• Journal of Applied Reliability
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• v.15 no.1
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• pp.52-59
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• 2015

In this Study, we tested electroluminescent film to accelerate life by temperature, humidity, voltage, and frequency. We analyzed brightness data to estimate activation energy and verify it's suitability. All of the tests performed in operating condition. Because electroluminescent film is mostly degraded by fluorescent in operating condition. Two different sample groups were tested and compared to find common parameter.

• Journal of the Korean Society of Safety
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• v.27 no.4
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• pp.13-19
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• 2012

The purpose of this study is to extract the major factors related to the deterioration mechanism of white organic light-emitting diodes(WOLED) by performing accelerated testing of temperature, voltage, time, etc., and to develop an accelerated life test(ALT) model. The measurement results of the brightness of the WOLED exhibited that their average brightness tended to increase as the operating voltage increased and that the half-life period of the brightness appeared after approximately 400 hours when the operating voltage was 20V and the ambient temperature was $85^{\circ}C$. It could be seen that although the WOLED showed comparatively the same brightness when the initial acceleration began after the operating voltage was applied to it, its brightness changed excessively after the WOLED's thermal storage had been made. In addition, it was observed that the half-life period was reduced as the ambient temperature and applied voltage increased. The strength of the WOLED which had been maintained in the range of visible light at the maximum load was reduced by the deterioration of the organic light emitting material due to the influence of the operating voltage and temperature, and the reduction of emitted light was small at low voltage and temperature. It could be seen that the failure of the WOLED during the ALT was caused by wear due to load accumulation over time, and that Weibull distribution was appropriate for the life distribution and acceleration was established between test conditions. From the WOLED analysis, it is thought that factors influencing the brightness deterioration are voltage, temperature, etc., and that comprehensive analysis considering discharge control, dielectric tangent margin, etc., would further increase the reliability.

• Journal of the Korean Data and Information Science Society
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• v.5 no.2
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• pp.75-85
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• 1994

In this paper, I introduce the goodness-of-fit test statistics for exponential distribution using accelerated life test data. The ALT lifetime data were obtained by assuming step-stress ALT model, specially TRV model introduced by DeGroot and Goel(1979). The critical values are obtained for proposed test statistics, Kolmogorov-Smirnov, Kuiper, Watson, Cramer-von Mises, Anderson-Darling type, under various sample sizes and significance levels. The powers of the five test statistic are compared through Monte-Cairo simulation technique.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.39A no.10
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• pp.616-618
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• 2014

In this paper, we designed the accelerated life testing(ALT) and presented the lifetime prediction method of the RF SAW duplexer. We determined RF input power as an accelerated stress when designing an accelerating life testing and defined the lifetime of the duplexer as the period during which the insertion loss increased by 0.5[dB]. Lifetime prediction results of duplexer was estimated for 82,900hours at an ambient temperature of $85^{\circ}C$ and RF input power of 30[dBm].

• Proceedings of the KIEE Conference
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• 2002.07a
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• pp.536-540
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• 2002

In this paper, accelerated life test (ALT) models and procedures for Magnetic Switch (MS) are developed and applied to assure specified reliability of the products at development phase and guarantee the life of the products. Magnetic contactor that functions with over-current relay is called MS. Magnetic contactor closes and opens the motor load with ON/OFF switch of electronic contactor. It is also used for protecting and controlling the load. Magnetic contactor detects the over-current flow in the load with a over-current relay and disconnects the load by opening its control power. In this study, ALT models for MS are developed using the relationship between stresses and life characteristics of products. Using the ALT models, we performed life tests and analyzed the tests results. The proposed ALT models and procedures may be extended and applied to testing similar kinds of products to reduce test times and costs of the tests remarkably. Finally the results of this study will contribute to improving reliability of products and strengthening competitiveness of our products in world markets.

• Proceedings of the Korean Reliability Society Conference
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• 2004.07a
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• pp.129-137
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• 2004

This paper presents an accelerated life test for burnout of tungsten filament of incandescent lamp. From failure analyses of field samples, it is shown that their root causes are local heating or hot sports in the filament caused by tungsten evaporation and wire sag. Finite element analysis is performed to evaluate the effect of vibration and impact for burnout, but any points of stress concentration or structural weakness are not found in the sample. To estimate the burnout life of lamp, an accelerated life test is planned by using quality function deployment and fractional factorial design, where voltage, vibration, and temperature are selected as accelerating variables. We assumed that Weibull lifetime distribution and a generalized linear model of life-stress relationship hold through goodness of fit test and test for common shape parameter of the distribution. Using accelerated life testing software, we estimated the common shape parameter of Weibull distribution, life-stress relationship, and accelerating factor.

• Journal of Korean Institute of Industrial Engineers
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• v.25 no.4
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• pp.517-526
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• 1999

This paper deals with two economic optimal designs of constant-stress accelerated life test(ALT) where failure distribution follows one of location-scale family, i. e., exponential, Weibull, and lognormal distributions which have been ones of the popular choices of failure distributions. Two optimization criteria to develop ALT plans are the statistical efficiency per unit expected cost which consists of the fixed test cost, cost being proportional to the number of test units, and variable test cost depending on test period and stress level, and the expected loss which combines Taguchi's quadratic loss function and expected test cost. Optimum plan determines the low stress level, test units allocated to each stress, and censoring times at two stress levels under Type I censoring. The proposed ALT plans are illustrated with a numerical example and sensitivity analyses are conducted to study effects of pre-estimates of design parameters.

• Proceedings of the Korean Reliability Society Conference
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• 2005.06a
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• pp.327-337
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• 2005

Accelerated life test models and procedure are developed to assess the reliability of Door switch. The main function of door switch is to operate bulb lamp and fan motor. The accelerated life test method and test equipments are developed using the relationship between stresses and life characteristics of the products. Using the developed accelerated life test method, the parameters of the ALT model and life time distribution are estimated and the reliability of the Door S/W at use condition if assessed. The proposed accelerated life test method and procedure may be extended and applied to testing similar kinds of products to reduce test time and costs of the tests remarkably.

• Journal of the Korean Data and Information Science Society
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• v.16 no.4
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• pp.923-931
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• 2005

The two parameter generalized exponential distribution was recently introduced by Gupta and Kundu (1999). It is observed that the generalized exponential distribution can be used quite effectively to analyze skewed data set. This paper develops the accelerated life test model using generalized exponential distribution and considers maximum likelihood estimation of parameters under the tampered random variable model. To show the performance of proposed maximum likelihood estimates, some simulation will be performed. Using a real data set, an example will be given.

• The Korean Journal of Applied Statistics
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• v.9 no.2
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• pp.119-134
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• 1996

Accelerated life testing (ALT) of a system is commonly used to reduce time and cost. ALT is achieved by subjecting the test systems to more severe conditions than the normal ones to obtain estimates of life distribution under normal condition. The major interest of this research is to use a model of incorporating the common environmental effect on the components serially linked into a system-so called frailty model for the system life time distribution under each stress and to discuss the related data analysis and comparison of the model with the generally used one. The profile likelihood is used to get an initial values required to compute maximum likelihood estimates and simulation is carried for comparison.