Journal of Applied Reliability (한국신뢰성학회지:신뢰성응용연구)

The Korean Reliability Society (한국신뢰성학회)
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Acceleration Test for Package of High Power Phosphor Converted White Light Emitting Diodes

고출력 형광체변환 백색 LED 패키지의 가속시험

  • Chan, Sung-Il (Reliability Physics Research Center, Korea Electronic Technology Institute) ;
  • Yu, Yang-Gi (Reliability Center, Korea Testing Certification) ;
  • Jang, Joong-Soon (Division of Industrial and Information System Engineering, Ajou University)
  • 천성일 (전자부품연구원 신뢰성물리연구센터) ;
  • 윤양기 (한국기계전기전자시험연구원) ;
  • 장중순 (아주대학교 산업공학과)
  • Received : 2010.01.25
  • Accepted : 2010.03.19
  • Published : 2010.06.25
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Abstract

This study deals with the accelerated life test of high power phosphor converted white Light Emitting Diodes (High power LEDs). Samples were aged at $110^{\circ}C$/85% RH and $130^{\circ}C$/85% RH up to 900 hours under non-biased condition. The stress induced a luminous flux decay on LEDs in all the conditions. Aged devices exhibited modification of package silicon color from white to yellowish brown. The instability of the package contributes to the overall degradation of optical lens and structural degradations such as generating bubbles. The degradation mechanisms of lumen decay and reduction of spectrum intensity were ascribed to hygro-mechanical stress which results in package instabilities.

Keywords

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