accelerated Test Method (가속시험법을 활용한 자동차용 워터펌프 베어링의 수명특성에 관한 연구)

  • Yang, Hui Sun;Shin, Jung Hun;Park, Jong Won;Sung, Baek Ju
    • Tribology and Lubricants
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    • v.31 no.2
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    • pp.35-41
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    • 2015
  • A water-pump located in the cooling area of a car circulates cooling water. A particular bearing element, known as a water-pump bearing, installed in the rotating part carries the entire load. The failure of this water-pump bearing has a direct impact on the failure of the automobile engine, and so securing its reliability is crucial. Several researchers have examined the design principles of the water-pump bearing, but there are no reports on the life characteristic of the bearing yet. Herein, we report the construction of test equipment to reproduce the spalling of the roller contact, which is the main failure mode of the chosen water-pump bearing. We chose the radial load as an accelerated stress factor and validated the failure mode by monitoring the surface defects. We conducted the accelerated life test after determining the accelerated stress level through a combination of finite element analysis and a preliminary test. In the life tests, we used an accelerometer to perform failure diagnosis. In the last stage of this study, we present a statistical reliability analysis. Thus, we fully estimated the shape parameter of the water-pump bearing, accelerating level on the load , and the lifetime (MTTF and B10 life) under real use conditions, and finally proposed an interval estimation value considering the uncertainty of the estimated value.

Effects of Ganoderma lucidum Extract on Memory and Oxidative Stress of Senescence-Accelerated Mouse (노화촉진마우스의 기억력 및 산화 스트레스에 미치는 영지 (Ganoderma lucidum) 추출물의 영향)

  • 유제권;최선주;강종구;한상섭
    • Journal of Life Science
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    • v.9 no.5
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    • pp.548-555
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    • 1999
  • Long-term effects of Ganoderma lucidum (GL) on memory and oxidative stress of senescence-accelerated mice (SAM) were investigated. Senescence-resistant (R1) and prone (P8) strains of SAM were fed GL diets, premixed with low (20 mg/kg/day, T1) or high (200 mg/kg/day, T2) levels of GL powder for 9 months starting from young (3 months of age) or for 5 months starting from old (7 months of age). After the final feeding at 12 months of age, all animals were subjected to passive avoidance test for the evaluation of memory function. In addition, the changes in hepatic thiobarbituric acid-reactive substance (TBARS) and glutathione were analyzed. SAMP8 fed GL diets from old age (7 months) exhibited the improvement of memory, although GL rather inhibited the memory function of both SAMR1 and SAMP8 mice fed diets from young (3 months of age). Hepatic TBARS contents were decreased in SAMP8 fed high GL diet for 9 months and in SAMR1 fed low GL diet for 5 months. Hepatic glutathione content was also remarkably increased in SAMR1 following both feeding periods, and less extent in SAMP8 fed diet for 5 months of age. Taken together, it is proposed that GL extracts may play an anti-aging role through antioxidant action, and thereby may improve the senescence-related memory dysfunction.

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A Study on the Accelerated Life Test of BLDC Motor in Ceiling Mounted Digital Signage Rotating System (천정 거치형 디지털 사이니지 회전 시스템의 BLDC모터 가속수명시험에 관한 연구)

  • Kim, Ki-Hong;Kwon, Soon-Hong;Kwon, Soon-Gu;Park, Jong-Min;Kim, Jong-Soon;Jung, Sung-Won;Choi, Won-Sik
    • Journal of the Korean Society of Industry Convergence
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    • v.21 no.3
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    • pp.141-147
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    • 2018
  • In a time when product development cycles are getting shorter and shorter, many companies are making efforts to develop products with high reliability in a short period of time, accelerated life test is widely used as a method to quickly evaluate reliability. Accelerated life test reduces the test life or the life of the product from the observed data by shortening the lifetime of the product or abruptly lowering the performance under the worse condition than the actual condition in order to shorten the test cost or the test time. In this paper, BL3640A-06P+RB35, DC12V model, which is used in the support device of an automatic rotation type digital signage, which display various information such as textures and images on a display screen in a public place or a commercial space, BLDC motors were subjected to a constant stress test and at the rotational speed of 1rpm, $180^{\circ}$ rotation and reverse rotation under actual use conditions, the stress was imposed on the rotating speed of 2rpm and the weight of the actual installed product from 22.2kgf to 10kgf were installed. The lifetime of the actual use environment condition is 23,545 hours and the rotation speed is accelerated. The life time of the acceleration condition with the additional weight is 1,380 hours. The acceleration factor is calculated as 17.06, the one year guarantee test day is 235 days to 14 days, of the period from 470 days to 28 days, and the third year from 704 days to 42 days. The test date of the BLDC motor was tested on the shortened test date, and the rotational speed and the current value were measured. It is found that there is no defect even if it operates as the test date corresponding to the specified one year warranty period and the 3 year accelerated life test which is experimented. Using the statistical technique of the regression analysis the expected time for the motor to defect to #4 samples was 20 years.

New Accelerated Life Test Plans for Weibull and Lognormal Lifetime Distributions (와이블과 대수정규 수명분포를 따를 때 새로운 가속수명시험 계획의 개발)

  • Seo, Sun-Keun
    • Journal of Applied Reliability
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    • v.14 no.3
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    • pp.182-190
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    • 2014
  • This paper presents new practical accelerated life test plans with different censoring times at three levels of stress for Weibull and lognormal lifetime distributions, respectively. The proposed plans are compared with the corresponding two-level statistically optimal plans and three-level compromise and practical plans. Computational results indicate that new practical plans have been more precise and effective than the existing three-level plans under a constraint of total testing time. In addition, a procedure to determine useful ALT plans is illustrated with a numerical example.

A Study of the Roust Degradation Model by Analyzing the Filament Lamp Degradation Data (헤드램프용 필라멘트 램프 가속열화데이터 분석을 통한 로버스트 열화모형 연구)

  • Sung, Ki-Woo
    • Transactions of the Korean Society of Automotive Engineers
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    • v.20 no.6
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    • pp.132-139
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    • 2012
  • It is generally needed to test durability and lifetime when we develop parts in new technology. In this paper, the accelerated degradation analysis methods are developed to test them. This study is presented robust model estimation method that is less affected by outlier in regresstion model estimation. In addition, the lifetime can be predicted by Degradation-stress relationship in stress level.

Acceleration Test for Package of High Power Phosphor Converted White Light Emitting Diodes (고출력 형광체변환 백색 LED 패키지의 가속시험)

  • Chan, Sung-Il;Yu, Yang-Gi;Jang, Joong-Soon
    • Journal of Applied Reliability
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    • v.10 no.2
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    • pp.137-148
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    • 2010
  • This study deals with the accelerated life test of high power phosphor converted white Light Emitting Diodes (High power LEDs). Samples were aged at $110^{\circ}C$/85% RH and $130^{\circ}C$/85% RH up to 900 hours under non-biased condition. The stress induced a luminous flux decay on LEDs in all the conditions. Aged devices exhibited modification of package silicon color from white to yellowish brown. The instability of the package contributes to the overall degradation of optical lens and structural degradations such as generating bubbles. The degradation mechanisms of lumen decay and reduction of spectrum intensity were ascribed to hygro-mechanical stress which results in package instabilities.

Minimum Mean Squared Error Accelerated Life Test Plans for Exponential Lifetime Distribution

  • Joong Yang Park
    • Communications for Statistical Applications and Methods
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    • v.2 no.2
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    • pp.13-19
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    • 1995
  • This paper considers model robust accelerated life test plans for estimating the logmean or percentile of product lige which is exponentially distributed. A linear relationship between the log mean life and the stress is assumed as usual, while the true relationship is quadratic. Optimum plans are then obtained by minimizing asymptotic mean squared error of maximum likelihood estimator of the log mean life.

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To Ensure A Product Reliability The Study on Accelerated Stress Tests for Magnetic Switch Used in Power Distribution System (제품 신뢰성 확보을 위한 배전 계통에 사용되는 전자개폐기 가속스트레스시험에 관한 연구)

  • Ryu, Haeng-Soo;Park, Sang-Yong;Han, Gyu-Hwan;Kwon, Young-Il;Yoon, Nam-Sik
    • Proceedings of the KIEE Conference
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    • 2005.07a
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    • pp.377-380
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    • 2005
  • In this paper, accelerated stress test(AST) for Magnetic Switch (MS) are applied to assure specified reliability of the products. Magnetic contactor that functions with over-current relay is called MS. Magnetic contactor closes and opens the motor load with ON/OFF switch of electronic contactor. It is also used for protecting and controlling the load. Magnetic contactor detects the over-current flow in the load with a over-current relay and disconnects the load by opening its control power. In this study, AST for product assembly are developed in order to improve the weak point so that increase the product reliability. Also we will show the basic information for the accelerated life test(ALT). The proposed AST results and procedures may be extended and applied to testing similar kinds of products to reduce test times and costs of the tests remarkably. Finally the results of this study will contribute to improving reliability of products and strengthening competitiveness of our products in the world markets.

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Study on the Fatigue Test and the Accelerated Life Test for Dental Implant using Universal-Joint Test Type (유니버설조인트 시험방식을 이용한 치과용 임플란트의 피로시험 및 가속수명시험에 관한 연구)

  • Do, Gyeong Hun;Lee, Seok Jin;Kim, Jong Mi;Kim, Sung Min
    • Journal of Applied Reliability
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    • v.17 no.1
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    • pp.50-57
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    • 2017
  • Purpose : This paper is a comparative analysis results of the fatigue test for dental implants and accelerated life test by using a static type loading device commonly used in Korea and a dynamic type loading device (universal-joint) recommended by FDA. Methods : Fatigue tests of dental implant is based on ISO 14801 and classified into static load test and dynamic load test. The tests were carried out on three test specimens by four load stress steps under each loading device. For analysis on failure mode such as crack, fracture and permanent deformation of test specimens, we used X-ray three-dimensional computed tomography on test specimens before and after the fatigue tests. The design of the accelerated life test was based on the analysis results of the fatigue life data obtained from the dynamic load test and the statistical analysis software (Minitab ver.15) was used to analyze the appropriate life distribution. Results : As a result of the fatigue tests and the accelerated life tests at same acceleration condition under each test method, the fatigue life under the dynamic type loading device (universal-joint) was shorter than when static type loading device was applied. Conclusion : This paper can be used as a reference when the universal-joint type loading device for implants fatigue test is applied as ISO 14801.

A Study on the Reliability Prediction about ECM of Packaging Substrate PCB by Using Accelerated Life Test (가속수명시험을 이용한 Packaging Substrate PCB의 ECM에 대한 신뢰성 예측에 관한 연구)

  • Kang, Dae-Joong;Lee, Hwa-Ki
    • Journal of the Korea Safety Management & Science
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    • v.15 no.1
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    • pp.109-120
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    • 2013
  • As information-oriented industry has been developed and electronic devices has come to be smaller, lighter, multifunctional, and high speed, the components used to the devices need to be much high density and should have find pattern due to high integration. Also, diverse reliability problems happen as user environment is getting harsher. For this reasons, establishing and securing products and components reliability comes to key factor in company's competitiveness. It makes accelerated test important to check product reliability in fast way. Out of fine pattern failure modes, failure of Electrochemical Migration(ECM) is kind of degradation of insulation resistance by electro-chemical reaction, which it comes to be accelerated by biased voltage in high temperature and high humidity environment. In this thesis, the accelerated life test for failure caused by ECM on fine pattern substrate, $20/20{\mu}m$ pattern width/space applied by Semi Additive Process, was performed, and through this test, the investigation of failure mechanism and the life-time prediction evaluation under actual user environment was implemented. The result of accelerated test has been compared and estimated with life distribution and life stress relatively by using Minitab software and its acceleration rate was also tested. Through estimated weibull distribution, B10 life has been estimated under 95% confidence level of failure data happened in each test conditions. And the life in actual usage environment has been predicted by using generalized Eyring model considering temperature and humidity by developing Arrhenius reaction rate theory, and acceleration factors by test conditions have been calculated.