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New Accelerated Life Test Plans for Weibull and Lognormal Lifetime Distributions  

Seo, Sun-Keun (Dept. of Industrial & Management Systems Engineering, Dong-A University)
Publication Information
Journal of Applied Reliability / v.14, no.3, 2014 , pp. 182-190 More about this Journal
Abstract
This paper presents new practical accelerated life test plans with different censoring times at three levels of stress for Weibull and lognormal lifetime distributions, respectively. The proposed plans are compared with the corresponding two-level statistically optimal plans and three-level compromise and practical plans. Computational results indicate that new practical plans have been more precise and effective than the existing three-level plans under a constraint of total testing time. In addition, a procedure to determine useful ALT plans is illustrated with a numerical example.
Keywords
Accelerated Life Test; Different Censoring Times; Lognormal Distribution; Practical Test Plan; Weibull Distribution;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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