1 |
서순근.정원기 (1997), 수명이 대수정규분포를 따를 때 연속 및 간헐적 검사하에서 가속수명 시험의 설계와 소표본 연구, 대한산업공학회지, 제23권, pp. 177-196.
|
2 |
서순근.조호성 (1996), 대수정규분포와 간헐적 검사하에서의 가속수명시험 방식의 설계, 품질경영학회지, 제24권, pp. 25-43.
|
3 |
Kielpinski, T. and Nelson, W. (1975), Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distribution, IEEE Trans. on Reliability, R-24, pp. 310-320.
DOI
|
4 |
Ma, H. and Meeker, W. Q. (2010), Strategy for Planning Accelerated Life Tests with Small Sample Sizes, IEEE Trans. on Reliability, R-59, pp. 610-619.
|
5 |
Meeker, W. Q. (1984), A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring, Technometrics, Vol. 26, pp. 157-171.
DOI
|
6 |
Meeker, W. Q. and Hahn, G. J. (1985), How to Plan an Accelerated Life Test-Some Practical Guidelines, ASQC Basic References in Quality Control : Statistical Techniques, Vol. 10.
|
7 |
Meeker, W. Q. and Nelson, W. (1975), Optimum Accelerated Life Tests for the Weibull and Extreme Value Distribution, IEEE Trans. on Reliability, R-24, pp. 321-332.
DOI
|
8 |
Nelson, W. (1990), Accelerated Testing : Statistical Models, Test Plans, and Data Analysis, Wiley, New York.
|
9 |
Nelson, W. and Kielpinski, T. J. (1976), Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distribution, Technometrics, Vol. 18, pp. 105-114.
DOI
ScienceOn
|
10 |
Nelson, W. and Meeker, W. Q. (1978), Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Distributions, Technometrics, Vol. 20, pp. 171-177.
DOI
|
11 |
Seo, S. K. and Kim, K. S.(1996), Optimal Design of Accelerated Life Tests with Different Censoring Times, Journal of Korean Society for Quality Management, Vol. 24, pp. 44-58.
|
12 |
Seo, S. K. and Yum, B. J. (1991), Accelerated Life Test Plans under Intermittent Inspection and Type I Censoring : The Case of Weibull Failure Distribution, Naval Research Logistics, Vol. 38, pp. 1-22.
DOI
|
13 |
Yang, G. and Jin, L. (1994), Best Compromise Test Plans for Weibull Distributions with Different Censoring Times, Quality and Reliability Engineering International, Vol. 10, pp. 411-415.
DOI
|